Abstract:
An associative memory system using an associative memory circuit, capable of performing hit judgment on cache data at a high speed. The associative memory system comprises a virtual-address holding CAM circuit 2 for outputting a hit signal 5 when the data previously stored in a supplied address coincides with a supplied virtual address 4, a cache-tag memory circuit 1 for outputting cache-tag data coinciding with the supplied virtual address 4 when the data is present, and a physical-address holding CAM circuit 3 which connects with an output line for outputting the hit signal 5 given from the CAM circuit 2 and outputs the hit signal 6 when a physical address previously stored in the memory area from which the hit signal is outputted coincides with cache tag data supplied from the cache-tag memory circuit 1.
Abstract:
A content addressable memory circuit includes a plurality of CAM cell circuits provided in a matrix of rows and columns, a matching line arranged corresponding to each row, and a rewrite control circuit for generating a rewrite instruct signal according to a signal on the matching line. The CAM cell circuit includes a master memory portion for storing a reference data to be compared, a slave memory portion for storing data of an adjacent word, transfer element for transferring to the master memory portion the data stored in the slave memory portion according to a rewrite instruct signal from the rewrite control circuit, and a comparison/driving portion for comparing an input data transmitted to a bit line with the data stored in the master memory portion to drive an associated matching line according to the comparison result. The stored data in the CAM cell circuit is updated according to a shifting operation. The input data is stored in the CAM cell circuit of a certain address. The least recently accessed data is always stored in the CAM cell circuit of another certain address. A content addressable memory circuit is obtained that executes LRU algorithm at a high speed.
Abstract:
A semiconductor memory device 1 includes a plurality of memory circuits 10. Each of the memory circuits 10 includes a data bit memory cell 11, a sign bit memory cell 12, a converting circuit 13 and a selecting circuit 14. The data bit memory cell 11 stores one bit of binary number data or a data bit of redundant binary number data. The sign bit memory cell 12 stores a digit of a sign bit of redundant binary number data. The converting circuit 13 converts redundant binary number data into binary number data on the basis of the data bit stored in the data bit memory cell and the sign bit stored in the sign bit memory cell 12. The selecting circuit 14 selects the data bit stored in data bit memory cell 11 or the one bit of binary number data outputted by the converting circuit 13.