公开(公告)号：US20090095904A1

公开(公告)日：2009-04-16

申请号：US12285673

申请日：2008-10-10

Applicant: Hirotami Koike ,  Shinichi Okada

Inventor： Hirotami Koike ,  Shinichi Okada

IPC: G01N23/00 ,  H01J3/16

CPC classification number: H01J37/153 ,  H01J37/26 ,  H01J37/28 ,  H01J49/067 ,  H01J2237/1534

Abstract: A charged particle beam reflector device is configured to include at least two electrostatic mirrors arranged with a predetermined interval on a linear optical axis, each having a through hole through which a charged particle beam radiated from an electron gun along a linear optical axis passes, and having a function of reflecting the charged particle beam or allowing the charged particle beam to pass through the through hole in accordance with an applied voltage, and a controller controlling an applied voltage to the at least two electrostatic mirrors. The controller applies, to each of the electrostatic mirrors, a reflection voltage allowing the electrostatic mirrors to reflect the charged particle beam at a predetermined timing so that the charged particle beam from the electron gun is reflected by the at least two electrostatic mirrors a plurality of times.

Abstract translation: 带电粒子束反射器装置被配置为包括在线性光轴上以预定间隔布置的至少两个静电镜，每个具有通孔，沿着线性光轴从电子枪辐射的带电粒子通过该通孔，以及 具有反射带电粒子束或使带电粒子束根据施加电压通过通孔的功能，以及控制器对至少两个静电反射镜施加的电压的控制器。 控制器向每个静电反射镜施加反射电压，该反射电压允许静电镜在预定的定时反射带电粒子束，使得来自电子枪的带电粒子束被至少两个静电镜反射，多个 次

公开(公告)号：US20080076550A1

公开(公告)日：2008-03-27

申请号：US11632704

申请日：2005-07-22

Applicant: Yasufumi Tanabe ,  Kenichi Takizawa ,  Toshio Matsumura ,  Satoshi Watanabe

Inventor： Yasufumi Tanabe ,  Kenichi Takizawa ,  Toshio Matsumura ,  Satoshi Watanabe

IPC: A63F13/00 ,  G02F1/13357 ,  H01J3/16

CPC classification number: G02B6/0036 ,  A63F7/02 ,  A63F2009/2445 ,  G07F17/32 ,  G07F17/3202

Abstract: A medium position detection device including: a medium moving space (10) formed in which a plurality of media (30) can simultaneously move without overlapping in a predetermined direction; a light-guiding plate (11) which perpendicularly intersects the predetermined direction and defines the front of the medium moving space (10); a light source (20) disposed to emit light entering an end surface of the light-guiding plate (11); a reflecting section (13) formed in the light-guiding plate (11) so that the light having entered the light-guiding plate (11) is reflected by the reflecting section (13) and exits the light-guiding plate (11) through a back surface of the light-guiding plate (11); and detection means which detects the light from the light-guiding plate (11).

Abstract translation: 一种介质位置检测装置，包括：介质移动空间（10），其中多个介质（30）可以在预定方向上同时移动而不重叠; 导光板（11），其垂直于所述预定方向并且限定所述介质移动空间（10）的前部; 光源（20），设置为发射进入所述导光板（11）端面的光; 形成在导光板（11）中的反射部分（13），使得已经进入导光板（11）的光被反射部分（13）反射并且通过导光板（11）通过 导光板（11）的背面; 以及检测来自导光板（11）的光的检测装置。

公开(公告)号：US20080073486A1

公开(公告)日：2008-03-27

申请号：US11879866

申请日：2007-07-18

Applicant: Chen Liang

Inventor： Chen Liang

IPC: H01J3/16

CPC classification number: G02B21/002 ,  G02B21/06

Abstract: A single-axis illumination system for a multiple-axis imaging system, particularly an array microscope. A single-axis illumination system is used to trans-illuminate an object viewed with an array of imaging elements having multiple respective axes. The numerical apertures of the imaging elements are preferably matched to the numerical aperture of the illumination system. For Kohler illumination, the light source is placed effectively at the front focal plane of the illumination system. For critical illumination, the light source is effectively imaged onto the object plane of the imaging system. For dark field illumination, an annular light source is effectively provided. For phase contrast microscopy, an annular phase mask is placed effectively at the back focal plane of the objective lens of the imaging system and a corresponding annular amplitude mask is provided effectively at the light source. For Hoffman modulation contrast microscopy, an amplitude mask is placed effectively at the back focal plane of the objective lens of the imaging system and a slit is provided at a source of light of the illumination system. Structured illumination and interferometry, and a secondary source, may also be used with trans-illumination methods and apparatus according to the present invention.

Abstract translation: 用于多轴成像系统的单轴照明系统，特别是阵列显微镜。 单轴照明系统用于反射照射具有具有多个相应轴的成像元件阵列观看的物体。 成像元件的数值孔径优选地与照明系统的数值孔径相匹配。 对于科勒照明，光源被有效地放置在照明系统的前焦平面处。 对于临界照明，光源被有效地成像到成像系统的物平面上。 对于暗场照明，可以有效地提供环形光源。 对于相位显微镜，环形相位掩模被有效地放置在成像系统的物镜的后焦平面上，并且在光源处有效地提供相应的环形振幅掩模。 对于霍夫曼调制对比显微镜，将幅度掩模有效地放置在成像系统的物镜的后焦平面上，并且在照明系统的光源处设置狭缝。 结构化照明和干涉测量以及二次源也可以用于根据本发明的反照明方法和装置。

公开(公告)号：US5939704A

公开(公告)日：1999-08-17

申请号：US669564

申请日：1996-11-13

Applicant: Walter Perrie ,  Peter Julian Modern

Inventor： Walter Perrie ,  Peter Julian Modern

IPC: B23K26/04 ,  G01J1/42 ,  G01J1/20 ,  H01J3/16

CPC classification number: G01J1/04 ,  B23K26/04 ,  B23K26/043 ,  G01J1/0414 ,  G01J1/4257

Abstract: An apparatus for detecting the position of a primary beam of electromagnetic radiation, the apparatus including a leaky mirror for reflecting the primary beam and for extracting from the primary beam a secondary beam and a position sensitive detector for detecting the spatial position of the secondary beam, wherein the leaky mirror comprises a material which has a transmissivity of less than 0.2 for the radiation of the primary beam and the position sensitive detector is arranged in the path of the secondary beam after transmission by the leaky mirror, the position of the secondary beam providing a measure of the position of the primary beam.

Abstract translation: PCT No.PCT / GB95 / 00735 Sec。 371日期：1996年11月13日 102（e）日期1996年11月13日PCT 1995年3月31日PCT公布。 WO95 / 27188 PCT公开号 日期1995年10月12日一种用于检测电磁辐射一次光束位置的装置，该装置包括用于反射主光束并从主光束提取次光束的泄漏镜和用于检测空间位置的位置敏感检测器 的次级光束，其中泄漏反射镜包括对于主光束的辐射具有小于0.2的透射率的材料，并且位置敏感检测器被布置在通过泄漏反射镜透射之后的次级光束的路径中，位置 的辅助光束提供主光束的位置的测量。

公开(公告)号：US5572035A

公开(公告)日：1996-11-05

申请号：US565107

申请日：1995-11-30

Applicant: Jochen Franzen

Inventor： Jochen Franzen

IPC: H01J49/04 ,  H01J49/42 ,  H01J3/16

CPC classification number: H01J49/062 ,  H01J49/065

Abstract: The invention relates to methods and devices for the reflection of positively and negatively charged particles of moderate kinetic energies at surfaces of any form. The invention consists in the production of a virtual or real surface for reflecting charged particles by creation of strongly inhomogenous high frequency fields of low penetration range into the space above the surface. The inhomogenous electric field is produced by supply of a high frequency voltage to a narrow grid pattern forming the surface and consisting of electrically conducting electrodes, isolated from each other. The electrode elements of the pattern are regularly repeated in at least one direction within the surface. The phases of the high frequency voltage are connected alternately to subsequent grid elements. The invention can be used to build new types of ion storage devices and ion guides for the transport of ions in moderate and high vacuum. New types of mass filters can be produced by this invention. In contrast to the well-known RF multipole rod systems, the invention leads to systems with easy production, high mechanical stability, and high efficiency for the thermalization of fast ions.

Abstract translation: 本发明涉及用于在任何形式的表面反射具有中等动能的正带负电粒子的方法和装置。 本发明包括通过在表面上方的空间中产生具有低穿透范围的强烈不均匀的高频场来制造用于反射带电粒子的虚拟或实际表面。 通过将高频电压提供给形成表面的窄栅格图案并由彼此隔离的导电电极组成而产生非均匀电场。 图案的电极元件在表面内的至少一个方向上有规律地重复。 高频电压的相位交替连接到后续的栅格元件。 本发明可用于构建用于在中等和高真空中输送离子的新型离子存储装置和离子导向器。 本发明可以生产新型的质量过滤器。 与众所周知的射频多极杆系统相比，本发明导致具有容易生产，高机械稳定性和快速离子热化的高效率的系统。

公开(公告)号：US4644159A

公开(公告)日：1987-02-17

申请号：US583535

申请日：1984-02-24

Applicant: Masaaki Miura

Inventor： Masaaki Miura

IPC: G02B7/00 ,  H04N1/028 ,  H04N1/03 ,  H04N1/193 ,  H01J3/16

CPC classification number: H04N1/03 ,  H04N1/193 ,  H04N2201/02456 ,  H04N2201/02493

Abstract: An image reading device, such as may be employed in a facsmile transmitter, laser beam printer, copying machine, or the like, in which assembly and alignment of optical components of the system is simplified and stray light is prevented from reaching a photoelectric conversion element. The optical system and the photoelectric conversion element are fixedly secured to a single supporting frame in a desired predetermined positional relationship. The supporting frame is detachably mounted on a mounting surface of an image reading device body. The optical system includes a filter or dust-proof transparent cover, an optical path changing mirror, and an image forming lens, all of which are secured to the supporting frame. A light-quantity-distribution correcting light-shielding plate may be provided in front of the image forming lens to provide an even distribution of image light on the photoelectric conversion element.

Abstract translation: 图像读取装置，例如可以用于简化发射机，激光束打印机，复印机等中，其中系统的光学部件的组装和对准被简化，并且防止杂散光到达光电转换元件 。 光学系统和光电转换元件以期望的预定位置关系牢固地固定到单个支撑框架。 支撑框架可拆卸地安装在图像读取装置主体的安装表面上。 光学系统包括过滤器或防尘透明盖，光路改变镜和成像透镜，所有这些都被固定到支撑框架上。 光量分布校正遮光板可以设置在成像透镜的前面，以便在光电转换元件上均匀分布图像光。

公开(公告)号：US3444386A

公开(公告)日：1969-05-13

申请号：US3444386D

申请日：1966-09-29

Applicant: SINGER INC H R B

Inventor： DIAMANT HENRI B

IPC: H04N3/08 ,  H01J3/16

CPC classification number: H04N3/08

公开(公告)号：US3421010A

公开(公告)日：1969-01-07

申请号：US3421010D

申请日：1966-01-26

Applicant: ATOMIC ENERGY COMMISSION

Inventor： TOBY FRED L

IPC: G01T5/02 ,  G01N21/30 ,  H01J3/16

CPC classification number: G01T5/02