摘要:
Briefly described, embodiments of this disclosure include near-field scanning measurement-alternating current-scanning electrochemical microscopy devices, near-field scanning measurement-alternating current-scanning electrochemical microscopy systems, methods of using near-field scanning measurement-alternating current-scanning electrochemical microscopy, atomic force measurement-alternating current-scanning electrochemical microscopy (AFM-AC-SECM) devices, AFM-AC-SECM systems, methods of using AFM-AC-SECM, and the like.
摘要:
A method of producing a device for simultaneously carrying out an electrochemical and a topographical near field microscopy is disclosed, which is characterized in that a probe suitable for topographic near field microscopy is covered by a conductive material, the conductive material is covered by an insulating layer, and the conductive material and the insulating layer are removed in the region of the immediate tip of the probe.
摘要:
A device for simultaneously carrying out an electro-chemical and a topographical near field microscopy is described, which device comprises a region for topographical near field measurement and a region for electrochemical near field measurement, with the region for topographical near field measurement extending completely as far as to the immediate tip of the arrangement, characterized in that the region for electrochemical near field measurement starts at a defined distance from the immediate tip.