Polymer, resist composition and patterning process
    94.
    发明授权
    Polymer, resist composition and patterning process 有权
    聚合物,抗蚀剂组合物和图案化工艺

    公开(公告)号:US06703183B2

    公开(公告)日:2004-03-09

    申请号:US10241530

    申请日:2002-09-12

    IPC分类号: G03F7004

    CPC分类号: C08F220/18 G03F7/0397

    摘要: A polymer comprising recurring units of formulae (1) and (2) wherein R1 and R3 are H or methyl, R2 and R4 are C1-15 alkyl, R5 to R8 are H, or R5 and R7, and R6 and R8 form trimethylene or 1,3-cyclopentylene and having a Mw of 1,000-500,000 is novel. A resist composition comprising the polymer as a base resin is sensitive to high-energy radiation, has excellent sensitivity, resolution and etching resistance and lends itself to micropatterning with electron beams or deep-UV.

    摘要翻译: 包含式(1)和(2)的重复单元的聚合物,其中R 1和R 3为H或甲基,R 2和R 4为C 1-15烷基,R 5为R 新颖的是H或R 5和R 7,并且R 6和R 8形成三亚甲基或1,3-亚环戊基并具有1,000-500,000的Mw。 包含作为基础树脂的聚合物的抗蚀剂组合物对高能量辐射敏感,具有优异的灵敏度,分辨率和耐蚀刻性,并且适用于电子束或深紫外线的微图案化。