Abstract:
The present disclosure provides for an analog-to-digital converter (ADC) which selectively compresses an analog input signal to improve noise performance and dynamic input range. The ADC selectively scales an analog input signal when it is closer to an expected value of one or more signal metrics more than when it is further from the expected value of the one or more signal metrics. For example, during the conversion process, the ADC amplifies the analog input signal when it is closer to a mean value μ by a gain factor while selectively adjusting the gain factor when the analog input signal is further from its mean value μ to selectively compress the analog input signal. This selective compression improves input noise performance and dynamic input range of the ADC when compared to the conventional ADC.
Abstract:
The present disclosure provides for an analog-to-digital converter (ADC) which selectively compresses an analog input signal to improve noise performance and dynamic input range. The ADC selectively scales an analog input signal when it is closer to an expected value of one or more signal metrics more than when it is further from the expected value of the one or more signal metrics. For example, during the conversion process, the ADC amplifies the analog input signal when it is closer to a mean value μ by a gain factor while selectively adjusting the gain factor when the analog input signal is further from its mean value μ to selectively compress the analog input signal. This selective compression improves input noise performance and dynamic input range of the ADC when compared to the conventional ADC.
Abstract:
A system includes a first storage element to store an input signal for a first sampling lane for a SHA-less stage. A first switch is connected with the first storage element, the first switch to control when the first storage element stores the input signal for sampling on the first sampling lane. A second switch is connected in series with the first switch, the second switch to control an instance for sampling the input signal stored on the first storage element for the first sampling lane.
Abstract:
A system includes a pipeline analog-to-digital converter as a first stage to process an input signal, and a successive approximation register (SAR) analog-to-digital converter as a second stage to process the input signal. The SAR analog-to-digital converter includes a power adjustment element to adjust a reference voltage of the SAR analog-to-digital converter to match a full scale voltage of the pipeline-analog-to-digital converter.
Abstract:
The present disclosure is directed to a system and method for adjusting a conversion speed of an asynchronous SAR ADC based on a margin of time between when a conversion of a sample of an analog signal completes and a next sample of the analog signal is taken, referred to as a “conversion time margin.” The system and method reduce the conversion speed of an asynchronous SAR ADC when the conversion time margin permits to reduce the amount of power consumed and/or noise produced by the asynchronous SAR ADC.
Abstract:
A system includes a pipeline analog-to-digital converter as a first stage to process an input signal, and a successive approximation register (SAR) analog-to-digital converter as a second stage to process the input signal. The SAR analog-to-digital converter includes a power adjustment element to adjust a reference voltage of the SAR analog-to-digital converter to match a full scale voltage of the pipeline-analog-to-digital converter.
Abstract:
A method for digitizing an analog signal through a pipelined analog-to-digital converter (ADC) may include pipelining a sample sub-stage, a quantization sub-stage and an amplification sub-stage to an ADC lane. Within a first of multiple pipelined stages, clock phases may be assigned to the ADC lane, including a sample clock phase, a quantization clock phase, and an amplification clock phase such that the quantization clock phase is non-overlapping with the sample clock phase and the amplification clock phase. The non-overlapping feature may be facilitated by generating multiple reference clock phases for the sub-stages of multiple ADC lanes, and interleaving assignment of the sample clock phase, the quantization clock phase, and the amplification clock phase to the reference clock phases among the multiple lanes.