SUBSTRATE EVALUATION APPARATUS AND SUBSTRATE EVALUATION METHOD USING THE SAME
    21.
    发明申请
    SUBSTRATE EVALUATION APPARATUS AND SUBSTRATE EVALUATION METHOD USING THE SAME 审中-公开
    基板评估装置和基板评估方法

    公开(公告)号:US20140333333A1

    公开(公告)日:2014-11-13

    申请号:US13960705

    申请日:2013-08-06

    CPC classification number: G01R31/2874 G01R31/2831 G01R31/286 G01R31/2881

    Abstract: A substrate evaluation apparatus and method which includes a substrate storage portion accommodating a substrate, first and second fastening portions are arranged in the substrate storage portion and are each fastened to a side of the substrate, a driving portion driving the first and second fastening portions, and a measurement portion measuring electrical characteristics of the substrate through application of an electrical signal to the substrate.

    Abstract translation: 一种基板评估装置和方法,其包括:容纳基板的基板存储部,第一和第二紧固部,布置在所述基板存储部中,并且各自固定到所述基板的一侧,驱动所述第一和第二紧固部, 以及测量部分,通过向基板施加电信号来测量基板的电特性。

    DISPLAY DEVICE AND MANUFACTURING METHOD OF THE SAME

    公开(公告)号:US20180308916A1

    公开(公告)日:2018-10-25

    申请号:US15926421

    申请日:2018-03-20

    Abstract: A display device includes a substrate including a pixel region and a peripheral region. The display device also includes a plurality of pixels provided in the pixel region for displaying an image. The display device also includes a light emitting element provided in each pixel for emitting light. The display device includes a first transistor provided in each pixel for driving the light emitting element, and a second transistor connected to the first transistor. The display device includes an insulating layer disposed between a second semiconductor layer of the second transistor and the substrate; and a crack blocking layer disposed between the insulating layer and the second semiconductor layer of the second transistor. A first semiconductor layer of the first transistor and the second semiconductor layer of the second transistor are provided in layers different from each other.

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