Invention Grant
US08103463B2 Systems and methods for predicting failure of electronic systems and assessing level of degradation and remaining useful life
有权
用于预测电子系统故障的系统和方法,并评估退化水平和剩余使用寿命
- Patent Title: Systems and methods for predicting failure of electronic systems and assessing level of degradation and remaining useful life
- Patent Title (中): 用于预测电子系统故障的系统和方法,并评估退化水平和剩余使用寿命
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Application No.: US11859256Application Date: 2007-09-21
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Publication No.: US08103463B2Publication Date: 2012-01-24
- Inventor: Patrick W. Kalgren , Antonio E. Ginart , Sashank Nanduri , Anthony J. Boodhansingh , Carl S. Byington , Rolf F. Orsagh , Brian J. Sipos , Douglas W. Brown , Christopher M. Minnella , Mark Baybutt
- Applicant: Patrick W. Kalgren , Antonio E. Ginart , Sashank Nanduri , Anthony J. Boodhansingh , Carl S. Byington , Rolf F. Orsagh , Brian J. Sipos , Douglas W. Brown , Christopher M. Minnella , Mark Baybutt
- Applicant Address: US NY Rochester
- Assignee: Impact Technologies, LLC
- Current Assignee: Impact Technologies, LLC
- Current Assignee Address: US NY Rochester
- Agency: Basch & Nickerson LLP
- Agent Duane C. Basch
- Main IPC: G01R15/00
- IPC: G01R15/00

Abstract:
Disclosed are systems and methods for prognostic health management (PHM) of electronic systems. Such systems and methods present challenges traditionally viewed as either insurmountable or otherwise not worth the cost of pursuit. The systems and methods are directed to the health monitoring and failure prediction of electronic systems, including the diagnostic methods employed to assess current health state and prognostic methods for the prediction of electronic system failures and remaining useful life. The disclosed methodologies include three techniques: (1) use of existing electronic systems data (circuit as a sensor); (2) use of available external measurements as condition indicators and degradation assessor; and (3) performance assessment metrics derived from available external measurements.
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