Abstract:
A programmable logic device has a plurality of super-regions of programmable circuitry disposed on the device in a two-dimensional array of such super-regions. Each super-region includes a plurality of regions of programmable logic and a region of programmable memory. Each logic region includes a plurality of subregions of programmable logic. Each super-region has associated interconnection resources for allowing communication between the logic and memory regions of that super-region without the need to use, for such relatively local interconnections, the longer-length inter-super-region interconnection resources that are also provided on the device.
Abstract:
A programmable logic device is provided in which logic array blocks (LABs) may be programmably configured for use as one of a variety of memory structures. The configurable memory structures may have separate read and write addresses, thereby making it possible to implement a variety of memory structures such as FIFO memory, ROM, RAM, and shift-registers.
Abstract:
A programmable logic integrated circuit device has a plurality of areas of programmable logic disposed on the device in a two-dimensional array of intersecting rows and columns of such areas. A so-called “fast conductor” network is provided on the device for rapidly and efficiently distributing a relatively small number of signals to substantially any logic area on the device. The fast conductor network has several main conductors that substantially bisect the array in one direction (e.g., by extending parallel to the column axis). Some main conductors can carry signals from off the device. Other main conductors can carry signals generated on the device. The network further includes secondary conductors that extend transverse to the main conductors (e.g., along each row of logic areas). Programmable logic connectors are provided for selectively applying signals from the main conductors to the secondary conductors and from the secondary conductors to the logic areas.
Abstract:
A programmable logic device memory array circuit is provided that contains a pair of associated combinable single-port memory arrays. The memory array circuit may have a variable depth and width. The combinable single-port memory arrays may be operated independently if desired. Alternatively, a pair of the combinable single-port memory arrays can be combined to form a dual-port memory array. When the single-port memory arrays are combined to form a dual-port memory array, circuitry from a first of the combinable singleport memory arrays is used to perform writing operations and circuitry from a second of the combinable single-port memory arrays is used to perform reading operations. The availability of the dual-port memory array capability allows users to implement circuits such as first-in-first-out buffers and other circuits that require the ability to perform concurrent read and write operations. When such a dual-port capability is not required, two single-port memory arrays are available to implement a desired logic design.
Abstract:
A programmable logic device has a plurality of super-regions of programmable circuitry disposed on the device in a two-dimensional array of such super-regions. Each super-region includes a plurality of regions of programmable logic and a region of programmable memory. Each logic region includes a plurality of subregions of programmable logic. Each super-region has associated interconnection resources for allowing communication between the logic and memory regions of that super-region without the need to use, for such relatively local interconnections, the longer-length inter-super-region interconnection resources that are also provided on the device.
Abstract:
A programmable logic device is provided that contains circuitry that may be used for observing logic signals from programmable logic circuits on the device for testing the operation of the device. Circuitry is also provided that may be used for preloading data into various circuits on the device. The logic signal observing circuitry may allow registered signals to be observed, may allow combinatorial signals to be observed, or may allow both registered and combinatorial signals to be observed.
Abstract:
Redundant circuitry is provided for a programmable logic device that uses an interleaved input multiplexer circuit arrangement. The programmable logic device has at least one row of logic regions and has multiple columns, each of which contains one of the interleaved input multiplexers and one of the logic regions. A set of conductors associated with the row of logic regions is used to convey signals between the logic regions. Each interleaved logic region distributes logic signals from the conductors in the row to two adjacent logic regions. Bypass circuitry is provided in each column for bypassing the interleaved input multiplexer and logic region in that column. If a defect is detected in a column during testing of the device, the manufacturer can repair the device using the bypass circuitry to bypass that column. Spare logic is provided to replace the circuitry lost when a defective column is bypassed.
Abstract:
A programmable logic array integrated circuit has several regular columns of programmable logic circuitry and a spare column which includes a subset of the programmable logic circuitry that is included in a regular column. In the event of a defect in the circuitry in a regular column that is duplicated in the spare column, the regular column logic functions that are thus duplicated are shifted from column to column so that the spare column circuitry is put to use and the defective regular column circuitry is not used. Regular column functions that are not duplicated in the spare column are not shifted. Data for programming the columns is selectively routed to the columns with or without column shifting, depending on whether that data is for functions that are or are not duplicated in the spare column.
Abstract:
A programmable logic device (PLD) includes at least two regions. Each region includes electrical circuitry that has a set of transistors. Each of the two regions has a corresponding fixed transistor threshold voltage, a corresponding fixed transistor body bias, and a corresponding fixed supply voltage.
Abstract:
A programmable logic device is provided that contains circuitry that may be used for observing logic signals from programmable logic circuits on the device for testing the operation of the device. Circuitry is also provided that may be used for preloading data into various circuits on the device. The logic signal observing circuitry may allow registered signals to be observed, may allow combinatorial signals to be observed, or may allow both registered and combinatorial signals to be observed.