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公开(公告)号：US10718114B2
公开(公告)日：2020-07-21
申请号：US15993147
申请日：2018-05-30
Applicant: Chan Kyu Park , Sang Kyung Ahn , Yong Ku Kim , Hyun Sup Noh , Eun Seok Lee , Young Kee Lew , Byong Kap Jeon , Jae Eun Jung
Inventor： Chan Kyu Park , Sang Kyung Ahn , Yong Ku Kim , Hyun Sup Noh , Eun Seok Lee , Young Kee Lew , Byong Kap Jeon , Jae Eun Jung
IPC: E04C3/20 , E04B1/21 , E04B5/06 , E04B5/04 , E04B5/26 , C04B28/02 , C04B26/02 , C04B41/48 , C04B41/63 , C04B40/00 , C04B111/52
Abstract: An RC lattice beam is provided that can greatly dampen the transfer of vibrations in particular. As the concrete included in the RC lattice beam is polymer concrete that contains a polymer, fine-scale vibrations that may otherwise affect exposure apparatuses may be effectively dampened, while the depth of the conventional lattice beam may be kept the same. Thus, a high-damping RC lattice beam is provided that is capable of maximizing the performance of a precision exposure apparatus by reducing the defect rate and improving productivity.
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2.发明授权Test system of semiconductor device having a handler remote control and method of operating the same 有权具有处理器遥控器的半导体器件的测试系统及其操作方法公开(公告)号：US07408339B2
公开(公告)日：2008-08-05
申请号：US11749053
申请日：2007-05-15
Applicant: Ae-Yong Chung , Eun-Seok Lee , Jeong-Ho Bang , Kyeong-Seon Shin , Dae-Gab Chi , Sung-Ok Kim
Inventor： Ae-Yong Chung , Eun-Seok Lee , Jeong-Ho Bang , Kyeong-Seon Shin , Dae-Gab Chi , Sung-Ok Kim
IPC: G01R31/28
CPC classification number: G01R31/2893 , G01R31/2894 , G01R31/31718 , G01R31/31919
Abstract: A test system of a semiconductor device for a handler remote control is provided. The system includes: a tester for testing the semiconductor device; a handler connected to the tester through a GPIB (General Purpose Instruction Bus) communication cable; a tester server connected to the tester to download a test program, handler remote control program and a handler state check program to the tester; and communication data transmitted and received through the GPIB communication cable between the tester and the handler, wherein the communication data has basic communication data for an electrical test of the semiconductor device, communication data for the handler remote control, and communication data for a handler state check.
Abstract translation: 提供了一种用于处理器遥控器的半导体器件的测试系统。 该系统包括：用于测试半导体器件的测试仪; 通过GPIB（通用指令总线）通信电缆连接到测试仪的处理器; 连接到测试器的测试仪服务器向测试者下载测试程序，处理程序遥控程序和处理程序状态检查程序; 以及通过测试者和处理者之间的GPIB通信电缆发送和接收的通信数据，其中通信数据具有用于半导体器件的电气测试的基本通信数据，用于处理器远程控制的通信数据和用于处理器状态的通信数据 检查。
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3.发明授权Test system of semiconductor device having a handler remote control and method of operating the same 有权具有处理器遥控器的半导体器件的测试系统及其操作方法公开(公告)号：US07230417B2
公开(公告)日：2007-06-12
申请号：US11252448
申请日：2005-10-17
Applicant: Ae-Yong Chung , Eun-Seok Lee , Jeong-Ho Bang , Kyeong-Seon Shin , Dae-Gab Chi , Sung-Ok Kim
Inventor： Ae-Yong Chung , Eun-Seok Lee , Jeong-Ho Bang , Kyeong-Seon Shin , Dae-Gab Chi , Sung-Ok Kim
IPC: G01R31/28
CPC classification number: G01R31/31926 , G01R31/31907
Abstract: A test system of a semiconductor device for a handler remote control is provided. The system includes: a tester for testing the semiconductor device; a handler connected to the tester through a GPIB (General Purpose Instruction Bus) communication cable; a tester server connected to the tester to download a test program, handler remote control program and a handler state check program to the tester; and communication data transmitted and received through the GPIB communication cable between the tester and the handler, wherein the communication data has basic communication data for an electrical test of the semiconductor device, communication data for the handler remote control, and communication data for a handler state check.
Abstract translation: 提供了一种用于处理器遥控器的半导体器件的测试系统。 该系统包括：用于测试半导体器件的测试仪; 通过GPIB（通用指令总线）通信电缆连接到测试仪的处理器; 连接到测试器的测试仪服务器向测试者下载测试程序，处理程序遥控程序和处理程序状态检查程序; 以及通过GPIB通信电缆在测试者和处理者之间发送和接收的通信数据，其中通信数据具有用于半导体器件的电气测试的基本通信数据，用于处理器远程控制的通信数据和用于处理器状态的通信数据 检查。
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公开(公告)号：US20090140761A1
公开(公告)日：2009-06-04
申请号：US12255850
申请日：2008-10-22
Applicant: Sung-Ok KIM , Ae-Yong CHUNG , Se-Rae CHO , Chul-Min LEE , Eun-Seok LEE
Inventor： Sung-Ok KIM , Ae-Yong CHUNG , Se-Rae CHO , Chul-Min LEE , Eun-Seok LEE
IPC: G01R31/26
CPC classification number: G01R31/01 , G01R31/2894 , G01R31/31718
Abstract: A method of testing a semiconductor device, which can reduce a period of time for testing a packaged semiconductor chip. First, semiconductor chips to be tested are classified in a lot unit. The semiconductor chips are fist tested in units of lots. The defective semiconductor chips among the semiconductor chips of a predetermined number of lots that are first time tested are collectively retested. First test data regarding the semiconductor chips may be classified and stored for each respective lot. Retest data regarding the semiconductor chips may be classified and stored for each respective lot. Test data regarding the semiconductor chips may be classified and stored into first test data and retest data for each respective lot.
Abstract translation: 一种测试半导体器件的方法，其可以减少用于测试封装的半导体芯片的时间段。 首先，要测试的半导体芯片分为多个单元。 半导体芯片以单位批量进行了测试。 首次测试的预定数量批次的半导体芯片中的有缺陷的半导体芯片被集体重新测试。 关于半导体芯片的第一测试数据可以针对每个批次进行分类和存储。 关于半导体芯片的重新测试数据可以针对每个批次进行分类和存储。 可以将关于半导体芯片的测试数据分类并存储到第一测试数据中并且对于每个批次重新测试数据。
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5.发明申请TEST SYSTEM OF SEMICONDUCTOR DEVICE HAVING A HANDLER REMOTE CONTROL AND METHOD OF OPERATING THE SAME 有权具有操作者远程控制的半导体器件的测试系统及其操作方法公开(公告)号：US20070290707A1
公开(公告)日：2007-12-20
申请号：US11749053
申请日：2007-05-15
Applicant: Ae-Yong CHUNG , Eun-Seok LEE , Jeong-Ho BANG , Kyeong-Seon SHIN , Dae-Gab CHI , Sung-Ok KIM
Inventor： Ae-Yong CHUNG , Eun-Seok LEE , Jeong-Ho BANG , Kyeong-Seon SHIN , Dae-Gab CHI , Sung-Ok KIM
IPC: G01R31/00
CPC classification number: G01R31/2893 , G01R31/2894 , G01R31/31718 , G01R31/31919
Abstract: A test system of a semiconductor device for a handler remote control is provided. The system includes: a tester for testing the semiconductor device; a handler connected to the tester through a GPIB (General Purpose Instruction Bus) communication cable; a tester server connected to the tester to download a test program, handler remote control program and a handler state check program to the tester; and communication data transmitted and received through the GPIB communication cable between the tester and the handler, wherein the communication data has basic communication data for an electrical test of the semiconductor device, communication data for the handler remote control, and communication data for a handler state check.
Abstract translation: 提供了一种用于处理器遥控器的半导体器件的测试系统。 该系统包括：用于测试半导体器件的测试仪; 通过GPIB（通用指令总线）通信电缆连接到测试仪的处理器; 连接到测试器的测试仪服务器向测试者下载测试程序，处理程序遥控程序和处理程序状态检查程序; 以及通过GPIB通信电缆在测试者和处理者之间发送和接收的通信数据，其中通信数据具有用于半导体器件的电气测试的基本通信数据，用于处理器远程控制的通信数据和用于处理器状态的通信数据 检查。
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Patent Agency Ranking
6.发明申请Test system of semiconductor device having a handler remote control and method of operating the same 有权具有处理器遥控器的半导体器件的测试系统及其操作方法公开(公告)号：US20060158211A1
公开(公告)日：2006-07-20
申请号：US11252448
申请日：2005-10-17
Applicant: Ae-Yong Chung , Eun-Seok Lee , Jeong-Ho Bang , Kyeong-Seon Shin , Dae-Gab Chi , Sung-Ok Kim
Inventor： Ae-Yong Chung , Eun-Seok Lee , Jeong-Ho Bang , Kyeong-Seon Shin , Dae-Gab Chi , Sung-Ok Kim
IPC: G01R31/26
CPC classification number: G01R31/31926 , G01R31/31907
Abstract: A test system of a semiconductor device for a handler remote control is provided. The system includes: a tester for testing the semiconductor device; a handler connected to the tester through a GPIB (General Purpose Instruction Bus) communication cable; a tester server connected to the tester to download a test program, handler remote control program and a handler state check program to the tester; and communication data transmitted and received through the GPIB communication cable between the tester and the handler, wherein the communication data has basic communication data for an electrical test of the semiconductor device, communication data for the handler remote control, and communication data for a handler state check.
Abstract translation: 提供了一种用于处理器遥控器的半导体器件的测试系统。 该系统包括：用于测试半导体器件的测试仪; 通过GPIB（通用指令总线）通信电缆连接到测试仪的处理器; 连接到测试器的测试仪服务器向测试者下载测试程序，处理程序遥控程序和处理程序状态检查程序; 以及通过GPIB通信电缆在测试者和处理者之间发送和接收的通信数据，其中通信数据具有用于半导体器件的电气测试的基本通信数据，用于处理器远程控制的通信数据和用于处理器状态的通信数据 检查。
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公开(公告)号：US20190127979A1
公开(公告)日：2019-05-02
申请号：US15993147
申请日：2018-05-30
Applicant: Chan Kyu Park , Sang Kyung Ahn , Yong Ku Kim , Hyun Sup Noh , Eun Seok Lee , Young Kee Lew , Byong Kap Jeon , Jae Eun Jung
Inventor： Chan Kyu Park , Sang Kyung Ahn , Yong Ku Kim , Hyun Sup Noh , Eun Seok Lee , Young Kee Lew , Byong Kap Jeon , Jae Eun Jung
CPC classification number: E04C3/20 , C04B26/02 , C04B28/02 , C04B40/0039 , C04B41/48 , C04B41/63 , C04B2111/52 , E04B1/21 , E04B5/04 , E04B5/06 , E04B5/263 , E04B5/265 , E04B2103/02
Abstract: An RC lattice beam is provided that can greatly dampen the transfer of vibrations in particular. As the concrete included in the RC lattice beam is polymer concrete that contains a polymer, fine-scale vibrations that may otherwise affect exposure apparatuses may be effectively dampened, while the depth of the conventional lattice beam may be kept the same. Thus, a high-damping RC lattice beam is provided that is capable of maximizing the performance of a precision exposure apparatus by reducing the defect rate and improving productivity.
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公开(公告)号：US20160329219A1
公开(公告)日：2016-11-10
申请号：US15058277
申请日：2016-03-02
Applicant: Eun-Seok LEE , Chang-Gil RYU , Geun-Young SONG , Jae-Chang LEE , Yun-Seok CHOI , Jin-Suk HONG
Inventor： Eun-Seok LEE , Chang-Gil RYU , Geun-Young SONG , Jae-Chang LEE , Yun-Seok CHOI , Jin-Suk HONG
CPC classification number: H01L21/67046 , B05B1/20 , B05B13/0415 , B08B1/002 , B08B1/04 , B08B3/024 , B08B3/10 , H01L21/67051 , H01L21/67057
Abstract: Provided is a substrate cleaning apparatus including: a cleaning bath configured to accommodate a substrate having a first surface and a second surface; a substrate support configured to support the substrate; first and second nozzle bars provided in the cleaning bath to be rotatable in a plane parallel with the substrate, each of the first and the second nozzle bars including a passage; a plurality of nozzles provided along a longitudinal direction of each of the first and the second nozzle bars and configured to spray the cleaning solution from the passage of each of the first and the second nozzle bars to the substrate; and first and second brushes, the first brush provided on a first side of the substrate and configured to clean the first surface and the second brush provided on a second side of the substrate and configured to clean the second surface of the substrate.
Abstract translation: 本发明提供一种基板清洗装置，其特征在于，包括：清洗槽，其配置为容纳具有第一表面和第二表面的基板; 衬底支撑件，其构造成支撑所述衬底; 设置在所述清洗槽中的第一和第二喷嘴杆可在与所述基板平行的平面中旋转，所述第一和第二喷嘴杆中的每一个包括通道; 多个喷嘴，其沿着所述第一喷嘴杆和所述第二喷嘴杆中的每一个的纵向方向设置并且构造成将所述清洁溶液从所述第一和第二喷嘴杆中的每一个的通道喷射到所述基板; 以及第一和第二刷，所述第一刷设置在所述基板的第一侧上，并且被配置为清洁设置在所述基板的第二侧上的所述第一表面和所述第二刷，并且构造成清洁所述基板的所述第二表面。
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9.发明申请METHOD AND APPARATUS FOR PROVIDING TRAFFIC INFORMATION SERVICE USING A MOBILE COMMUNICATION SYSTEM 有权使用移动通信系统提供交通信息服务的方法和装置公开(公告)号：US20110248867A1
公开(公告)日：2011-10-13
申请号：US13083088
申请日：2011-04-08
Applicant: Eun-Seok Lee , Je-Hwan Oh , Se-Ra Jang , Hyun-Sang Youn , Gil-Jong Yoo , Jong-Sun Pyo , Jin-Won Kim
Inventor： Eun-Seok Lee , Je-Hwan Oh , Se-Ra Jang , Hyun-Sang Youn , Gil-Jong Yoo , Jong-Sun Pyo , Jin-Won Kim
IPC: G08G1/09
CPC classification number: G08G1/0104
Abstract: A method and apparatus for providing a traffic information service using a mobile communication terminal are provided. A method of a mobile communication terminal for a traffic information service is provided. The method includes constructing a cluster with at least one neighboring Mobile Station (MS), receiving traffic information from the at least one neighboring MS comprised in the cluster, measuring traffic information using location information of the MS, and transmitting a traffic information message comprising the collected traffic information to a traffic information provision server.
Abstract translation: 提供了一种使用移动通信终端提供交通信息服务的方法和装置。 提供了一种用于交通信息服务的移动通信终端的方法。 该方法包括利用至少一个相邻移动站（MS）构建群集，从包含在群集中的至少一个相邻MS接收交通信息，使用该MS的位置信息来测量交通信息，以及发送包括 将交通信息收集到交通信息提供服务器。
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10.发明授权Method of testing semiconductor devices and handler used for testing semiconductor devices 有权用于测试半导体器件的半导体器件和处理器的测试方法公开(公告)号：US07633288B2
公开(公告)日：2009-12-15
申请号：US11527378
申请日：2006-09-27
Applicant: Ae-Yong Chung , Eun-Seok Lee , Ki-Sang Kang , Kyeong-Seon Shin
Inventor： Ae-Yong Chung , Eun-Seok Lee , Ki-Sang Kang , Kyeong-Seon Shin
CPC classification number: G01R31/2893
Abstract: Example embodiments may provide a method of testing semiconductor devices by identifying units of lots and a test tray such that a plurality of lots having semiconductor devices may be continuously tested by a handler. Example embodiments may also provide a handler used to test the semiconductor devices.
Abstract translation: 示例性实施例可以提供通过识别批量单元和测试托盘来测试半导体器件的方法，使得具有半导体器件的多个批次可以由处理器连续测试。 示例性实施例还可以提供用于测试半导体器件的处理器。
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