Abstract:
In an integrated transformer assembly, a common coil member has a first portion alternately wound, for each one electromagnetic turn, around the first core member and around the second core member. The first portion of the common primary coil member wound around the first core member is magnetically linked to the first magnetic path thereof so as to constitute a first primary coil. The first portion of the common primary coil member wound around the second core member is magnetically linked to the second magnetic path thereof so as to constitute a second primary coil. The first and second primary coils are connected in series. A secondary coil member has first and second secondary coils. The first and second secondary coils are arranged to be magnetically linked to the first and second primary coils of the common primary coil member, respectively.
Abstract:
A first spring 54 is provided between a support member 51 driven in the Z-axis direction and a heat block 53, and biases the support member 51 and the heat block 53 in the direction of separating them from each other. A second spring 57 is provided between a first pusher 55 for pressing a die 81 of an IC device 8 and a second pusher 56 for pressing a substrate 82 of the IC device 8, and biases the first pusher 55 and the second pusher 56 in the direction of separating them from each other.
Abstract:
A pusher is constituted by a pusher main body, which is capable of direct contact with an electronic component to be tested, a heat absorbing and radiating body provided on the pusher main body, a heater provided on the pusher main body to enable direct or indirect contact with the electronic component to be tested, and a thermal insulating material provided between the pusher main body and the heater. According to such a pusher, temperature control of an electronic component can be performed such that the electronic component nears a target set temperature for testing.
Abstract:
A handler 1 is provided with an inner chamber 104 containing inside thereof heat sinks 40 of pushers 30, a temperature adjusting unit 91 for controlling the atmosphere temperature inside the inner chamber 104, a test chamber 102 containing inside thereof sockets 40 located on the test head 5 and the inner chamber 104, and a temperature adjusting unit 90 for controlling the atmosphere temperature inside the test chamber 102. With such a handler 1, the temperature control can be conducted so that the temperature of electronic components is brought close to the set temperature of the target test.
Abstract:
A method for assembling chips onto substrates includes applying a flux-free, no-flow underfill material. In an embodiment, the method includes removing oxide from interconnects without the use of a flux and applying a flux-free, no-flow underfill. In an embodiment, the method includes removing oxide from bumps, applying no-flow underfill to a substrate, and fluxlessly connecting the bumps to pads on the substrate. In an embodiment, oxide is removed from the bumps by a plasma treatment. In an embodiment, oxide is removed from the bumps by a subjecting the bumps to an oxide reduction process. The assembly of the chips and substrate is free from flux residue and/or flux cleaning solution residue.
Abstract:
In an active noise control apparatus in which an audio signal and a noise control signal are mixed to thereby sound a loudspeaker inside a motor vehicle, a general-purpose audio head unit cannot conventionally be freely changed for the one already mounted on the motor vehicle. As a solution, an active noise control unit is provided with a buffer amplifier and a mixer. An audio signal amplified by a power amplifier in an audio head unit is adjusted in level by the buffer amplifier such that a level of an audio signal outputted after amplification by the first amplifier becomes substantially equal to a level of the audio signal outputted from the audio head unit. Then, at the mixer, a noise control signal outputted from an active noise controller is added to an audio signal outputted from the buffer amplifier. Therefore, any audio head unit can be freely changed for the one already mounted on the vehicle as long as the audio head unit contains therein a power amplifier.
Abstract:
An IC tester which is capable of reducing the time required before completion of testing on all of ICs to be tested is provided. The depth (length in the Y-axis direction) of the constant temperature chamber 4 and the exit chamber 5 is expanded by a dimension corresponding approximately to one transverse width (length of the minor edge) of the rectangular test tray 3, and two generally parallel test tray transport paths or alternatively a widened test tray transport path broad enough to transport two test trays simultaneously with the two test trays juxtaposed in a direction transverse to the widened test tray transport path are provided in the section of test tray transport path extending from the soak chamber 41 in the constant temperature chamber 4 through the testing section 42 in the constant temperature chamber 4 to the exit chamber 5 so that two test trays may be simultaneously transported along the two test tray transport paths or the widened test tray transport path.
Abstract:
An optical transmission device for interconnecting an optical full duplex transmission line and a half duplex transmission line. When a start bit of a data block of an electrical signal received from the half duplex transmission line is detected, a maintaining signal to maintain the same transmission direction is generated during which the data block can be transmitted. An optical signal is received from the optical full duplex transmission line and converted into an electrical signal. Similarly, a maintaining signal to maintain the same transmission direction is generated. In response to either one of the two maintaining signals, passage or stopping of signals by a driver for sending out an electrical signal to the half duplex transmission line and a receiver for receiving an electrical signal from the half duplex-transmission line are controlled. Possible interference of data is prevented and the transmission direction is changed over in this manner. Further, the level of an optical signal is monitored, and when the optical signal level becomes lower than a reference level, an abnormality warning data is transmitted succeeding to the data block.
Abstract:
A valve device for adjusting the flow volumes of a cooling medium and a heating medium for adjusting the temperature of an electronic device includes: flow paths through which a cooling medium and heating medium are able to flow; and a merging section into which these flow path merge. The merging section has a valve shaft internally and a first channel is formed in the valve shaft. The valve shaft makes the first channel face at least two of the flow paths so as to make at least two flow paths communicate with each other.
Abstract:
A first AC/DC converter circuit is coupled via two transformers to a second AC/DC converter circuit, the first AC/DC converter circuit having a symmetrical configuration of two switching elements performing complementary opened/closed switching, to alternately connect positive and negative terminals of a DC source to a junction between transformer primary windings. Each primary winding alternates between a condition of transferring electrical power to a secondary winding and a condition of serving as a choke coil which temporarily stores electromagnetic energy when a current flows through that primary winding and a primary winding of the other transformer.