公开(公告)号：US6095679A

公开(公告)日：2000-08-01

申请号：US837547

申请日：1997-04-21

Applicant: Azzedine Hammiche ,  Hubert Murray Montagu Pollock ,  Michael Reading ,  Mo Song

Inventor： Azzedine Hammiche ,  Hubert Murray Montagu Pollock ,  Michael Reading ,  Mo Song

IPC: G01N25/20 ,  G01N25/48 ,  G01Q60/58 ,  G01N25/18

CPC classification number: G01Q60/58 ,  B82Y35/00 ,  G01N25/4833 ,  Y10S977/732 ,  Y10S977/849 ,  Y10S977/852 ,  Y10S977/86 ,  Y10S977/867 ,  Y10S977/869 ,  Y10S977/881 ,  Y10S977/957

Abstract: A platinum/Rhodium resistance thermal probe is used as an active device which acts both as a highly localized heat source and as a detector to perform localized differential calorimetry, by thermally inducing and detecting events such as glass transitions, meltings, recystallizations and thermal decomposition within volumes of material estimated at a few .mu.m.sup.3. Furthermore, the probe is used to image variations in thermal conductivity and diffusivity, to perform depth profiling and sub-surface imaging. The maximum depth of the sample that is imaged is controlled by generating and detecting evanescent temperature waves in the sample.

Abstract translation: 使用铂/铑电阻热探针作为主动装置，其作为高度局部化的热源和作为检测器来执行局部差示量热法，通过热诱导和检测诸如玻璃化转变，熔融，再结晶和热分解之类的事件 材料量估计在几亩。 此外，探头用于对导热系数和扩散系数的变化进行成像，以进行深度剖面和次表面成像。 通过产生和检测样品中的ev逝温度波来控制成像样品的最大深度。

公开(公告)号：US06491425B1

公开(公告)日：2002-12-10

申请号：US09584396

申请日：2000-06-01

Applicant: Azzedine Hammiche ,  Hubert Murray Montagu-Pollock ,  Michael Reading ,  Mo Song

Inventor： Azzedine Hammiche ,  Hubert Murray Montagu-Pollock ,  Michael Reading ,  Mo Song

IPC: G01H2520

CPC classification number: G01Q60/58 ,  G01N25/4833 ,  Y10S977/732 ,  Y10S977/849 ,  Y10S977/852 ,  Y10S977/86 ,  Y10S977/867 ,  Y10S977/869 ,  Y10S977/881 ,  Y10S977/957

Abstract: A platinum/Rhodium resistance thermal probe is used as an active device which acts both as a highly localized heat source and as a detector to perform localized differential calorimetry, by thermally inducing and detecting events such as glass transitions, meltings, recystallizations and thermal decomposition within volumes of material estimated at a few &mgr;m3. Furthermore, the probe is used to image variations in thermal conductivity and diffusivity, to perform depth profiling and sub-surface imaging. The maximum depth of the sample that is imaged is controlled by generating and detecting evanescent temperature waves in the sample.

Abstract translation: 使用铂/铑电阻热探针作为主动装置，其作为高度局部化的热源和作为检测器来执行局部差示量热法，通过热诱导和检测诸如玻璃化转变，熔融，再结晶和热分解之类的事件 材料数量估计在几个3。 此外，探头用于对导热系数和扩散系数的变化进行成像，以进行深度剖面和次表面成像。 通过产生和检测样品中的ev逝温度波来控制成像样品的最大深度。

公开(公告)号：US06260997B1

公开(公告)日：2001-07-17

申请号：US09178349

申请日：1998-10-23

Applicant: Michael Claybourn ,  Azzedine Hammiche ,  Hubert Murray Montagu-Pollock ,  Michael Reading

Inventor： Michael Claybourn ,  Azzedine Hammiche ,  Hubert Murray Montagu-Pollock ,  Michael Reading

IPC: G01N2520

CPC classification number: G01N25/4833 ,  G01N3/60 ,  G01N2203/0286 ,  G01Q30/02 ,  G01Q60/58 ,  Y10S977/852 ,  Y10S977/867

Abstract: A sample and a scanning probe microscope system are used as the detector for an infrared spectrometer to circumvent the diffraction limit of conventional infrared microscopy, and to provide spectroscopic images with a greatly improved spatial resolution, potentially as low as a few tens of nanometers. The beam from an infrared spectrometer is directed at the sample. The sample is heated to the extent that it absorbs infrared radiation. Thus the resulting temperature rise of an individual region depends upon the particular molecular species present, as well as the range of wavelengths of the infrared beam. These individual temperature differences are detected by a miniature thermal probe. The thermal probe is mounted in a scanning thermal microscope. The scanning thermal microscope is then operated used to produce multiple surface and sub-surface images of the sample, such that the image contrast corresponds to variations in either thermal diffusivity, surface topography or chemical composition.

Abstract translation: 使用样品和扫描探针显微镜系统作为红外光谱仪的检测器以避免常规红外显微镜的衍射极限，并提供可能低至几十纳米的大大改善的空间分辨率的光谱图像。 来自红外光谱仪的光束被引导到样品。 将样品加热到其吸收红外辐射的程度。 因此，单个区域的所得温度升高取决于存在的特定分子种类以及红外光束的波长范围。 这些单独的温度差通过微型热探测器检测。 热探头安装在扫描热显微镜中。 然后扫描热显微镜用于产生样品的多个表面和亚表面图像，使得图像对比度对应于热扩散率，表面形貌或化学组成的变化。