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公开(公告)号:US20230395455A1
公开(公告)日:2023-12-07
申请号:US18454876
申请日:2023-08-24
Applicant: HUAWEI TECHNOLOGIES CO., LTD.
Inventor: Shuiming LI , Yu WANG , Ping MA , Ming LU , Cen TANG , Zhili ZHANG , Qiang HE , Haijun LI , Tao LIU , Jin RAO
IPC: H01L23/367 , H01L23/373 , H01L29/66 , H01L29/778
CPC classification number: H01L23/367 , H01L23/3735 , H01L23/3736 , H01L29/66462 , H01L29/7786
Abstract: Embodiments of this application provide a semiconductor device, an electronic device, and a semiconductor device preparation method, and relate to the field of chip manufacturing and packaging technologies, to improve heat dissipation efficiency of the semiconductor device without increasing a size. The semiconductor device includes: a substrate, a source, a drain, a gate, and a groove. The source, the drain, and the gate are all formed on the substrate, and an active region is formed between the source and the drain on the substrate. The groove is disposed in the substrate, and a spacing is formed between the groove and the active region. A heat dissipation layer is formed in the groove, and a coefficient of thermal conductivity of the heat dissipation layer is greater than that of the substrate.
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2.
公开(公告)号:US20240274688A1
公开(公告)日:2024-08-15
申请号:US18603994
申请日:2024-03-13
Applicant: HUAWEI TECHNOLOGIES CO., LTD.
Inventor: Zhili ZHANG , Jin RAO , Tao LIU , Haijun LI , Shuiming LI , Ming LU
IPC: H01L29/45 , H01L21/285 , H01L21/768 , H01L23/00 , H01L23/367 , H01L23/373 , H01L23/48 , H01L29/20 , H01L29/40 , H01L29/417 , H01L29/66 , H01L29/778 , H03F3/213
CPC classification number: H01L29/452 , H01L21/28575 , H01L21/76898 , H01L23/3675 , H01L23/3735 , H01L23/481 , H01L24/32 , H01L24/45 , H01L24/48 , H01L24/73 , H01L29/2003 , H01L29/401 , H01L29/402 , H01L29/41758 , H01L29/66462 , H01L29/7786 , H01L2224/32225 , H01L2224/45144 , H01L2224/48175 , H01L2224/73265 , H01L2924/1033 , H01L2924/13064 , H01L2924/1421 , H03F3/213
Abstract: The present disclosure relates to semiconductor devices, manufacturing methods, a power amplification circuits, and electronic devices. One example semiconductor device includes a substrate, a channel layer and a barrier layer sequentially disposed on the substrate in a stacked manner, a source, a gate, and a drain disposed on the barrier layer, a backside via through a region from the substrate to the barrier layer below the source, and a backside conductive layer covering the backside via and a back surface of the substrate, where the source is in contact with and connected to the backside conductive layer.
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