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公开(公告)号:US11755241B2
公开(公告)日:2023-09-12
申请号:US17548889
申请日:2021-12-13
Applicant: Samsung Electronics Co., Ltd.
Inventor: Junbum Park
IPC: G06F3/06
CPC classification number: G06F3/0656 , G06F3/0604 , G06F3/0631 , G06F3/0659 , G06F3/0667 , G06F3/0688
Abstract: A storage device includes a buffer memory configured to temporarily store data; a plurality of nonvolatile memory devices; a storage controller circuit configured to generate buffer memory status information by monitoring a status of the buffer memory and operating in a congestion control mode of setting a buffer memory data transmission authority of a nonvolatile memory based on the generated buffer memory status information; and a first interface circuit configured to communicate with the storage controller circuit and the plurality of nonvolatile memory devices, wherein the first interface circuit is connected to a network based on an Ethernet interface.
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公开(公告)号:US11680898B2
公开(公告)日:2023-06-20
申请号:US17183577
申请日:2021-02-24
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Junbum Park , Namil Koo , Inkeun Baek , Jongmin Yoon
IPC: G01N21/3581 , H01Q23/00 , H01Q19/10 , H01Q21/06 , H01Q1/52 , G01N21/3563
CPC classification number: G01N21/3581 , G01N21/3563 , H01Q1/525 , H01Q19/108 , H01Q21/062 , H01Q23/00 , G01N2021/3568 , G01N2201/061
Abstract: A hybrid probe includes a probe body including a wiring and extending in a first direction; and a probe tip coupled to the probe body and including a first antenna, a second antenna, and an isolation layer. The hybrid probe may operate in a reflection mode using the first antenna and the second antenna, and operate in a transmission mode using the second antenna.
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13.
公开(公告)号:US11488875B2
公开(公告)日:2022-11-01
申请号:US16847727
申请日:2020-04-14
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Junbum Park , Younghwan Kim , Jongsu Kim , Youngjoo Lee , Yoojin Jeong
Abstract: A semiconductor substrate measuring apparatus includes a light source to generate irradiation light having a sequence of on/off at a predetermined interval, the light source to provide the irradiation light to a chamber with an internal space for processing a semiconductor substrate using plasma, an optical device between the light source and the chamber, the optical device to split a first measurement light into a first optical path, condensed while the light source is turned on, to split a second measurement light into a second optical path, condensed while the light source is turned off, and to synchronize with the on/off sequence, and a photodetector connected to the first and second optical paths, the photodetector to subtract spectra of first and second measurement lights to detect spectrum of reflected light, and to detect plasma emission light emitted from the plasma based on the spectrum of the second measurement light.
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公开(公告)号:US20220155340A1
公开(公告)日:2022-05-19
申请号:US17488657
申请日:2021-09-29
Applicant: Samsung Electronics Co., Ltd.
Inventor: Ikseon Jeon , Namil Koo , Junbum Park , Inkeun Baek
Abstract: Provided is a probe configured to detect a near field, the probe including a probe substrate having a tip region at an end portion of the probe substrate, a width of the tip region being less than a width of a remaining region of the probe substrate, a first electrode and a second electrode disposed on a surface of the probe substrate, the first electrode and the second electrode being spaced apart from each other and extending from the tip region along the probe substrate, an emitter and a detector disposed between the first electrode and the second electrode, the emitter and the detector being spaced apart from each other in a direction in which the probe substrate extends, and being configured to be photo switched, and a reflector disposed above the emitter and the detector in the direction in which the probe substrate extends opposite to the tip region, and configured to reflect an electromagnetic wave emitted from the emitter.
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