Layered lens structures and methods of production
    51.
    发明申请
    Layered lens structures and methods of production 有权
    分层透镜结构和生产方法

    公开(公告)号:US20070096016A1

    公开(公告)日:2007-05-03

    申请号:US11641773

    申请日:2006-12-20

    CPC classification number: H01L27/14627 G02B3/0018 G02B3/0037 G02B3/0056

    Abstract: A microlens structure includes lower lens layers on a substrate. A sputtered layer of glass, such as silicon oxide, is applied over the lower lens layers at an angle away from normal to form upper lens layers that increase the effective focal length of the microlens structure. The upper lens layers can be deposited in an aspherical shape with radii of curvature longer than the lower lens layers. As a result, small microlenses can be provided with longer focal lengths. The microlenses are arranged in arrays for use in imaging devices.

    Abstract translation: 微透镜结构包括在基底上的较低透镜层。 将溅射的玻璃层(例如氧化硅)以与法线成一定角度施加在下透镜层上,以形成增加微透镜结构的有效焦距的上透镜层。 上透镜层可以沉积成具有比下透镜层更长的曲率半径的非球面形状。 结果,可以提供更小焦距的小微透镜。 微透镜被布置成阵列以用于成像装置。

    Apparatus and method for manufacturing positive or negative microlenses
    52.
    发明申请
    Apparatus and method for manufacturing positive or negative microlenses 审中-公开
    用于制造正或负微透镜的装置和方法

    公开(公告)号:US20070076299A1

    公开(公告)日:2007-04-05

    申请号:US11524509

    申请日:2006-09-21

    Abstract: A variety of structures and methods used to adjust the shape, radius and/or height of a microlens for a pixel array. The structures affect volume and surface force parameters during microlens formation. Exemplary microlens structures include a microlens frame, base, material, protrusions or a combination thereof to affect the shape, height and/or radius of the microlens. The frame, base and/or protrusions alter the microlens flow resulting from the heating of the microlens during fabrication such that a height or radius of the microlens can be controlled. The radius can be adjusted by the height differences between the microlens and frame. The bigger the difference, the smaller the radius will be.

    Abstract translation: 用于调整像素阵列的微透镜的形状,半径和/或高度的各种结构和方法。 在微透镜形成期间,该结构影响体积和表面力参数。 示例性微透镜结构包括微透镜框架,基底,材料,突起或其组合以影响微透镜的形状,高度和/或半径。 框架,底座和/或突起改变在制造期间由微透镜的加热产生的微透镜流,从而可以控制微透镜的高度或半径。 半径可以通过微透镜和框架之间的高度差进行调整。 差异越大,半径越小。

    Method and apparatus for reducing microlens surface reflection
    53.
    发明申请
    Method and apparatus for reducing microlens surface reflection 有权
    减少微透镜表面反射的方法和装置

    公开(公告)号:US20070035844A1

    公开(公告)日:2007-02-15

    申请号:US11201291

    申请日:2005-08-11

    CPC classification number: G02B1/118 G02B1/11 G02B3/0006

    Abstract: A microlens has a surface with an effective index of refraction close to the index of air to reduce reflection caused by change in indices of refraction from microlens to air. The microlens having an index of refraction approximately the same as that of air is obtained by providing a rough or bumpy lens-air surface on the microlens. Features protrude from the surface of a microlens to create the rough surface and preferably have a length of greater or equal to a wavelength of light and a width of less than a sub-wavelength of light, from about 1/10 to ¼ of the wavelength of light. The features may be of any suitable shape, including but not limited to triangular, cylindrical, rectangular, trapezoidal, or spherical and may be formed by a variety of suitable processes, including but not limited to mask and etching, lithography, spray-on beads, sputtering, and growing.

    Abstract translation: 微透镜具有接近空气指数的有效折射率的表面,以减少由微透镜到空气的折射率变化引起的反射。 通过在微透镜上提供粗糙或颠簸的透镜空气表面,获得具有与空气大致相同的折射率的微透镜。 特征从微透镜的表面突出以产生粗糙表面,并且优选地具有大于或等于光的波长和小于亚波长的光的长度,大约为波长的1/10至1/4 的光。 特征可以是任何合适的形状,包括但不限于三角形,圆柱形,矩形,梯形或球形,并且可以通过各种合适的工艺形成,包括但不限于掩模和蚀刻,平版印刷,喷涂珠 ,溅射和生长。

    Method and apparatus for irradiating a microlithographic substrate

    公开(公告)号:US20060158631A1

    公开(公告)日:2006-07-20

    申请号:US11378666

    申请日:2006-03-17

    CPC classification number: G03F7/70333 G03F7/70358

    Abstract: A method and apparatus for exposing a radiation-sensitive material of a microlithographic substrate to a selected radiation. The method can include directing the radiation along a radiation path in a first direction toward a reticle, passing the radiation from the reticle and to the microlithographic substrate along the radiation path in a second direction, and moving the reticle relative to the radiation path along a reticle path generally normal to the first direction. The microlithographic substrate can move relative to the radiation path along a substrate path having a first component generally parallel to the second direction, and a second component generally perpendicular to the second direction. The microlithographic substrate can move generally parallel to and generally perpendicular to the second direction in a periodic manner while the reticle moves along the reticle path to change a relative position of a focal plane of the radiation.

    Apparatus and method for manufacturing positive or negative microlenses
    60.
    发明申请
    Apparatus and method for manufacturing positive or negative microlenses 有权
    用于制造正或负微透镜的装置和方法

    公开(公告)号:US20050270651A1

    公开(公告)日:2005-12-08

    申请号:US10857948

    申请日:2004-06-02

    Abstract: A variety of structures and methods used to adjust the shape, radius and/or height of a microlens for a pixel array. The structures affect volume and surface force parameters during microlens formation. Exemplary microlens structures include a microlens frame, base, material, protrusions or a combination thereof to affect the shape, height and/or radius of the microlens. The frame, base and/or protrusions alter the microlens flow resulting from the heating of the microlens during fabrication such that a height or radius of the microlens can be controlled. The radius can be adjusted by the height differences between the microlens and frame. The bigger the difference, the smaller the radius will be.

    Abstract translation: 用于调整像素阵列的微透镜的形状,半径和/或高度的各种结构和方法。 在微透镜形成期间,该结构影响体积和表面力参数。 示例性微透镜结构包括微透镜框架,基底,材料,突起或其组合以影响微透镜的形状,高度和/或半径。 框架,底座和/或突起改变在制造期间由微透镜的加热产生的微透镜流,从而可以控制微透镜的高度或半径。 半径可以通过微透镜和框架之间的高度差进行调整。 差异越大,半径越小。

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