Contact arm and electronic device testing apparatus using the same

    公开(公告)号:US06456062B2

    公开(公告)日:2002-09-24

    申请号:US09885913

    申请日:2001-06-22

    CPC classification number: G01R31/2893 G01R31/01 G01R31/2851

    Abstract: A contact arm for bringing ICs to be tested to contact a contact portion, comprises a holding head for holding said electronic devices, a floating mechanism provided between a drive mechanism for moving close to or away from said contact portion and said holding head for supporting said holding head movable about said drive mechanism, a diaphragm cylinder provided between said drive mechanism and said holding head for adjusting a relative pressing pressure from said drive mechanism to said holding head. A plurality of diaphragm cylinders are provided to one holding head.

    Semiconductor device testing apparatus
    32.
    发明授权
    Semiconductor device testing apparatus 失效
    半导体器件测试仪器

    公开(公告)号:US6104183A

    公开(公告)日:2000-08-15

    申请号:US809243

    申请日:1997-05-28

    CPC classification number: G01R31/2868

    Abstract: A semiconductor device testing apparatus having a reduced transverse width and compact in size is provided. Adjacent to a constant temperature chamber 101 containing therein a vertical transport means is located a test chamber 102 which is in turn adjoined by a temperature-stress removing chamber 103 likewise containing therein a vertical transport means, so that the constant temperature chamber 101, the test chamber 102 and the temperature-stress removing chamber 103 are arranged transversely in a line. Further, a loader section 300 is located in front of the constant temperature chamber, and an unloader section 400 is located in front of the test chamber and the temperature-stress removing chamber. With this arrangement, the transverse width of the testing apparatus may be reduced to about three test tray lengths.

    Abstract translation: PCT No.PCT / JP96 / 02067 Sec。 371日期1997年5月28日 102(e)日期1997年5月28日PCT提交1996年7月24日PCT公布。 出版物WO97 / 05495 日期:1997年2月13日提供了具有减小的横向宽度和尺寸紧凑的半导体器件测试装置。 在其中容纳有垂直传送装置的恒温室101附近设置有测试室102,测试室102又由同样包含垂直传送装置的温度应力消除室103邻接,使得恒温室101,测试 室102和温度应力消除室103横向排列成一行。 此外,装载部300位于恒温室前方,卸载部400位于试验室前方和温度应力消除室。 通过这种布置,测试装置的横向宽度可以减小到约三个测试托盘长度。

    Multiplex communication system for sequence controllers
    34.
    发明授权
    Multiplex communication system for sequence controllers 失效
    序列控制器的多路复用通信系统

    公开(公告)号:US4881220A

    公开(公告)日:1989-11-14

    申请号:US235498

    申请日:1988-08-24

    CPC classification number: H04J3/14 H04L12/437

    Abstract: Among systems configured by connecting a plurality of sequence controllers to one communication line to intercommunicate, many systems has been disclosed which implement fault location and recovery from the faults. In one of these systems, each substation is connected to a circulating communication line via a branch line and switches are respectively disposed on the branch line and on the communication line at both sides of a connecting point of the branch line and the communication line. Further, the communication line can be formed in a loop by a spare line. In another of these systems, an integrated portion of the communication line is formed near the master station, and the communication line is connected to the master station and is configured of one continuous line which goes and backs in sequence between the integrated portion and vicinity of each substation. In that integrated portion, a switch is disposed on each one of two lines, which connect the integrated portion and each substation. Further, a switch is provided on a line which bypasses these two switches. Other systems are a composite of the above systems. Still other systems have automated portions of fault location and fault recovery.

    Abstract translation: 在通过将多个序列控制器连接到一个通信线路以进行互通来配置的系统中,已经公开了实现故障定位和从故障恢复的许多系统。 在这些系统之一中,每个变电站通过分支线路连接到循环通信线路,并且开关分别设置在分支线路和分支线路和通信线路的连接点两侧的通信线路上。 此外,可以通过备用线路将通信线路形成为环路。 在这些系统的另一个中,在主站附近形成通信线路的集成部分,并且通信线路连接到主站,并且由一条连续的线路构成,该连续线路在一体化部分和 每个变电站。 在该集成部分中,开关设置在连接整合部分和每个变电站的两条线路中的每一条线上。 此外,在绕过这两个开关的线路上提供开关。 其他系统是上述系统的组合。 其他系统还具有故障定位和故障恢复的自动化部分。

    Orifice structure for fluid ejection device and method of forming same
    35.
    发明授权
    Orifice structure for fluid ejection device and method of forming same 有权
    流体喷射装置的孔结构及其形成方法

    公开(公告)号:US08876255B2

    公开(公告)日:2014-11-04

    申请号:US13563383

    申请日:2012-07-31

    CPC classification number: B41J2/1433 B41J2/16 Y10T29/49401

    Abstract: An orifice structure for a fluid ejection device includes a surface, an orifice formed through the surface, a first region of the surface projecting from the orifice, and a second region of the surface surrounding the first region, with the first region having a first surface energy, and the second region having a second surface energy higher than the first surface energy.

    Abstract translation: 用于流体喷射装置的孔口结构包括表面,通过该表面形成的孔口,从孔口突出的表面的第一区域和围绕第一区域的表面的第二区域,第一区域具有第一表面 能量,第二区域具有比第一表面能高的第二表面能。

    Power converter with electrical switching element
    36.
    发明授权
    Power converter with electrical switching element 有权
    具有电气开关元件的电力转换器

    公开(公告)号:US08526204B2

    公开(公告)日:2013-09-03

    申请号:US13092510

    申请日:2011-04-22

    CPC classification number: H02M3/33592 Y02B70/1475

    Abstract: A power converter is preferably mounted in a vehicle. The converter has a power converting unit including an electrical switching element electrically switched on and off selectively in response to a duty ratio of PWM (pulse-width modulation) signal given to the switching element. The converter further has a controller including a drive unit that generates the PWM signal, in addition to a controlling unit and a limiting unit. The controlling unit controls the duty ratio of the PWM signal such that a voltage inputted to the power converter is converted to a voltage to be outputted depending on the duty ratio. The limiting unit limits at least one of a time change amount of the duty ratio of the PWM signal and a maximum duty ratio of the PWM signal.

    Abstract translation: 功率转换器优选地安装在车辆中。 转换器响应于给予开关元件的PWM(脉冲宽度调制)信号的占空比,具有选择性地电导通和断开的电开关元件的功率转换单元。 除了控制单元和限制单元之外,转换器还具有包括产生PWM信号的驱动单元的控制器。 控制单元控制PWM信号的占空比,使得根据占空比将输入到功率转换器的电压转换为要输出的电压。 限制单元限制PWM信号的占空比的时间变化量和PWM信号的最大占空比中的至少一个。

    POWER CONVERTER FOR VEHICLE
    37.
    发明申请
    POWER CONVERTER FOR VEHICLE 有权
    车用功率转换器

    公开(公告)号:US20130021017A1

    公开(公告)日:2013-01-24

    申请号:US13553954

    申请日:2012-07-20

    CPC classification number: H02M1/36 B60L2210/40 Y02T10/7241 Y10T307/944

    Abstract: A power converter capable of activating a control circuit therein without increasing a length of a wiring for conveying an external activation signal. In the power converter, a converter circuit isolates a first voltage of a first power supply, converts the first voltage into a second voltage, and outputs the second voltage to a second power supply. A first power supply connecting circuit connects the first power supply to the converter circuit in response to the activation signal. An activation circuit determines whether or not the activation signal has been received by the first power supply connecting circuit on the basis of a voltage between input terminals of the converter circuit and activates the control circuit when it is determined that the activation signal has been received by the first power supply connecting circuit.

    Abstract translation: 一种功率转换器,其能够在不增加用于传送外部激活信号的布线的长度的情况下激活其中的控制电路。 在功率转换器中,转换器电路隔离第一电源的第一电压,将第一电压转换成第二电压,并将第二电压输出到第二电源。 第一电源连接电路响应于激活信号将第一电源连接到转换器电路。 激活电路基于转换器电路的输入端子之间的电压来确定第一电源连接电路是否已经接收到激活信号,并且当确定已经接收到激活信号被激活时激活控制电路 第一个电源连接电路。

    Ink ejection device
    38.
    发明授权
    Ink ejection device 有权
    喷墨装置

    公开(公告)号:US08141990B2

    公开(公告)日:2012-03-27

    申请号:US12623843

    申请日:2009-11-23

    CPC classification number: B41J2/14233 B41J2/1433

    Abstract: A side shooting ink ejection device may comprise a front surface, side shooting nozzles having ejection orifices for ejecting fluid, and piezoelectric actuators for moving the fluid through vibration for ejecting the fluid out of the nozzle. The side shooting nozzles may be arranged to eject fluid in a side direction of the piezoelectric actuator. The front surface may comprise recessed portions. The side shooting nozzles may open into the recessed portions so that the ejection orifices are countersunk with respect to the front surface.

    Abstract translation: 侧面喷墨装置可以包括前表面,具有用于喷射流体的喷射孔的侧面喷射喷嘴和用于通过振动移动流体的压电致动器,以将流体喷出喷嘴。 侧面喷嘴可以布置成在压电致动器的侧面方向上喷射流体。 前表面可以包括凹入部分。 侧面喷嘴可以打开到凹部中,使得喷射孔相对于前表面被沉没。

    TEMPERATURE CONTROL DEVICE AND TEMPERATURE CONTROL METHOD
    39.
    发明申请
    TEMPERATURE CONTROL DEVICE AND TEMPERATURE CONTROL METHOD 有权
    温度控制装置和温度控制方法

    公开(公告)号:US20120025856A1

    公开(公告)日:2012-02-02

    申请号:US13272018

    申请日:2011-10-12

    Abstract: Pressing an electronic device (2) to be tested to contact terminals (132a and 132b) while bringing a heater (112) having equal or close temperature change characteristics to those of the electronic device to be tested by a test pattern, transmitting a test pattern to the electronic device to be tested in this state, and controlling a power consumption of a heater so that total power of a power consumption of the electronic device to be tested by the test pattern and a power consumption of the heater becomes a constant value.

    Abstract translation: 按照要测试的电子设备(2)接触端子(132a和132b),同时将具有相同或接近的温度变化特性的加热器(112)与被测试的电子设备的测试图案相连, 并且控制加热器的功率消耗,使得由测试图案测试的电子设备的功耗和加热器的功率消耗的总功率变为恒定值。

    Pusher, pusher unit and semiconductor testing apparatus
    40.
    发明授权
    Pusher, pusher unit and semiconductor testing apparatus 有权
    推动器,推动器单元和半导体测试装置

    公开(公告)号:US07804316B2

    公开(公告)日:2010-09-28

    申请号:US12016211

    申请日:2008-01-18

    CPC classification number: G01R31/2887

    Abstract: A pusher 200 that pushes a semiconductor device under test 300 against a test socket 500 in a semiconductor test apparatus 20 is provided that includes a main body section 210 that is thermally coupled with the thermal source 400 and a plurality of device pushing sections 220, each of which is physically and thermally coupled to the thermal source 400, is displaced toward the test socket 500 by the pushing force of the main body section 210 to contact a surface to be pushed of a semiconductor device under test 300, pushes the semiconductor device under test 300, and transmits heat from the thermal source 400 to the semiconductor device under test 300. Thermal conductivity between the pusher and the semiconductor device under test is enhanced to provide a pusher that can quickly and accurately test a semiconductor device.

    Abstract translation: 提供了一种将半导体器件300与半导体测试装置20相对的测试插座500推送的推动器200,其包括与热源400热耦合的主体部分210和多个装置推动部分220 物理和热耦合到热源400通过主体部分210的推动力朝向测试插座500移动,以接触待测试的半导体器件被推动的表面,将半导体器件按下 测试300,并且将热量从热源400传递到被测试的300的半导体器件。推进器和被测半导体器件之间的热传导性得到增强,以提供可以快速且准确地测试半导体器件的推动器。

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