Abstract:
A technique for reducing jitter on a data channel utilized for transfer of data between components disposed on the channel. Instead of coupling a ground of the channel directly to a ground network of a chip containing the data transferring device, an impedance between the channel ground and a substrate is utilized to minimize the jitter.
Abstract:
A linear phase FIR filter includes a multiplication/accumulator engine which is operable to receive the multi-level data stream and multiply it by predetermined filter coefficients. The coefficients are symmetrical to allow a pre-addition operation wherein the data is first stored in a buffer and then the data for symmetrical coefficients added before multiplication by the coefficient. This results in a reduction of multiplications by a factor of two, thus allowing the multiplication/accumulator engine to operate at one-half the clock rate of the oversampled multi-level data bit stream. The pre-addition operation results in values of greater than "1" and less than "-1" which are then converted in the multiplication/accumulator engine to restrict the values that are input to the multiplication/accumulator engine to values of "+1", "0" and "-1", to allow the multiplication/accumulator engine to only perform a "pass through" of the coefficient value, an "inversion" of the coefficient value or replace the coefficient value with a "null" value. This is facilitated by processing the tri-level data through two paths, one for the "-1" and one for the "-1" term and providing a common mode offset in each of the paths. Additionally, the "-1" term has a correction factor associated therewith that can be added in the "-1" path prior to summing the two terms to provide a digital output at the sampling frequency.
Abstract:
The detrimental nonlinear charging currents from an analog input signal through an anti-aliasing filter into a sampling circuit can be minimized by using primary and secondary inputs to the sampling circuit. The secondary input is turned on before the primary input and the charge required to charge the parasitic capacitance inside the sampling circuit and to replenish the channeling charge lost in the previous cycle is supplied primarily through the secondary input. Immediately after the secondary input is turned off the primary input is connected to the sampling node, and only the charge required to fine tune the signal into the sampling capacitor is drawn through the primary input. Therefore, most of the non-linear charge injection is passed through the secondary input, and the signal passed through the primary input is used to fine tune the voltage levels inside the sampling circuit during the actual sampling operation.
Abstract:
A differential input stage for a data conversion device includes two sections, one section for operating during a high stress portion of a charge transfer operation and one portion for operating during the remainder of the charge transfer operation. The first portion is comprised of two differential transistors (84) and (86) having the sources and bodies thereof connected to a source coupled node and connected through a switch (94) to a current source (92). The drains of transistors (84) and (86) are connected through switches (110) and (112), respectively, to output terminals. During the second half of the charge transfer operation, differential transistors (78) and (88), having the sources and bodies thereof connected to a source coupled node and connected to the current source (92) through a switch (90), are rendered operable with the drains thereof connected through switches (96) and (104), respectively, to the output terminals. Only one of the differential pairs is operable at any one time. When they are not operational, the sources, bodies and drains thereof are connected together and to a flush terminal (118) through respective switches. These switches flush out trapped oxide charges and allow the charges to once again become mobile.
Abstract:
Abnormal changes in the non-linear characteristics of electronic components are an indication of abnormal conditions such as impending component or system failure. To detect such abnormal changes in nonlinearity, an electronic circuit is subjected to a calibration signal including at least one frequency component. Nonlinearity in the electronic circuit causes distortion components to be generated from the calibration signal. Preferably the nonlinearity is characterized by compensation coefficients that digitally compensate the nonlinearity. The compensation coefficients are adjusted in a feedback loop in response to measured values of the distortion components, so that the distortion components are minimized. At the end of the adjustment process, the transfer function of the electronic circuit is specified by the compensation coefficients, which are stored in memory. The compensation coefficients are compared to respective limits to detect abnormal nonlinearity, and any abnormal nonlinearity is reported to a human operator or to a diagnostic computer. At various times, the measurement process is repeated, and the new values of the compensation coefficients are again compared to their respective limits as well as to their previous values stored in memory. Changes in the compensation coefficients with respect to their previous values are computed and compared to respective "drift" limits, so that abnormal conditions are also detected from abnormal changes in the nonlinearity over intervals of time.
Abstract:
The output gates of a delta-sigma modulator can generate i(t) transient signal in the power supply lines of a delta-sigma modulator. These i(t) spikes, which would otherwise produce non-linearities which can be coupled into the frequency band of interest of the modulator, are made to be linear by using return-to-zero data encoding and by providing multi-bit outputs to the delta-sigma modulator in which the output states all have equal numbers of logic ones at the output lines for each of the output states.
Abstract:
A method and apparatus for calibration of errors in a monolithic reference includes a bandgap voltage reference (50) that outputs an untrimmed voltage and a temperature voltage. The untrimmed voltage and temperature voltage are input to a delta-sigma A/D converter (52) which has the output thereof processed through a digital filter (54) to output data on a data bus (58) for storage in an EEPROM (60). The EEPROM (60) is operable in one mode to store temperature history data and, in another mode, to store temperature compensation data. In one mode, temperature compensation parameters are retrieved from the EEPROM (60) and utilized by a multiplier/accumulator circuit (74) to generate compensation factors which are output as a digital word to a DAC (76) for controlling a trim circuit (14). The trim circuit (14) provides a temperature compensation for the output of the bandgap voltage reference (50). The system is operable in a calibration mode to measure temperatures during a burn-in procedure and calculate necessary information to determine compensation factors and store these in the EEPROM ( 60). This temperature data is extracted from the EEPROM (60) and output to a serial I/O port (64), compensation factors determined and then stored back in the EEPROM (60). The delta-sigma A/D converter (52) in the run mode then makes temperature measurements for use by the multiplier/accumulator circuit (74) in determining the appropriate compensation data to extract from the EEPROM (60) to trim the output of the bandgap voltage reference circuit (50).
Abstract:
An amplifier with controlled output impedance has a first output connected to the inverting input of the amplifier, and a second output, which forms the output of the amplifier, connected through a feedback conductance to the inverting input of the amplifier. A input conductance is connected from the inverting input to ground, and the input signal is connected to the positive input of the amplifier. The first and second outputs are provided by first and second current output stages. The currents provided by the first and second output stages are proportional to each other by a predetermined ratio. By proper selection of this predetermined ratio and the feedback and input conductances the desired output impedance and overall gain of the amplifier into a given load can be achieved.
Abstract:
An oscillation detect and reset circuit is provided for an analog modulator that includes a first stage of integration having a single ended differential amplifier (32) which is connected to the input of three stages of subsequent integration (40), (42) and (44), in a cascaded configuration. The output of the last stage of integration (44) is connected to the input of a one-bit quantizer (48). The output of the one-bit quantizer (48) is connected to the input of a current (50) feedback, which is connected between a summing node (36) and a negative voltage supply. The summing node (36) sums the current feedback with an input voltage for input to the amplifier (32). Switches (52), (54) and (56) are provided across the inputs and outputs of the integration stages (40), (42) and (44), respectively. The sensing of an unstable condition on the output of second stage of integration (40) is detected by oscillation detect comparators (60) and (62) to initiate a count cycle in a five-bit counter (66). The output of counter (66) generates a oscillation detect signal upon detection of an oscillation, which signal is output to the control inputs of the switches (52), (54) and (56), for thirty-two cycles of the analog modulator sampling frequency. This is a sufficient amount of time to allow the loop, which is a first order loop, to zero out during the reset period.
Abstract:
Two gate-coupled pairs (12, 14; 16, 18) of MOS transistors are configured in a compound current mirror (10, 30) arrangement. Each pair includes an input (12; 16) and an output (14; 18) transistor. The output transistors are connected with their conduction paths in series between a source of output current a reference voltage node (22). Each of the input transistors is connected with its conduction path between the reference voltage node (22) and a separate current source (20, 24), with both sources supplying the same input current. One of the input transistors (12, 60) has a conduction path width-to-length ratio which is one-fourth that of the other one (16). This makes it possible to bias the output transistors with the minimum ON voltage for operation in the active region and thereby reduces power supply voltage overhead.A modified version (30) of the above arrangement includes, in addition, a transistor (32) for equalizing the drain-source voltage of the input and output transistors (16, 18) of an associated pair.An operational amplifier circuit (34) is described which is particularly adapted for the use of a compound mirror arrangement of two input transistors (54, 60), two output transistors (50, 52), and an equalizing transistor (56) in its differential input stage.