公开(公告)号：US5500992A

公开(公告)日：1996-03-26

申请号：US407790

申请日：1995-03-20

Applicant: Thomas L. Barnes ,  James W. Colburn ,  Catherine L. Danial ,  William R. Jones, Jr. ,  Millard D. Longman

Inventor： Thomas L. Barnes ,  James W. Colburn ,  Catherine L. Danial ,  William R. Jones, Jr. ,  Millard D. Longman

IPC: G01N15/12 ,  B23P19/02

CPC classification number: G01N15/1218 ,  Y10T29/49945

Abstract: A method of making a count probe for counting particles comprises the following steps. A count wafer is formed along with a core member having an opening for accepting the count wafer. The count wafer is applied to the opening in the core member to form an interference fit between the count wafer and the core member. After application of the count wafer to the opening in the core member, the core member is annealed to relieve stress in the core member.

Abstract translation: 制备用于计数颗粒的计数探针的方法包括以下步骤。 计数晶片与具有用于接受计数晶片的开口的芯构件一起形成。 将计数晶片施加到芯构件中的开口以在计数晶片和芯构件之间形成干涉配合。 在将计数晶片应用于芯构件的开口之后，将芯构件退火以减轻芯构件中的应力。

公开(公告)号：US5402062A

公开(公告)日：1995-03-28

申请号：US173735

申请日：1993-12-23

Applicant: Thomas L. Barnes ,  James W. Colburn ,  Catherine L. Danial ,  Sangvorn Rutnarak

Inventor： Thomas L. Barnes ,  James W. Colburn ,  Catherine L. Danial ,  Sangvorn Rutnarak

IPC: B01L3/00 ,  B01L3/02 ,  G01N15/12 ,  G01N15/06 ,  G01N27/06

CPC classification number: B01L3/502715 ,  B01L2400/0406 ,  B01L3/0275 ,  G01N15/12 ,  G01N15/1218

Abstract: A particle count probe comprises a wafer having an aperture. A first member is provided having a fluid passageway. A second member is removably mounted to the first member, and cooperates with the first member and the wafer to position the wafer so that the aperture of the wafer aligns with the fluid passageway.

Abstract translation: 粒子计数探针包括具有孔径的晶片。 提供具有流体通道的第一构件。 第二构件可拆卸地安装到第一构件，并且与第一构件和晶片协作以定位晶片，使得晶片的孔与流体通道对准。

公开(公告)号：US5432992A

公开(公告)日：1995-07-18

申请号：US173432

申请日：1993-12-23

Applicant: Thomas L. Barnes ,  James W. Colburn ,  Catherine L. Danial ,  Sangvorn Rutnarak

Inventor： Thomas L. Barnes ,  James W. Colburn ,  Catherine L. Danial ,  Sangvorn Rutnarak

IPC: G01N15/12 ,  B23P19/02

CPC classification number: G01N15/12 ,  G01N15/1218 ,  Y10T29/49945

Abstract: A method of making a count probe comprises the following steps. A member is made having a conduit and an opening. A wafer is made including an aperture. The wafer is removably inserted into the opening such that the wafer is removably retained within the opening by an interference fit between the wafer and the member.

Abstract translation: 计数探针的制作方法包括以下步骤。 制成具有导管和开口的构件。 制造包括孔的晶片。 晶片可拆卸地插入到开口中，使得晶片通过晶片和构件之间的过盈配合可移除地保持在开口内。