公开(公告)号：US5387978A

公开(公告)日：1995-02-07

申请号：US026606

申请日：1993-03-05

Applicant: Masaharu Okafuji ,  Nagayoshi Ichise ,  Mitsuo Odawara ,  Junichi Abe

Inventor： Masaharu Okafuji ,  Nagayoshi Ichise ,  Mitsuo Odawara ,  Junichi Abe

IPC: G01N21/88 ,  G01N21/89 ,  G01N21/896 ,  G01N21/94 ,  G01N21/01

CPC classification number: G01N21/896 ,  G01N2201/1085

Abstract: A flaw detection system that can detect not only bubbles, stones and knots but also flaws, such as cords and reams, that are subject to less optical changes in transmitted light is provided. A glass plate travelling in a manufacturing line is scanned with a beam spot in the direction orthogonally intersecting the manufacturing line. The light transmitted through the glass plate is received by an optical-fiber array arranged in a direction orthogonally intersecting the line. Optical fibers in the optical-fiber array are connected cyclically to a plurality of photomultipliers, which convert the light received by the optical fibers into electrical signals. Flaw signals are produced by extracting flaw information signals from these electrical signals in an analog processing section, and masking them in a masking section. Positional information indicating flaw patterns and positions is produced from these flaw signals.

Abstract translation: 提供了一种探伤系统，其不仅可以检测气泡，石头和结，而且还可以检测到透射光的光学变化较小的缺陷，例如电线和电缆。 在制造线上行进的玻璃板沿着与制造线正交的方向用光束点扫描。 透过玻璃板的光被沿着与该线垂直相交的方向排列的光纤阵列接收。 光纤阵列中的光纤被循环地连接到多个光电倍增器，其将由光纤接收的光转换成电信号。 通过在模拟处理部分中从这些电信号中提取缺陷信息信号并在掩蔽部分中对其进行掩蔽来产生缺陷信号。 从这些缺陷信号产生指示缺陷图案和位置的位置信息。

公开(公告)号：US5260766A

公开(公告)日：1993-11-09

申请号：US862078

申请日：1992-04-02

Applicant: Mark H. Armitage

Inventor： Mark H. Armitage

IPC: B29C65/18 ,  B29C65/82 ,  G01N21/89 ,  G01N21/88

CPC classification number: G01N21/89 ,  B29C65/18 ,  B29C65/8253 ,  B29C66/0326 ,  B29C66/1122 ,  B29C66/232 ,  B29C66/4312 ,  B29C66/80 ,  B29C66/8122 ,  B29C66/81427 ,  B29C66/81435 ,  B29C66/8322 ,  B29C66/849 ,  B29C2793/009 ,  B29C66/81267 ,  B29C66/81422 ,  B29C66/81423 ,  B29C66/9672 ,  B29K2909/08 ,  G01N2021/8887 ,  G01N2201/102 ,  G01N2201/1085

Abstract: An apparatus and method for detection of an imperfect seal between a plurality of plastic sheets. A transparent heated seal bar is tightly applied against the plurality of plastic sheets with the heat producing a welding between the sheets. A light source is projected into the seal bar with reflection occurring back through the seal bar from the seal area producing an image. This image is then picked up by a camera and transmitted to a visual analyzing computer which compares the produced seal to an image of a perfect seal and if significant differences are noted the computer causes activation of an annunciator to make known the creation of the imperfect seal.

Abstract translation: 一种用于检测多个塑料片之间的不完美密封的装置和方法。 透明的加热密封条紧紧地施加到多个塑料片上，其中热量在片之间产生焊接。 光源被投射到密封条中，反射通过密封条从密封区域返回，产生图像。 然后，该图像由照相机拾取并传输到视觉分析计算机，该计算机将所生成的印章与完美印章的图像进行比较，并且如果注意到显着的差异，则计算机引起报警器的激活以使得知道不完美密封的产生 。

公开(公告)号：US5019710A

公开(公告)日：1991-05-28

申请号：US331404

申请日：1989-03-30

Applicant: Gunnar Wennerberg ,  Daniel A. Gordon ,  Harriss T. King

Inventor： Gunnar Wennerberg ,  Daniel A. Gordon ,  Harriss T. King

IPC: G01N21/35 ,  G01N21/86

CPC classification number: G01N21/86 ,  G01N2021/8645 ,  G01N2201/0826 ,  G01N2201/0833 ,  G01N2201/1085

Abstract: A system for detecting optically-sensitive properties of sheet materials during manufacture includes a first group of bundles of optical fibers that convey light to selected transmitting locations adjacent one face of the sheet material. The system further includes a second group of bundles of optical fibers that collect and convey light transmitted through the sheet material to a light detector. The light detector measures the intensity of light received from each of the bundles of the second group to provide measurements of optically-sensitive properties of the sheet material at selected cross-directional locations.

公开(公告)号：US4738533A

公开(公告)日：1988-04-19

申请号：US792682

申请日：1985-10-29

Applicant: Yasuhiko Iwamoto

Inventor： Yasuhiko Iwamoto

IPC: G02B6/00 ,  G01B11/30 ,  G01N21/89 ,  G01N21/892 ,  G01N21/898 ,  G02B6/04 ,  G02B6/08

CPC classification number: G01N21/8986 ,  G01N2201/1085

Abstract: There is disclosed a plywood surface defect detecting head. It comprises a shielding plate slidingly contacted at its front end with one surface of the plywood, a light source provided at one side of the shielding plate, and an optical fiber provided at the other side of the shielding plate, the optical fiber being disposed such that one end thereof slidingly contacts the plywood surface together with the shielding plate and the other end thereof faces toward a light detector.

Abstract translation: 公开了一种胶合板表面缺陷检测头。 它包括在其前端与胶合板的一个表面滑动接触的屏蔽板，设置在屏蔽板一侧的光源和设置在屏蔽板另一侧的光纤，光纤被布置成 其一端与屏蔽板一起滑动地接触胶合板表面，并且其另一端面向光检测器。

公开(公告)号：US4556903A

公开(公告)日：1985-12-03

申请号：US563482

申请日：1983-12-20

Applicant: Frank H. Blitchington ,  David E. Haught

Inventor： Frank H. Blitchington ,  David E. Haught

IPC: G01N21/956 ,  H04N1/053 ,  H04N1/113 ,  H04N7/18 ,  H04N7/00

CPC classification number: H04N1/053 ,  G01N21/956 ,  G01N2021/8841 ,  G01N2201/1085 ,  H04N1/1135 ,  H04N2201/0471

Abstract: A system for generating a substantially-continuous stream of binary signals representative of the presence of copper on the surface of a fluorescent substrate of a board. A beam is swept by mirror facets of a rotating mirror drum along a path on the board. When the beam strikes copper it is merely relected. When the beam strikes the substrate, a fluorescence is produced. The resultant light is gathered by cylindrical lenses and fiber optic bundles. The color of the light is blocked by filters and the fluorescence color energizes photomultiplier tubes. A threshold setting and sensing circuit senses the output of the photomultiplier tubes and controls their bias voltage to produce a constant level of output from fluorescence and then produces a stream of binary signals that are representative of the presence/absence of copper on the surface of the board. The swept beam is split to send a portion of its energy through an optical grating. The intermittent light passing through the optical grating is gathered by a fiber optic bundle and is sensed by a photomultiplier tube. The output of the photomultiplier tube is doubled in frequency and used to sample and store the binary signals in the memory of a scanning converter. The binary signals arrive in short bursts of higher-frequency signals separated by periods of absence of binary data. The binary signals stored in the scanning converter are then read out substantially continously for subsequent processing at a lower frequency.

Abstract translation: 一种用于产生基本上连续的二进制信号流的系统，其代表在板的荧光基板的表面上存在铜。 光束由沿着板上路径的旋转镜筒的镜面扫过。 当光束撞击铜时，它只是被反射。 当光束撞击衬底时，产生荧光。 所产生的光由圆柱形透镜和光纤束收集。 光的颜色被滤光片遮挡，荧光色激发光电倍增管。 阈值设置和感测电路检测光电倍增管的输出并控制它们的偏置电压，以产生恒定的荧光输出水平，然后产生二进制信号流，其代表在表面上存在/不存在铜 板。 扫掠光束被分割以通过光栅发送其能量的一部分。 通过光栅的间歇光由光纤束收集，并由光电倍增管感测。 光电倍增管的输出频率加倍，用于将二进制信号采样并存储在扫描转换器的存储器中。 二进制信号以不存在二进制数据的周期分开的较高频率信号的短脉冲串中到达。 然后，存储在扫描转换器中的二进制信号基本上连续读出，以便在较低频率下进行后续处理。

公开(公告)号：US20110089348A1

公开(公告)日：2011-04-21

申请号：US12966595

申请日：2010-12-13

Applicant: Moshe Finarov ,  David Scheiner ,  Yoav Lishzinker ,  On Haran

Inventor： Moshe Finarov ,  David Scheiner ,  Yoav Lishzinker ,  On Haran

IPC: G01N21/86

CPC classification number: G01N21/31 ,  G01N21/6489 ,  G01N21/65 ,  G01N21/8422 ,  G01N21/8901 ,  G01N21/9501 ,  G01N2021/3568 ,  G01N2021/8908 ,  G01N2201/0826 ,  G01N2201/0833 ,  G01N2201/1085

Abstract: Photovoltaic thin film quality control is obtained where the thin film is supported by a support and a section of the film is illuminated by a polychromatic or monochromatic illumination source. The illumination is positioned in certain locations including locations where the layer stack includes a reduced number of thin film layers. Such locations may be discrete sampled points located within scribe lines, contact frames or dedicated measurement targets. The light collected from such discrete sampled points is transferred to a photo-sensitive sensor through an optical switch. The spectral signal of the light reflected, transmitted or scattered by the sampled points is collected by the sensor and processed by a controller in such a way that parameters of simplified stacks are used for accurate determination of desired parameters of the full cell stack. In this way the photovoltaic thin film parameters applicable to the quality control are derived e.g. thin film thickness, index of refraction, extinction coefficient, absorption coefficient, energy gap, conductivity, crystallinity, surface roughness, crystal phase, material composition and photoluminescence spectrum and intensity. Manufacturing equipment parameters influencing the material properties may be changed to provide a uniform thin film layer with pre-defined properties.

Abstract translation: 获得光电薄膜质量控制，其中薄膜由支撑体支撑并且膜的一部分被多色或单色照明源照射。 照明被定位在某些位置，包括层堆叠减少数量的薄膜层的位置。 这些位置可以是位于划线，接触框架或专用测量目标内的离散采样点。 从这些离散采样点收集的光通过光学开关传送到光敏传感器。 由采样点反射，传播或散射的光的光谱信号由传感器收集并由控制器进行处理，使得简化堆栈的参数用于精确确定全单元堆栈的期望参数。 以这种方式，可以使用适用于质量控制的光伏薄膜参数。 薄膜厚度，折射率，消光系数，吸收系数，能隙，导电率，结晶度，表面粗糙度，结晶相，材料组成和光致发光光谱和强度。 可以改变影响材料性能的制造设备参数，以提供具有预定特性的均匀薄膜层。

公开(公告)号：US20100220316A1

公开(公告)日：2010-09-02

申请号：US12775293

申请日：2010-05-06

Applicant: Moshe Finarov

Inventor： Moshe Finarov

IPC: G01N21/86 ,  G06F19/00 ,  G01N21/00 ,  G01J1/10

CPC classification number: G01B11/06 ,  G01B11/0625 ,  G01N21/31 ,  G01N21/6489 ,  G01N21/65 ,  G01N21/8422 ,  G01N21/8901 ,  G01N2021/3568 ,  G01N2021/8908 ,  G01N2201/0826 ,  G01N2201/0833 ,  G01N2201/1085

Abstract: Photovoltaic thin film quality control is obtained where the thin film is supported by a support and a section of the film is illuminated by a polychromatic or monochromatic illumination source. The source forms on the thin film an illuminated line. The light collected from discrete sampled points located on the illuminated line is transferred to a photo-sensitive sensor through an optical switch. The spectral signal of the light reflected, transmitted or scattered by the sampled points is collected by the sensor, processed and photovoltaic thin film parameters applicable to the quality control are derived e.g. thin film thickness, index of refraction, extinction coefficient, absorption coefficient, energy gap, conductivity, crystallinity, surface roughness, crystal phase, material composition and photoluminescence spectrum and intensity. Manufacturing equipment parameters influencing the material properties may be changed to provide a uniform thin film layer with pre-defined properties.

Abstract translation: 获得光电薄膜质量控制，其中薄膜由支撑体支撑并且膜的一部分被多色或单色照明源照射。 源在薄膜上形成一条照明线。 从位于照明线上的离散采样点收集的光通过光学开关转移到光敏传感器。 由采样点反射，传播或散射的光的光谱信号由传感器收集，处理和适用于质量控制的光伏薄膜参数例如被导出。 薄膜厚度，折射率，消光系数，吸收系数，能隙，导电率，结晶度，表面粗糙度，结晶相，材料组成和光致发光光谱和强度。 可以改变影响材料性能的制造设备参数，以提供具有预定特性的均匀薄膜层。

公开(公告)号：US20100006785A1

公开(公告)日：2010-01-14

申请号：US12410878

申请日：2009-03-25

Applicant: Moshe Finarov

Inventor： Moshe Finarov

IPC: G01N21/86 ,  G06F19/00

CPC classification number: G01N21/8422 ,  G01N21/31 ,  G01N21/6489 ,  G01N21/8901 ,  G01N2021/3568 ,  G01N2021/8908 ,  G01N2201/0826 ,  G01N2201/0833 ,  G01N2201/1085

Abstract: Photovoltaic thin film quality control is obtained where the thin film is supported by a support and a section of the film is illuminated by a polychromatic illumination source. The source forms on the thin film a continuous illuminated line. Discrete sampled points located on the illuminated line are imaged onto a two dimensional optical switch. A concordance look-up-table between the coordinates of the above sampled points on the thin film and their coordinates on the two dimensional optical switch are generated. The spectral composition of the illumination reflected by the sampled points is determined and photovoltaic thin film parameters applicable to the quality control are derived from the spectral composition of reflected or transmitted by the photovoltaic thin film illumination.

Abstract translation: 获得光电薄膜质量控制，其中薄膜由支撑体支撑并且膜的一部分被多色照明源照射。 源在薄膜上形成连续的照明线。 位于照明线上的离散采样点成像到二维光学开关上。 产生薄膜上面的采样点的坐标与二维光开关上的坐标之间的一致性查找表。 确定由采样点反射的照明的光谱组成，并且适用于质量控制的光电薄膜参数是从光电薄膜照射反射或透射的光谱组成得出的。

公开(公告)号：US20060132878A1

公开(公告)日：2006-06-22

申请号：US11017440

申请日：2004-12-20

Applicant: Douglas Curry ,  Richard Bruce ,  Robert Krivacic

Inventor： Douglas Curry ,  Richard Bruce ,  Robert Krivacic

IPC: G02B26/08

CPC classification number: G01N21/6456 ,  G01N21/6428 ,  G01N2021/6484 ,  G01N2201/1085

Abstract: An apparatus images a surface. An imager stage has a planar surface for supporting a sample. A fiber optic bundle has a first end of parallel first fiber ends that are arranged to define an input aperture for viewing the sample on the imager stage. A distal bundle end is arranged to define an output aperture disposed away from the imager stage. A scanning radiation source scans a radiation beam along a path that is perpendicular to the sample on the imager stage. The input aperture of the fiber optic bundle receives a light signal that is produced by the radiation source scan of the imager stage sample. The light signal is transmitted to the bundle output aperture. A photodetector detects the light signal at the distal bundle end, and a processor processes the detected light.

Abstract translation: 装置对表面进行成像。 成像器台具有用于支撑样品的平坦表面。 光纤束具有平行的第一光纤端的第一端，其布置成限定用于观察成像器台上的样品的输入孔。 远侧束端布置成限定远离成像器台布置的输出孔。 扫描辐射源沿着与成像器台上的样品垂直的路径扫描辐射束。 光纤束的输入孔径接收由成像器台样品的辐射源扫描产生的光信号。 光信号被传输到束输出孔径。 光电检测器检测远侧束端处的光信号，并且处理器处理检测到的光。

公开(公告)号：US20060132778A1

公开(公告)日：2006-06-22

申请号：US11018759

申请日：2004-12-21

Applicant: Douglas Curry ,  Richard Bruce

Inventor： Douglas Curry ,  Richard Bruce

IPC: G01N21/64 ,  G01J3/30

CPC classification number: G01N21/6456 ,  G01N15/1468 ,  G01N2201/1085

Abstract: An apparatus images a surface. An imager stage linearly translates the surface in a first direction. A light path has a first end defining an input aperture perpendicular to the first direction and parallel to the surface, and a second end defining an output aperture. A plurality of radiation beams linearly scan and interact in time-multiplexed alternating turns with the surface below the input aperture to produce a time-multiplexed light signal that is collected by the input aperture and transmitted by the light path to the output aperture. A photodetector arrangement detects the light signal at the output aperture. A processor processes the detected time-multiplexed light.

Abstract translation: 装置对表面进行成像。 成像器台沿第一方向线性平移表面。 光路具有限定垂直于第一方向并平行于表面的输入孔的第一端，以及限定输出孔的第二端。 多个辐射束在时间多路复用的交替匝中线性扫描并与输入孔下方的表面相互作用，以产生由输入孔收集并由光路传输到输出孔的时间复用光信号。 光电检测器装置检测输出孔处的光信号。 处理器处理检测到的时间复用光。