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公开(公告)号:US20240149314A1
公开(公告)日:2024-05-09
申请号:US18213853
申请日:2023-06-25
Applicant: Samsung Electronics Co., Ltd.
Inventor: Hyunwoo Noh , Kyoungwoo Kim , Youngseok Jung , Youngjin Hong , Soochan Oh , Sungwoo Shin , Namhoon Lee , Bongju Lee
Abstract: Provided is a substrate processing apparatus configured to process a substrate having a notch including a plurality of rollers contacting a circumference of the substrate and configured to rotate the substrate, a first sensor configured to sense an impact between the plurality of rollers and the substrate, and a signal processing unit configured to detect revolutions per unit time of the substrate, based on a first sensing signal output by the first sensor.
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2.
公开(公告)号:US11813714B2
公开(公告)日:2023-11-14
申请号:US17026554
申请日:2020-09-21
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Hojoong Kim , Taesung Kim , Seokjun Hong , Junyong Kim , Donghyuk Jang , Youngjin Hong
IPC: B24B37/26
CPC classification number: B24B37/26
Abstract: A chemical mechanical polishing (CMP) apparatus and a CMP pad, the apparatus including a rotating plate; a CMP pad on an upper surface of the rotating plate; a rotating body facing the rotating plate and bringing a wafer into contact with the CMP pad to press the wafer; and a slurry supply configured to supply slurry to the CMP pad, wherein the CMP pad includes a pad body having a circular plate shape; a plurality of circular grooves on a bottom surface of the pad body, the plurality of circular grooves having a circular shape; and a connection groove connecting the plurality of circular grooves, the connection groove having a linear shape.
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