Sulfonium salt and photo-acid generator
    12.
    发明授权
    Sulfonium salt and photo-acid generator 有权
    锍盐和光酸发生器

    公开(公告)号:US09045398B2

    公开(公告)日:2015-06-02

    申请号:US14289686

    申请日:2014-05-29

    摘要: Provided is a novel sulfonium salt that has high solubility in a solvent and has high light sensitivity to, especially, light having a wavelength not longer than deep-UV (254 nm) and a novel photo-acid generator comprising the sulfonium salt. The invention relates to a sulfonium salt represented by the following general formula (1) and a novel photo-acid generator comprising the sulfonium salt. wherein R1 represents an electron withdrawing group; R2 and R3 each independently represent an alkyl group having 1 to 5 carbon atoms, an alkoxy group, an acyl group, a halogenated alkyl group, a halogen atom, a hydroxyl group, a cyano group, or a nitro group; p and q each independently represent an integer of 0 to 5; and X−represents a monovalent counter anion.

    摘要翻译: 提供了一种在溶剂中具有高溶解度并对具有高于深UV(254nm)的波长的光,特别是具有不长于深UV(254nm)的光的光的高灵敏度的新型锍盐和包含锍盐的新型光酸产生剂。 本发明涉及由以下通式(1)表示的锍盐和包含锍盐的新型光酸产生剂。 其中R1表示吸电子基团; R2和R3各自独立地表示碳原子数1〜5的烷基,烷氧基,酰基,卤代烷基,卤素原子,羟基,氰基或硝基。 p和q各自独立地表示0〜5的整数, 并且X代表一价抗衡阴离子。

    Resist composition and method of forming resist pattern
    13.
    发明授权
    Resist composition and method of forming resist pattern 有权
    抗蚀剂图案的抗蚀剂组成和方法

    公开(公告)号:US08785106B2

    公开(公告)日:2014-07-22

    申请号:US13772658

    申请日:2013-02-21

    摘要: A resist composition including: a base component (A) that exhibits changed solubility in a developing solution by the action of acid; a photoreactive quencher (C); and an acid generator component (B) that generates acid upon exposure, wherein the photoreactive quencher (C) contains a compound (C) represented by general formula (c1) shown below. In the formula, X represents a cyclic group of 3 to 30 carbon atoms which may have a substituent; R1 represents a divalent linking group; R2 represents an arylene group which may have a substituent, and each of R3 and R4 independently represents an aryl group which may have a substituent; R3 and R4 may be mutually bonded with the sulfur atom to form a ring; R5 represents a hydroxy group, a halogen atom, an alkyl group of 1 to 5 carbon atoms, an alkoxy group or a fluorinated alkyl group; p represents an integer of 0 to 2; and q represents an integer of 0 to 3.

    摘要翻译: 一种抗蚀剂组合物,其包含:通过酸作用显现在显影液中溶解度的碱成分(A) 光反应猝灭剂(C); 以及曝光时产生酸的酸发生剂成分(B),其中,所述光反应性猝灭剂(C)含有下述通式(C1)表示的化合物(C)。 在该式中,X表示可以具有取代基的3〜30个碳原子的环状基团; R1表示二价连接基团; R2表示可以具有取代基的亚芳基,R3和R4各自独立地表示可以具有取代基的芳基; R3和R4可以与硫原子相互键合形成环; R5表示羟基,卤素原子,1〜5个碳原子的烷基,烷氧基或氟化烷基; p表示0〜2的整数, q表示0〜3的整数。

    RESIST COMPPOSITION AND METHOD OF FORMING RESIST PATTERN
    14.
    发明申请
    RESIST COMPPOSITION AND METHOD OF FORMING RESIST PATTERN 有权
    电阻组合和形成电阻图案的方法

    公开(公告)号:US20130344435A1

    公开(公告)日:2013-12-26

    申请号:US13920481

    申请日:2013-06-18

    IPC分类号: G03F7/039

    摘要: A resist composition which generates acid upon exposure and exhibits changed solubility in a developing solution by the action of acid, and which includes a base component which exhibits changed solubility in a developing solution by the action of acid, and a nitrogen-containing compound which has a boiling point of 50 to 200° C., a conjugate acid thereof having a pKa of 0 to 7, and a photodecomposable base; and a method of forming a resist pattern using the resist composition.

    摘要翻译: 一种抗蚀剂组合物,其在曝光时产生酸,并且通过酸的作用在显影液中显示出改变的溶解性,并且其包含通过酸作用在显影液中显示出改变的溶解度的碱成分和含有这样的含氮化合物, 沸点为50〜200℃,pKa为0〜7的共轭酸和光可分解碱; 以及使用该抗蚀剂组合物形成抗蚀剂图案的方法。