Abstract:
A semiconductor memory device can include a first conductive line crossing over a field isolation region and crossing over an active region of the device, where the first conductive line can include a first conductive pattern being doped, a second conductive pattern, and a metal-silicon-nitride pattern between the first and second conductive patterns and can be configured to provide a contact at a lower boundary of the metal-silicon-nitride pattern with the first conductive pattern and configured to provide a diffusion barrier at an upper boundary of the metal-silicon-nitride pattern with the second conductive pattern.
Abstract:
A light-emitting device and an electronic apparatus including the same. The light-emitting device includes a first electrode, a second electrode facing the first electrode, and an interlayer arranged between the first electrode and the second electrode, the interlayer includes a first emission layer and a second emission layer, the first emission layer includes a first host and a first dopant capable of emitting a first light, the first host includes m1 hosts, m1 is an integer of 1 or more, and when m1 is 2 or more, two or more hosts are present in the first emission layer and are different from the other, the second emission layer includes a second host and a second dopant capable of emitting a second light, the second host includes m2 hosts, m2 is an integer of 1 or more, and when m2 is 2 or more, two or more hosts are present in the second emission layer and are different from the other, the first dopant includes a first transition metal, the second dopant includes a second transition metal different from the first transition metal, and Expression 1 and Expression 2 are satisfied and provided in the present specification.