摘要:
An optical system is disclosed that permits the viewing and reading of indicia, such as OCR scribes and/or barcodes, disposed on either side of a substrate, such as a semiconductor wafer, with a single camera. In one embodiment of the invention, optical elements are selectively positioned such that images of indicia fields disposed on either side of a substrate can be viewed (at the same magnification) whenever the substrate is in a given orientation, or such that images of indicia fields disposed on both sides of the substrate may be viewed at the same magnification, simultaneously. Optical paths may be folded to reduce the overall size of the optical viewing system.
摘要:
Double banks of LED's, opaque baffles, and a camera having a field of view are disclosed for reading laser-etched character strings and other indicia on semiconductor wafers and other substrates. The LED's of the banks may be integrally or separably lensed, and masks may be provided proximate the banks and in the nearfield of the LED's.
摘要:
A single pass actuator (70, 200), such as a deformable mirror (70), quickly changes, preferably in less than 1 ms, the focus and hence the spot size of ultraviolet or visible wavelength laser pulses to change the fluence of the laser output (66) at the workpiece surface between at least two different fluence levels to facilitate processing top metallic layers (264) at higher fluences and underlying dielectric layers (266) at lower fluences to protect bottom metallic layers (268). The focus change is accomplished without requiring Z-axis movement of the laser positioning system (62). In addition, the spot size can be changed advantageously during trepanning operations to decrease via taper, reduce lip formation, increase throughput, and/or minimize damage.
摘要:
An illumination system is provided having one or more light sources, opaque baffles, and mirrors for illuminating indicia on a substrate, such as a semiconductor wafer, for viewing by a camera aligned parallel with or at an angle to the substrate. The light sources include light emitting diodes (LEDs) for illuminating soft marks and broad spectrum incandescent lamps for illuminating hard marks. Dark field and light field illuminators are provided for enhanced reading of light indicia on a dark background and dark indicia on a light background, respectively. A light control unit allows for manual or automated control of light source selection and light intensity. Opposing mirrors extending along the optical paths of the light sources, reflect light emitted from the light sources into the camera field of view, thereby increasing the illumination efficiency and permitting the use of fewer light sources.
摘要:
An illumination system is provided having one or more light sources, opaque baffles, and mirrors for illuminating indicia on a substrate, such as a semiconductor wafer, for viewing by a camera aligned parallel with or at an angle to the substrate. The light sources include light emitting diodes (LEDs) for illuminating soft marks and broad spectrum incandescent lamps for illuminating hard marks. Dark field and light field illuminators are provided for enhanced reading of light indicia on a dark background and dark indicia on a light background, respectively. A light control unit allows for manual or automated control of light source selection and light intensity.
摘要:
The apparatus lifts a stack of sheets, turns the stack, and then places the side edges of the sheets on a conveyor. The lifting device is generally Z-shaped and is supported for unidirectional rotation about a horizontal axis adjacent one end of the conveyor. Two stacks of sheets are delivered to the conveyor per revolution of said device. The sheets are fed from said conveyor to a shingling conveyor which delivers a uniform shingle to a converting machine. The shingle density is controlled by a metering gate.