公开(公告)号：US20230266405A1

公开(公告)日：2023-08-24

申请号：US18011461

申请日：2021-02-05

Applicant: Hitachi Astemo, Ltd.

Inventor： Yasuo SHIMA ,  Keishi KOMORIYAMA ,  Yoichiro KOBAYASHI

IPC: G01R31/54

CPC classification number: G01R31/54

Abstract: Poor opening is detected with certainty and reliability with respect to a ground line of an integrated circuit device regardless of the connection state of a load and the operating state of a drive circuit. In an integrated circuit device 10, a drive circuit 30 switches between conduction and interruption of a load current using switch elements 40 and 45. The ground line 31 is grounded via the GND terminal 32 to the common ground provided outside the integrated circuit device 10 and is connected to the drive circuit 30. The ground line 21 is grounded to the common ground via the GND terminal 22 and is connected to the control circuit 20. The diagnostic current supply circuit 90 supplies a predetermined diagnostic current to the ground line 31. The rectifying elements 61 and 62 are connected between the ground line 21 and the ground line 31. The diagnostic circuit 70 measures the potential difference between the ground line 31 and the ground line 21 and compares the potential difference with the predetermined comparison voltage 73 to diagnose the grounding state of the ground line 31.

公开(公告)号：US20230112526A1

公开(公告)日：2023-04-13

申请号：US17943163

申请日：2022-09-12

Applicant: Astronics Advanced Electronic Systems Corp.

Inventor： Fred J. Potter ,  Patrick Mills ,  Warren J. Wambsganss ,  Massoud Vaziri

IPC: G01R19/25 ,  G01R19/10 ,  G01R31/54

Abstract: A method which allows for the quick and accurate detection of faulty operating conditions and bad interconnections between and within devices in an electrical system. The method allows for the detection of arcing in wiring and components, high resistance connections, loose components, and the like. Voltage or current at each end of a conductor, or on each side of a system component, or the current through a component, may be detected and analyzed. A fault or abnormal condition is indicated when the voltage or current exceeds an expected level. Alternatively, resistance may be detected and analyzed, and a fault condition indicated when the resistance exceeds an expected level. Existing detection or computation equipment already associated with the system may be used for the detection and analysis.

公开(公告)号：US20230100592A1

公开(公告)日：2023-03-30

申请号：US17953726

申请日：2022-09-27

Applicant: Carrier Corporation

Inventor： Frank Trotto

IPC: G01R31/50 ,  G01R31/52 ,  G01R31/54 ,  H04R17/00

Abstract: A system and method for performing a self-testing a piezo sounder using a feedback pin while being driven by an ultra-sonic frequency. A method includes operating a sounder device in a test mode, the sounder device is operated in an inaudible frequency range during the test mode and detecting a feedback response voltage. The method includes comparing the feedback response voltage to a reference voltage and providing an indication of a failure mode based at least in part on the feedback response voltage.

公开(公告)号：US20230100522A1

公开(公告)日：2023-03-30

申请号：US18060698

申请日：2022-12-01

Applicant: MILWAUKEE ELECTRIC TOOL CORPORATION

Inventor： Benjamin Oliver Ryan Cabot ,  Gareth Mueckl

IPC: G01R31/327 ,  G06F11/22 ,  G01R31/52 ,  G01R31/54 ,  G01R31/50

Abstract: A testing device including a main housing, and a probe housing, wherein the probe housing is rotatably coupled to the main housing. The testing device further includes a first test probe and a second test probe. The first test probe may be configured to be inserted into an alternating-current receptacle. The second test probe is coupled to the probe housing. The second test probe may be configured to be inserted into a universal serial bus receptacle.

公开(公告)号：US11604226B2

公开(公告)日：2023-03-14

申请号：US15913078

申请日：2018-03-06

Applicant: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.

Inventor： Fumihito Inukai ,  Gorou Mori

IPC: G01R31/36 ,  G01R31/3835 ,  G01R35/00 ,  G01R31/396 ,  G01R31/54

Abstract: A voltage detection circuit includes a first terminal for connecting to one end of a first voltage detection line through a first resistor, the first voltage detection line having another end connected to a cathode or an anode of a first individual battery; a second terminal for connecting to the one end of the first voltage detection line without the first resistor; a first current generating circuit connected to the first terminal; and a voltage detector which detects a voltage of the first terminal and a voltage of the second terminal. The voltage detector includes at least one first AD converter connected to the first terminal, and at least one second AD converter connected to the second terminal.

公开(公告)号：US11486907B2

公开(公告)日：2022-11-01

申请号：US16354806

申请日：2019-03-15

Applicant: TE Connectivity Germany GmbH ,  Heidelberger Druckmaschinen AG

Inventor： Stefan Kipp ,  Gregor Karrasch ,  Stefan Stross ,  Stefan Engert

IPC: G01R17/10 ,  G01R27/18 ,  G01R17/14 ,  G01R31/52 ,  G01R31/54 ,  B60L53/62 ,  B60L53/18 ,  G01R15/04 ,  H02J7/00

Abstract: A monitoring device for monitoring an impedance of a protective conductor. The monitoring device has a first voltage divider for connection to a voltage source including a series connection to a first resistor and a second resistor. The second resistor has a resistance value which corresponds to a threshold value for the impedance of the protective conductor. A second voltage divider includes a series connection to a third resistor and a bridge diode and a connection to the first resistor at a first end of the third resistor and connectable to a second end of the third resistor and to the protective conductor. A measuring device is provided for the detection of a bridge voltage between a first node and a second node if the impedance of the protective conductor is greater than the value of the second resistor.

公开(公告)号：US11415639B2

公开(公告)日：2022-08-16

申请号：US17001644

申请日：2020-08-24

Applicant: Universal Synaptics Corporation

Inventor： Patrick B. Kelly ,  Jayson Kelly

IPC: G01R31/52 ,  G01R31/00 ,  G01R31/54 ,  G01R31/69

Abstract: A portable intermittent fault detector includes an enclosure that carries electronics and a display. The electronics are selected, arranged, and connected in a manner that minimizes noise, including noise that could interfere with an ability of the portable intermittent fault detector to detect intermittent faults in complex electrical systems. The portable intermittent fault detector also includes a passive heat management system hat conveys heat away from the electronics. In addition, a test module assembly of the portable intermittent fault detector includes an inner assembly with test module boards that are rigidly secured to one another and an outer support that carries the inner assembly in a manner that absorbs impacts and other forces on the portable intermittent fault detector.

公开(公告)号：US20220198244A1

公开(公告)日：2022-06-23

申请号：US17503354

申请日：2021-10-17

Applicant: WUHAN UNIVERSITY

Inventor： Yigang HE ,  Bolun DU ,  Jiajun DUAN ,  Lei Wang ,  Zhikai Xing ,  Liulu HE

IPC: G06N3/04 ,  G06K9/00 ,  G06K9/62 ,  G06F30/3308 ,  G06N3/08 ,  G01R31/54

Abstract: A method for diagnosing an open-circuit fault of a switching transistor of a single-phase half-bridge five-level inverter is provided. It includes the following steps. A semi-physical experiment platform with a DSP controller and an RT-LAB real-time simulator as its core constructed, and an output side voltage is selected as a fault signal variable. Empirical mode decomposition is used to extract a fault feature vector, and then a HHT time-frequency diagram of the fault feature vector is extracted, a voltage signal is converted into spectrum data, and time-frequency diagram fuzzy sets corresponding to different fault types are obtained. Fusion of the time-frequency diagram fuzzy sets of the same fault type is performed to obtain a fusion image that contains more fault features. The fusion images corresponding to all fault types are inputted into the deep convolutional neural network for training and testing, and a fault diagnosis result is obtained.

公开(公告)号：US20220163603A1

公开(公告)日：2022-05-26

申请号：US17101376

申请日：2020-11-23

Applicant: Rivian IP Holdings, LLC

Inventor： Kyle R. Underhill ,  Steven E. Schulz ,  Silva Hiti ,  Tyler J. Erikson

IPC: G01R31/54 ,  B60L53/18 ,  B60L53/68 ,  B60L53/62 ,  G01R31/66

Abstract: Various disclosed embodiments include illustrative systems for remotely testing continuity of electrical wiring, electrical vehicle charging systems, and charge couplers for electrical vehicle charging systems. In an illustrative embodiment, a system for remotely testing continuity of electrical wiring includes a signal generator configured to generate a signal having a predetermined frequency. A controlled impedance network is configured to attenuate the signal. The controlled impedance network is electrically connectable toward a first end of electrical wiring that terminates at a termination at the first end and that is electrically connectable at a second end to the signal generator to carry the signal. A signal detector is configured to detect the signal.

公开(公告)号：US20220146596A1

公开(公告)日：2022-05-12

申请号：US17438177

申请日：2020-02-21

Applicant: CROUZET AUTOMATISMES

Inventor： Hervé Carton ,  Thomas Stemmelen ,  Loic Clémenson

IPC: G01R31/54 ,  H02H3/33 ,  G01R31/00

Abstract: The disclosure relates to an electrical installation comprising a monitoring module positioned between a sensor connected to a measurement cable and first and second supply cables for the sensor. The monitoring module comprises a first transistor comprising first and second power electrodes and a control electrode, the first and the second power electrodes of the first transistor being electrically connected to the second supply cable and to the measurement cable, respectively, so that when the first transistor is in the closed state thereof, a first fault value is generated on the measurement cable. The control electrode of the first transistor is connected to the first supply cable so that the loss of current in the first supply cable, caused by the interruption of the current, automatically triggers the switching of the first transistor to the closed state thereof.