BONDING TOOL INCORPORATING DECOUPLED MOTION AXES

    公开(公告)号:US20250031357A1

    公开(公告)日:2025-01-23

    申请号:US18223594

    申请日:2023-07-19

    Abstract: A bonding tool with a decoupling mechanism includes a shaft, a rotary module coupled to a first portion of the shaft, a rotary motion actuator operatively connected to the rotary module and operative to drive the rotary module and the shaft to rotate about a rotary axis extending substantially along a central axis of the shaft, a linear motion module coupled to a second portion of the shaft separate from the first portion, and a linear motion actuator operatively connected to the linear motion module and operative to drive the linear motion module and the shaft to move in directions parallel to the rotary axis.

    Aligning optical components along a predetermined reference optical path

    公开(公告)号:US12081868B2

    公开(公告)日:2024-09-03

    申请号:US17412406

    申请日:2021-08-26

    CPC classification number: H04N23/6811 G01M11/08

    Abstract: To align an optical module to an image sensor module comprising at least an image sensor, a test image is received with a reference optical element along a first reference optical path, before reflecting the test image along a second reference optical path with the reference optical element towards the image sensor module. An alignment orientation of the image sensor module is first corrected with respect to the reference optical element in order to receive the test image over the second reference optical path onto the image sensor. The reference optical element is subsequently replaced with the optical module. Next, an orientation of the optical module is manipulated such that the second optical path coincides with the second reference optical path so as to optically align the optical module with the image sensor module, before the optical module is finally attached to the image sensor module.

    MOLDING APPARATUS HAVING WEDGE DRIVER
    5.
    发明公开

    公开(公告)号:US20240262019A1

    公开(公告)日:2024-08-08

    申请号:US18107121

    申请日:2023-02-08

    Abstract: A molding apparatus includes a mold and a wedge structure. The mode has a first mold member and a second mold member configured to be movable towards the first mold member along a first direction, the first and second mold members cooperating in use to form a molding cavity for encapsulating an electronic component. The wedge structure has a first wedge member attached to the second mold member and a second wedge member configured to be in contact with the first wedge member and movable in a second direction perpendicular to the first direction to adjust contacting portions between a first contacting surface of the first wedge member and a second contacting surface of the second wedge member, thereby biasing the second mold member towards the first mold member to form the molding cavity, wherein at least one of the first and second contacting surfaces includes a first protection film attached thereon.

    Die ejector height adjustment
    6.
    发明授权

    公开(公告)号:US11600516B2

    公开(公告)日:2023-03-07

    申请号:US15930533

    申请日:2020-05-13

    Abstract: A die ejection apparatus operable to eject a die from a support has at least two ejector components configured to lift a die located on the support. The ejector components are moveable to a position in which a lifting force is exertable by the ejector components on the support, so as to lift a die located on the support. Movement of the die ejector components is initiated towards the support, and a moment when each of the die ejector components reaches the position is determined. A height offset of each die ejector component relative to a height of another die ejector component is determined upon reaching the said position, and relative heights of the die ejector components are adjusted in dependence upon the evaluated height offset.

    High precision bonding apparatus comprising heater

    公开(公告)号:US11552031B2

    公开(公告)日:2023-01-10

    申请号:US16817880

    申请日:2020-03-13

    Abstract: A bonding apparatus includes a bond head structure, an optical unit and an actuator unit. The bond head structure includes a bond head collet, a connecting unit to which the bond head collet is attached and a look-through passage extending through the bond head collet and the connecting unit along a central axis of the bond head structure. In use, the bond head collet holds an electrical component to be bonded to a bonding area of a base member and the optical unit is positioned relative to the bond head structure to view and inspect the electrical component through the look-through passage of the bond head structure. The actuator unit moves the connecting unit of the bond head structure based on the inspection of the electrical component by the optical unit, to align the electrical component with the bonding area of the base member.

    Apparatus and method for removing a film from a surface

    公开(公告)号:US11548273B2

    公开(公告)日:2023-01-10

    申请号:US16778429

    申请日:2020-01-31

    Abstract: After molding a substrate located between first and second molds of a molding system, a used release film that is in contact with the substrate during molding is removed from the molding system with a gripper assembly, which is reciprocally movable between a retracted position outside the molding system and an extended position in a space between the first and second molds when the first and second molds are opened. A carriage mechanism on which the gripper assembly is mounted moves the gripper assembly towards the first or second mold until the gripper assembly contacts the used release film, before an actuator actuates the gripper assembly to clamp onto a part of the used release film. The carriage mechanism also conveys the gripper assembly away from the first mold or second mold to remove the used release film from the molding system.

    Method for measuring the heights of wire interconnections

    公开(公告)号:US11543362B2

    公开(公告)日:2023-01-03

    申请号:US16848919

    申请日:2020-04-15

    Abstract: A height of a vertical wire interconnection bonded onto a substrate is measured by first capturing a top view of the vertical wire interconnection and identifying a position of a tip end of the vertical wire interconnection from the top view. A conductive probe is located over the tip end of the vertical wire interconnection, and is lowered towards the vertical wire interconnection until an electrical connection is made between the conductive probe and the tip end of the vertical wire interconnection. A contact height at which the electrical connection is made may thus be determined, wherein the contact height corresponds to the height of the vertical wire interconnection.

    WIRE PATH PLATE HAVING ENHANCED DURABILITY FOR WIRE BONDING

    公开(公告)号:US20240347500A1

    公开(公告)日:2024-10-17

    申请号:US18133565

    申请日:2023-04-12

    CPC classification number: H01L24/78 H01L2224/78611

    Abstract: A wire path plate for a wire bonding apparatus includes a first conductive plate coupled to a second conductive plate. Each conductive plate has an upper portion, a lower portion and a middle portion located between the upper and lower portions. A bonding wire is configured to be passed through a gap formed between the first and second conductive plates. At least one non-conductive strip is mounted along the upper and/or lower portions of at least one of the conductive plates for insulating the bonding wire from conductive surfaces of the at least one conductive plate at the position of the at least one non-conductive strip.

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