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公开(公告)号:US09829948B2
公开(公告)日:2017-11-28
申请号:US14858035
申请日:2015-09-18
Applicant: Apple Inc.
Inventor: Joseph T. DiBene, II , Jafar Savoj , Inder M. Sodhi , Cyril de la Cropte de Chanterac , Sotirios Zogopoulos
CPC classification number: G06F1/28 , G01R19/2506 , G01R19/255 , G06F1/26 , G06F1/263
Abstract: An apparatus for determining an average current through an inductor of a regulator circuit is disclosed. A counter unit may be configured to receive a control signal, which includes a plurality of pulses, from a Power Management Unit (PMU), and determine a number of pulses received during a predetermined period of time. A pulse sampler unit may determine a duration of a given pulse of the plurality of pulses. Circuitry may be configured to determine the average current through the inductor during the predetermined period of time dependent upon the number of pulses received during the predetermined period of time and the duration of the given pulse.
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公开(公告)号:US09503068B1
公开(公告)日:2016-11-22
申请号:US15068003
申请日:2016-03-11
Applicant: Apple Inc.
Inventor: Joseph T. DiBene, II , Sanjay Pant , Sotirios Zogopoulos , Jafar Savoj , Inder M. Sodhi
Abstract: In an embodiment, a supply voltage envelope detector circuit is configured to detect a shape of the supply voltage over time and to compare the detected shape to expected shapes that indicate voltage droop events for which corrective action may be needed. The expected shapes may be predetermined based on one or more of: the design of the integrated circuit that includes the supply voltage envelope detector circuit; attributes of the power management unit (PMU) that is to generate the supply voltage for the integrated circuit; and/or attributes of the system that includes the integrated circuit. The shape of the voltage droop may experience little variation during use, and thus may be used to detect a droop event earlier and more accurately than a threshold-based mechanism, in some embodiments.
Abstract translation: 在一个实施例中,电源电压包络检测器电路被配置为随时间检测电源电压的形状,并将检测到的形状与指示可能需要校正动作的电压下降事件的预期形状进行比较。 预期形状可以基于以下中的一个或多个来预先确定:包括电源电压包络检测器电路的集成电路的设计; 用于生成集成电路的电源电压的电源管理单元(PMU)的属性; 和/或包括集成电路的系统的属性。 在一些实施例中,电压下降的形状可能在使用期间几乎没有变化,因此可以用于比基于阈值的机制更早和更准确地检测下垂事件。
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