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1.发明授权Systems and methods for predicting failure of electronic systems and assessing level of degradation and remaining useful life 有权用于预测电子系统故障的系统和方法，并评估退化水平和剩余使用寿命公开(公告)号：US08103463B2
公开(公告)日：2012-01-24
申请号：US11859256
申请日：2007-09-21
申请人： Patrick W. Kalgren , Antonio E. Ginart , Sashank Nanduri , Anthony J. Boodhansingh , Carl S. Byington , Rolf F. Orsagh , Brian J. Sipos , Douglas W. Brown , Christopher M. Minnella , Mark Baybutt
发明人： Patrick W. Kalgren , Antonio E. Ginart , Sashank Nanduri , Anthony J. Boodhansingh , Carl S. Byington , Rolf F. Orsagh , Brian J. Sipos , Douglas W. Brown , Christopher M. Minnella , Mark Baybutt
IPC分类号： G01R15/00
CPC分类号： G01D3/08 , G01D18/00 , G01R31/2834
摘要： Disclosed are systems and methods for prognostic health management (PHM) of electronic systems. Such systems and methods present challenges traditionally viewed as either insurmountable or otherwise not worth the cost of pursuit. The systems and methods are directed to the health monitoring and failure prediction of electronic systems, including the diagnostic methods employed to assess current health state and prognostic methods for the prediction of electronic system failures and remaining useful life. The disclosed methodologies include three techniques: (1) use of existing electronic systems data (circuit as a sensor); (2) use of available external measurements as condition indicators and degradation assessor; and (3) performance assessment metrics derived from available external measurements.
摘要翻译： 公开了电子系统的预后健康管理（PHM）的系统和方法。 这种系统和方法提出了传统上被认为是不可逾越的或以其他方式不值得追求的代价的挑战。 系统和方法针对电子系统的健康监测和故障预测，包括用于评估当前健康状况的诊断方法和预测电子系统故障和剩余使用寿命的预后方法。 所公开的方法包括三种技术：（1）使用现有的电子系统数据（电路作为传感器）; （2）使用可用的外部测量作为条件指标和劣化评估者; 和（3）从可用的外部测量得出的绩效评估指标。
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2.发明申请SYSTEMS AND METHODS FOR PREDICTING FAILURE OF ELECTRONIC SYSTEMS AND ASSESSING LEVEL OF DEGRADATION AND REMAINING USEFUL LIFE 有权用于预测电子系统故障的系统和方法，并评估降解水平和剩余的有用寿命公开(公告)号：US20120191384A1
公开(公告)日：2012-07-26
申请号：US13336594
申请日：2011-12-23
申请人： Patrick W. Kalgren , Antonio E. Ginart , Shashank Nanduri , Anthony J. Boodhansingh , Carl S. Byington , Rolf Orsagh , Brian J. Sipos , Douglas W. Brown
发明人： Patrick W. Kalgren , Antonio E. Ginart , Shashank Nanduri , Anthony J. Boodhansingh , Carl S. Byington , Rolf Orsagh , Brian J. Sipos , Douglas W. Brown
CPC分类号： G01D3/08 , G01D18/00 , G01R31/2834
摘要： Disclosed are systems and methods for prognostic health management (PHM) of electronic systems. Such systems and methods present challenges traditionally viewed as either insurmountable or otherwise not worth the cost of pursuit. The systems and methods are directed to the health monitoring and failure prediction of electronic systems, including the diagnostic methods employed to assess current health state and prognostic methods for the prediction of electronic system failures and remaining useful life. The disclosed methodologies include three techniques: (1) use of existing electronic systems data (circuit as a sensor); (2) use of available external measurements as condition indicators and degradation assessor; and (3) performance assessment metrics derived from available external measurements.
摘要翻译： 公开了电子系统的预后健康管理（PHM）的系统和方法。 这种系统和方法提出了传统上被认为是不可逾越的或以其他方式不值得追求的代价的挑战。 系统和方法针对电子系统的健康监测和故障预测，包括用于评估当前健康状况的诊断方法和预测电子系统故障和剩余使用寿命的预后方法。 所公开的方法包括三种技术：（1）使用现有的电子系统数据（电路作为传感器）; （2）使用可用的外部测量作为条件指标和劣化评估者; 和（3）从可用的外部测量得出的绩效评估指标。
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3.发明授权Systems and methods for predicting failure of electronic systems and assessing level of degradation and remaining useful life 有权用于预测电子系统故障的系统和方法，并评估退化水平和剩余使用寿命公开(公告)号：US08600685B2
公开(公告)日：2013-12-03
申请号：US13336594
申请日：2011-12-23
申请人： Patrick W. Kalgren , Antonio E. Ginart , Shashank Nanduri , Anthony J. Boodhansingh , Carl S. Byington , Rolf Orsagh , Brian Sipos , Douglas W. Brown
发明人： Patrick W. Kalgren , Antonio E. Ginart , Shashank Nanduri , Anthony J. Boodhansingh , Carl S. Byington , Rolf Orsagh , Brian Sipos , Douglas W. Brown
IPC分类号： G01N11/00
CPC分类号： G01D3/08 , G01D18/00 , G01R31/2834
摘要： Disclosed are systems and methods for prognostic health management (PHM) of electronic systems. Such systems and methods present challenges traditionally viewed as either insurmountable or otherwise not worth the cost of pursuit. The systems and methods are directed to the health monitoring and failure prediction of electronic systems, including the diagnostic methods employed to assess current health state and prognostic methods for the prediction of electronic system failures and remaining useful life. The disclosed methodologies include three techniques: (1) use of existing electronic systems data (circuit as a sensor); (2) use of available external measurements as condition indicators and degradation assessor; and (3) performance assessment metrics derived from available external measurements.
摘要翻译： 公开了电子系统的预后健康管理（PHM）的系统和方法。 这种系统和方法提出了传统上被认为是不可逾越的或以其他方式不值得追求的代价的挑战。 系统和方法针对电子系统的健康监测和故障预测，包括用于评估当前健康状况的诊断方法和预测电子系统故障和剩余使用寿命的预后方法。 所公开的方法包括三种技术：（1）使用现有的电子系统数据（电路作为传感器）; （2）使用可用的外部测量作为条件指标和劣化评估者; 和（3）从可用的外部测量得出的绩效评估指标。
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4.发明申请SYSTEMS AND METHODS FOR PREDICTING FAILURE OF ELECTRONIC SYSTEMS AND ASSESSING LEVEL OF DEGRADATION AND REMAINING USEFUL LIFE 有权用于预测电子系统故障的系统和方法，并评估降解水平和剩余的有用寿命公开(公告)号：US20080141072A1
公开(公告)日：2008-06-12
申请号：US11859256
申请日：2007-09-21
申请人： Patrick W. Kalgren , Antonio E. Ginart , Sashank Nanduri , Anthony J. Boodhansingh , Carl S. Byington , Rolf F. Orsagh , Douglas W. Brown , Brian J. Sipos , Christopher M. Minnella , Mark Baybutt
发明人： Patrick W. Kalgren , Antonio E. Ginart , Sashank Nanduri , Anthony J. Boodhansingh , Carl S. Byington , Rolf F. Orsagh , Douglas W. Brown , Brian J. Sipos , Christopher M. Minnella , Mark Baybutt
CPC分类号： G01D3/08 , G01D18/00 , G01R31/2834
摘要： Disclosed are systems and methods for prognostic health management (PHM) of electronic systems. Such systems and methods present challenges traditionally viewed as either insurmountable or otherwise not worth the cost of pursuit. The systems and methods are directed to the health monitoring and failure prediction of electronic systems, including the diagnostic methods employed to assess current health state and prognostic methods for the prediction of electronic system failures and remaining useful life. The disclosed methodologies include three techniques: (1) use of existing electronic systems data (circuit as a sensor); (2) use of available external measurements as condition indicators and degradation assessor; and (3) performance assessment metrics derived from available external measurements.
摘要翻译： 公开了电子系统的预后健康管理（PHM）的系统和方法。 这种系统和方法提出了传统上被认为是不可逾越的或以其他方式不值得追求的代价的挑战。 系统和方法针对电子系统的健康监测和故障预测，包括用于评估当前健康状况的诊断方法和预测电子系统故障和剩余使用寿命的预后方法。 所公开的方法包括三种技术：（1）使用现有的电子系统数据（电路作为传感器）; （2）使用可用的外部测量作为条件指标和劣化评估者; 和（3）从可用的外部测量得出的绩效评估指标。
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