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公开(公告)号:US11462643B2
公开(公告)日:2022-10-04
申请号:US17091959
申请日:2020-11-06
Applicant: Acorn Semi, LLC
Inventor: Paul A. Clifton , Andreas Goebel , Walter A. Harrison
IPC: H01L29/00 , H01L29/786 , B82Y10/00 , H01L29/417 , H01L29/775 , H01L29/78 , H01L29/08 , H01L29/06 , H01L29/423
Abstract: A nanowire transistor includes undoped source and drain regions electrically coupled with a channel region. A source stack that is electrically isolated from a gate conductor includes an interfacial layer and a source conductor, and is coaxially wrapped completely around the source region, extending along at least a portion of the source region. A Schottky barrier between the source conductor and the source region is a negative Schottky barrier and a concentration of free charge carriers is induced in the semiconductor source region.
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公开(公告)号:US20210119009A1
公开(公告)日:2021-04-22
申请号:US17247803
申请日:2020-12-23
Applicant: Acorn Semi, LLC
Inventor: Walter A. Harrison , Paul A. Clifton , Andreas Goebel , R. Stockton Gaines
IPC: H01L29/47 , H01L21/283 , H01L21/285 , H01L29/45 , H01L21/324 , H01L29/04 , H01L29/161
Abstract: Techniques for reducing the specific contact resistance of metal-semiconductor (group IV) junctions by interposing a monolayer of group V or group III atoms at the interface between the metal and the semiconductor, or interposing a bi-layer made of one monolayer of each, or interposing multiple such bi-layers. The resulting low specific resistance metal-group IV semiconductor junctions find application as a low resistance electrode in semiconductor devices including electronic devices (e.g., transistors, diodes, etc.) and optoelectronic devices (e.g., lasers, solar cells, photodetectors, etc.) and/or as a metal source and/or drain region (or a portion thereof) in a field effect transistor (FET). The monolayers of group III and group V atoms are predominantly ordered layers of atoms formed on the surface of the group IV semiconductor and chemically bonded to the surface atoms of the group IV semiconductor.
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