Abstract:
A sensing apparatus consisting of more than one diode laser having select lasing frequencies, a multiplexer optically coupled to the outputs of the diode lasers with the multiplexer being further optically coupled to a pitch side optical fiber. Multiplexed laser light is transmitted through the pitch side optical fiber to a pitch optic operatively associated with a process chamber which may be a combustion chamber or the boiler of a coal or gas fired power plant. The pitch optic is oriented to project multiplexed laser output through the process chamber. Also operatively oriented with the process chamber is a catch optic in optical communication with the pitch optic to receive the multiplexed laser output projected through the process chamber. The catch optic is optically coupled to an optical fiber which transmits the multiplexed laser output to a demultiplexer. The demultiplexer demultiplexes the laser light and optically couples the select lasing frequencies of light to a detector with the detector being sensitive to one of the select lasing frequencies.
Abstract:
In material depositing processes such as welding or thermal spraying the large variety of processes and material parameters necessitate a broad range of the resulting characteristics of the applied material. The task of the present invention is comprised of providing a process and a device for determining the quality of specific layer characteristics, in particular their adhesion or strength of joining to the base material. This task is solved thereby, that as the quality characteristic there is employed the degree of mixing of the applied material with the base material.
Abstract:
A spectral-domain optical coherence tomography system using a cross-dispersed spectrometer is disclosed. The interfered optical signal is dispersed by a grating into several orders of diffraction, and these orders of diffraction are separated by an additional dispersive optical element. The spectral interferogram is recorded by a set of linear detector arrays, or by a two-dimensional detector array.
Abstract:
Spectroscopy apparatus for spectrochemical analysis of a sample having an excitation source (60) for providing spectral light (62) of the sample for analysis. The spectral light (62) is analysed via an optical system (66-66-68) that includes a polychromator (70, 74-80) and solid state multielement array detector (82). The elements (i.e. pixels) of the detector (82) are serially read by means (84) to provide light intensity measurements as a function of wavelength. A problem is that the elements (pixels) of the detector (82) continue to accumulate charge during the serial read-out. This is avoided by providing an optical shutter (72) for blocking the spectral light (62) whilst elements (pixels) of the detector (82) are being serially read. Shutter (72) has a piezoelectric actuator which is preferably a bimorph mounted as a cantilever. It is preferably located adjacent to the entrance aperture (70) of the polychromator. Bimorph structures for the actuator and drive and protective circuit arrangements are also disclosed.
Abstract:
A simple, reliable, easy to use method for calculating bandwidth data of very narrow band laser beams based on bandwidth data obtained with a spectrometer in circumstances where the laser bandwidths are not large compared to the slit function of the spectrometer. The slit function of the spectrometer is determined. Spectral data of the laser beam is measured with the spectrometer to produce a measured laser beam spectrum which represents a convolution of the laser beam spectrum and the spectrometer slit function. This measured laser spectrum is then mathematically convolved with the slit function of the spectrometer to produce a doubly convolved spectrum. Bandwidth values representing true laser bandwidths are determined from measured laser spectrum and the doubly convolved spectrum. Preferably the true laser bandwidths are calculated by determining the difference between “twice a measured laser bandwidth” and a corresponding “doubly convolved bandwidth”. This method provides an excellent estimate of the true laser bandwidth because “twice the measured laser bandwidth” represents two laser bandwidths and two spectrometer slit function bandwidths and the “doubly convolved bandwidth” represents one laser bandwidth and two spectrometer slit function bandwidths. Thus, the difference is a representation of the true laser bandwidth. In a preferred embodiment the bandwidth parameters measured are the full width half-maximum bandwidth and the 95% integral bandwidth.
Abstract:
A spectrometer has higher resolving power without enlarging a size of the apparatus. This spectrometer has a slit board, a mirror, a collimator lens, a holographic grating, an Echelle grating, a magnifier lens and a line sensor. The holographic grating is arranged to diffract parallel light incident from the collimator lens toward the Echelle grating. The Echelle grating is arranged to reflect the parallel light incident from the holographic grating toward the holographic grating.
Abstract:
A simple, reliable, easy to use method for calculating bandwidth data of very narrow band laser beams based on bandwidth data obtained with a spectrometer in circumstances where the laser bandwidths are not large compared to the slit function of the spectrometer. The slit function of the spectrometer is determined. Spectral data of the laser beam is measured with the spectrometer to produce a measured laser beam spectrum which represents a convolution of the laser beam spectrum and the spectrometer slit function. This measured laser spectrum is then mathematically convolved with the slit function of the spectrometer to produce a doubly convolved spectrum. Bandwidth values representing true laser bandwidths are determined from measured laser spectrum and the doubly convolved spectrum. Preferably the true laser bandwidths are calculated by determining the difference between nulltwice a measured laser bandwidthnull and a corresponding nulldoubly convolved bandwidthnull. This method provides an excellent estimate of the true laser bandwidth because nulltwice the measured laser bandwidthnull represents two laser bandwidths and two spectrometer slit function bandwidths and the nulldoubly convolved bandwidthnull represents one laser bandwidth and two spectrometer slit function bandwidths. Thus, the difference is a representation of the true laser bandwidth. In a preferred embodiment the bandwidth parameters measured are the full width half-maximum bandwidth and the 95% integral bandwidth.
Abstract:
An arrangement for sensing the wavelength shift of light from a polychromatic light source features a tilted concave holographic reflection grating that diffracts light from the light source and disperses the light across the focal plane of the arrangement. A pair of matched detectors disposed behind the focal plane senses the light transmitted by a variable neutral density filter at the focal plane. The difference in output signal electrical currents generated by the detectors is a measurement of the shift in polychromatic wavelength distribution.
Abstract:
An optical device for the spectral analysis of a light source which comprises a spectrograph assembly including a dispersive element, and a classical collimator. The spectrograph assembly supplies a complete intermediate spectrum at the object focus of the classical collimator and the classical collimator reforms, at its image focus, an image of the dispersive element. The spectrograph assembly is preferably a Czerny-Turner or other type of spectrograph comprising an entry slit, two juxtaposed concave mirrors of the same focal length and a dispersive element placed strictly in the common focal plane of the two mirrors. Most preferably, the classical collimator is the first mirror of the second, similar spectrograph assembly. The device is most advantageous in that it is readily useable for both simultaneous and sequential spectroscopy.
Abstract:
A spectroanalytical system includes entrance aperture defining structure for receiving radiation to be analyzed along a first path; collimating structure in the first path for providing collimated radiation along a second path; fixed refraction structure in the second path for spatially separating (refracting) radiation in the second path in a first direction as a function of wavelength; fixed echelle grating structure in the second path for spatially separating the refracted radiation as a function of wavelength in a second direction orthogonal to the first direction and directing the orthogonally dispersed radiation in a beam along a third path that does not pass through the first refraction structure; and two-dimensional array detector structure for detecting the beam of orthogonally refracted radiation.