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    NUCLEAR SPIN WAVE QUANTUM REGISTER FOR SOLID STATE QUANTUM NETWORK NODES
    32.
    发明申请
    NUCLEAR SPIN WAVE QUANTUM REGISTER FOR SOLID STATE QUANTUM NETWORK NODES 有权

    公开(公告)号：US20230093578A1

    公开(公告)日：2023-03-23

    申请号：US17899291

    申请日：2022-08-30

    Applicant: California Institute of Technology

    Inventor： Andrei Ruskuc ,  Joonhee Choi ,  Chun-Ju Wu ,  Andrei Faraon

    IPC: G06N10/40 ,  G06N10/20

    Abstract: A system for coupling a qubit to a register, wherein the system controls application of a protocol comprising a sequence of pulses synchronized with an RF field, the protocol further comprising a timing, a phase, and a duration of each of the pulses comprising a single qubit gate, a period and amplitude of the RF field, and a number of repeats of the sequence, so that application of the protocol controls a coherent spin exchange interaction between a register and a qubit having a zero magnetic dipole moment. The qubit comprises a first spin state and a second spin state both of which have a zero magnetic dipole moment; the register comprises multiple register spins having an energy level structure; and the register spins are indistinguishable so as to be configurable in basis states including a superposition state used for storing the quantum state of the qubit.

    Imaging apparatus and image sensor including the same
    36.
    发明授权
    Imaging apparatus and image sensor including the same 有权

    公开(公告)号：US11037976B2

    公开(公告)日：2021-06-15

    申请号：US16527341

    申请日：2019-07-31

    Applicant: SAMSUNG ELECTRONICS CO., LTD. ,  CALIFORNIA INSTITUTE OF TECHNOLOGY

    Inventor： Amir Arbabi ,  Seunghoon Han ,  Andrei Faraon

    IPC: H01L27/146 ,  H04N5/225 ,  G03B35/10

    Abstract: An image sensor includes a substrate, thin lenses disposed on a first surface of the substrate and configured to concentrate lights incident on the first surface, and light-sensing cells disposed on a second surface of the substrate, the second surface facing the first surface, and the light-sensing cells being configured to sense lights passing through the thin lenses, and generate electrical signals based on the sensed lights. A first thin lens and second thin lens of the thin lenses are configured to concentrate a first light and a second light, respectively, of the incident lights onto the light-sensing cells, the first light having a different wavelength than the second light.

    Polarimeter for detecting polarization rotation
    40.
    发明授权
    Polarimeter for detecting polarization rotation 有权

    公开(公告)号：US10578492B2

    公开(公告)日：2020-03-03

    申请号：US16146523

    申请日：2018-09-28

    Applicant: SAMSUNG ELECTRONICS CO., LTD. ,  CALIFORNIA INSTITUTE OF TECHNOLOGY

    Inventor： Duhyun Lee ,  Andrei Faraon ,  Ehsan Arbabi ,  Sadegh Faraji-Dana ,  Mahsa Seyedeh Kamali ,  Yu Horie ,  Chanwook Baik

    IPC: G01J4/04

    Abstract: A polarimeter for measuring a polarization rotation caused by a measurement object is provided, the polarimeter including an optically active material. The polarimeter includes a light source unit for irradiating a measurement object with light having a specific polarization; an anisotropic meta surface element for splitting reaction light, obtained by reacting the light of the specific polarization irradiated by the light source unit with the measurement object, into first and second reaction light; and a detection unit for detecting the first and second reaction light separated by the anisotropic meta surface element according to polarization. The polarization rotation caused by the measurement object may be calculated by comparing detection signals of the first and second reaction light detected by the detection unit.

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