公开(公告)号：US10665906B2

公开(公告)日：2020-05-26

申请号：US16108081

申请日：2018-08-21

Applicant: CHROMA ATE INC.

Inventor： Hsu-Chang Hsu ,  Kuo-Yen Hsu ,  Kuan-Chen Chen ,  Chuan-Tse Lin

IPC: H01M10/48 ,  H01M10/42 ,  G01R31/36 ,  G01R31/385 ,  H01M10/44 ,  H01M2/10

Abstract: A probe supporting structure, configured to support probe for testing battery cell, includes a base and at least two supporting members. The supporting members are detachably disposed on the base with an adjustable distance between the supporting members. The supporting members are arranged in parallel manner.

公开(公告)号：US10520528B2

公开(公告)日：2019-12-31

申请号：US15790185

申请日：2017-10-23

Applicant: Chroma Ate Inc.

Inventor： Xin-Yi Wu ,  Chien-Hung Lo ,  Jui-Chih Chou ,  Hao-Che Yang ,  Nan-Yi Kuo

IPC: G01R31/26 ,  G01R1/04 ,  G01R31/28

Abstract: A dew resistant module for a test socket, and an electronic component testing device having the same are provided. An enclosure body is provided to circumscribe the test socket; and a test socket base plate provided on top of the test socket and enclosure body. A cover is provided to cover the test socket, enclosure body and test socket base plate. With the provision of the enclosure body and the cover, the test socket, test socket base plate and a portion of the thermal head are prevented from coming into contact directly with the atmosphere, whereby condensation or dewing is prevented, thermal insulation achieved and energy consumption minimized.

公开(公告)号：US10309986B2

公开(公告)日：2019-06-04

申请号：US15628069

申请日：2017-06-20

Applicant: CHROMA ATE INC.

Inventor： Chia-Hung Chien ,  Xin-Yi Wu

IPC: G01R1/04 ,  G01R31/28 ,  G05D23/19 ,  G01R1/44 ,  G05D23/24

Abstract: A temperature-controlled module for electronic devices and a testing apparatus provided with the same mainly include a temperature-controlled tray, an upper board and a dry-air supply device. The temperature-controlled tray includes holding cavities for accommodating electronic devices and a fluid chamber for cooling fluid. The upper board is furnished with through holes, while the upper board and the temperature-controlled tray are spaced by a predetermined distance. The dry-air supply device provides dry air to a space between the temperature-controlled tray and the upper board. Thereupon, by having cooling fluid to flow inside the temperature-controlled tray, the temperature-controlled tray can be kept in a lower predetermined temperature so as to rapidly cool down the electronic device. In addition, by providing the upper board and the dry-air supply device to allow dry air to flow through the surface of the electronic device, then the water-condensation phenomenon and air leakage can avoided.

公开(公告)号：US10254308B2

公开(公告)日：2019-04-09

申请号：US15480427

申请日：2017-04-06

Applicant: Chroma ATE Inc.

Inventor： Chien-Ming Chen

IPC: G01R1/04 ,  H01R13/629

Abstract: An electronic device testing apparatus with a locking mechanism for locking a press head and a socket plate is provided. When an electronic device is to be tested, a lifting arm is lowered so that a contact portion is in contact with the electronic device, and a locking mechanism is actuated to detain the press head on the socket plate. A pressing force generating device exerts a pressing force onto the electronic device and the socket plate, and at least a portion of a reaction force can be directed back to the locking mechanism. The locking mechanism is adapted to detain the press head on the socket plate. When the pressing force generating device generates a predetermined pressing force to certainly establish electrical connection between the electronic device and the chip socket, the reaction force produced by the chip socket may be distributed over the locking mechanism.

公开(公告)号：US20180172762A1

公开(公告)日：2018-06-21

申请号：US15846031

申请日：2017-12-18

Applicant: CHROMA ATE INC.

Inventor： Po-Kai CHENG

IPC: G01R31/28 ,  G01R1/067

CPC classification number: G01R31/2891 ,  G01R1/06716 ,  G01R31/2863

Abstract: An absorption testing apparatus supports a carrier board and includes a supporting platform, an electrically conductive component, a sealing ring and an electrical probe. The supporting platform has opposite top and bottom surfaces and a pathway penetrating through the top and bottom surfaces. The electrically conductive component, having a plate and elastic arms, is located in the pathway and is embedded in the supporting platform to divide the pathway into absorption and accommodating areas that are isolated by the plate. The elastic arms penetrate through the plate. The sealing ring, on the top surface, surrounds the absorption area and supports the carrier board. Each elastic arm has one end in the absorption area, electrically connecting to the carrier board. The electrical probe is located in the pathway and includes a body and probe heads. Each elastic arm has another end in the accommodating area, electrically connecting to the probe heads.

公开(公告)号：US09983259B2

公开(公告)日：2018-05-29

申请号：US15420154

申请日：2017-01-31

Applicant: CHROMA ATE INC.

Inventor： Xin-Yi Wu ,  Chien-Hung Lo

IPC: G01R31/00 ,  G01R31/28 ,  F28D15/00 ,  G05D23/19 ,  F25B21/04

CPC classification number: G01R31/2875 ,  F25B21/04 ,  F25B2321/021 ,  F25B2321/0212 ,  F25B2321/0252 ,  F28D15/00 ,  G01R31/2877 ,  G05D23/19 ,  G05D23/1919

Abstract: A dual loop type temperature control module and an electronic device testing apparatus having the same are provided. The temperature control module comprises a first loop through which a first working fluid of a first temperature flows, a second loop through which a second working fluid of a second temperature flows, a controller for controlling a first switching valve such that the first or second working fluid flows through a temperature regulating device, and a second switching valve such that the working fluid flowing through the temperature regulating device returns to the first or second loop. The temperature regulating device adjusts a thermoelectric cooling device to reach two different reference temperatures based on the rise/fall of its temperature dependent on the working fluid. The thermoelectric cooling device regulates the temperature of the tested object under a wide range of temperature difference and with accuracy based on the reference temperatures to facilitate the detection of high/low temperature.

公开(公告)号：US20180045537A1

公开(公告)日：2018-02-15

申请号：US15668825

申请日：2017-08-04

Applicant: CHROMA ATE INC.

Inventor： Tsz-Lang CHEN ,  Ming-Chieh LIN ,  Yen-Ching LIU

IPC: G01D5/16

Abstract: A contact detection circuit is applied to a four-terminal measurement device. The contact detection circuit comprises a first isolator, a signal generator, a multiplier and a calculator. The first isolator comprises a primary side and a secondary side, with the secondary side comprising a first terminal and a second terminal, with the first terminal configured to be electrically connected to a driving terminal and the second terminal configured to be electrically connected to a measuring terminal. The signal generator is configured to provide a measuring signal. The multiplier is configured to generate an output signal based on the measuring signal and a first reflected signal when the first reflected signal is induced at the primary side of the first isolator based on the measuring signal. The calculator calculates contact resistance between the driving terminal and the measuring terminal based on a direct-current component of the output signal.

公开(公告)号：US20180011146A1

公开(公告)日：2018-01-11

申请号：US15604602

申请日：2017-05-24

Applicant: CHROMA ATE INC.

Inventor： Peng-Fei CHEN ,  Mao-Sheng LIU

IPC: G01R31/36 ,  G01R1/067

CPC classification number: G01R31/3644 ,  G01R1/02 ,  G01R1/067 ,  G01R1/06788

Abstract: A clamp-type probe device comprises a first pressed member, a second pressed member and a probe head. The first pressed member comprises a first clamping portion and a first mounted portion connected to each other, and has a first and a second assembly holes. The second pressed member comprises a second clamping portion and a second mounted portion connected to each other. The second and the first mounted portions are connected to each other. The second and the first clamping portions are separated from each other. The probe head comprises a plurality of contacting members. Each contacting member comprises two bending portions. Two ends of each contacting member are respectively disposed through the first and the second assembly holes. The two bending portions are respectively pressed against an inner side surface of the first assembly hole and an inner side surface of the second assembly hole.

公开(公告)号：US20170370965A1

公开(公告)日：2017-12-28

申请号：US15608663

申请日：2017-05-30

Applicant: CHROMA ATE INC.

Inventor： Hsu-Chang HSU ,  Chiang-Cheng FAN ,  Li-Hsun CHEN ,  Chuan-Tse LIN ,  Ming-Hui WANG ,  Chung-Lin LIU ,  Ming-Ju CHUANG

IPC: G01R1/067 ,  G01N27/04

CPC classification number: G01R1/06777 ,  G01R1/06705

Abstract: An electrical probe includes a base body and a probe head. The base body has a main body portion and at least one positioning portion, and the positioning portion protrudes from the main body portion. The probe head is detachably disposed on the main body portion of the base body. The probe head has an outer edge away from a side of a central axis of the main body portion, and the positioning portion protrudes from the outer edge.

公开(公告)号：US20170108326A1

公开(公告)日：2017-04-20

申请号：US14884822

申请日：2015-10-16

Applicant: CHROMA ATE INC.

Inventor： James E. HOPKINS

IPC: G01B5/30 ,  H01M10/48 ,  H01M10/42

CPC classification number: H01M10/48 ,  G01B21/32 ,  H01M2/1061 ,  H01M10/4285 ,  H01M2220/30

Abstract: A measurement fixture for a battery cell is provided when the battery cell is connected to an apparatus. The measurement fixture comprises a chamber, a pressure sensor and an expansion sensor. The chamber defines a sealed space for receiving the battery cell. The pressure sensor is mounted to the chamber to sense a change of pressure in the sealed space due to a volume change of the battery cell to calculate pressure in the battery cell and the volume change of the battery cell non-contactly. The expansion sensor is mounted to the chamber to sense a deformation of the battery cell to calculate a correlation between the pressure in the battery cell and the volume change of the battery cell non-contactly.