HIGH-POWER DENSITY RF REMOTE PLASMA SOURCE APPARATUS

    公开(公告)号:US20230060529A1

    公开(公告)日:2023-03-02

    申请号:US17874929

    申请日:2022-07-27

    Abstract: Embodiments disclosed herein include a plasma source. In an embodiment, the plasma source includes a plurality of plasma legs connected to each other by corner connectors. In an embodiment, each plasma leg comprises a conductive shell, a magnetic layer around the conductive shell, and a primary coil in the magnetic layer.

    Apparatus for treating exhaust gas in a processing system

    公开(公告)号:US11110392B2

    公开(公告)日:2021-09-07

    申请号:US16429357

    申请日:2019-06-03

    Abstract: Methods and apparatus for treating an exhaust gas in a foreline of a substrate processing system are provided herein. In some embodiments, a method for treating an exhaust gas in an exhaust conduit of a substrate processing system includes: flowing an exhaust gas from a process chamber into a plasma source via a foreline; injecting a reagent into the foreline; forming a plasma in the plasma source from the exhaust gas and the reagent; and injecting a cleaning gas into the foreline, wherein the cleaning gas and the reagent are different gases.

    Methods for treating exhaust gas in a processing system

    公开(公告)号:US10722840B2

    公开(公告)日:2020-07-28

    申请号:US15449226

    申请日:2017-03-03

    Abstract: Methods and apparatus for treating an exhaust gas in a foreline of a substrate processing system are provided herein. In some embodiments, a method for treating an exhaust gas in an exhaust conduit of a substrate processing system includes: flowing an exhaust gas and a reagent gas into an exhaust conduit of a substrate processing system; injecting a non-reactive gas into the exhaust conduit to maintain a desired pressure in the exhaust conduit for conversion of the exhaust gas; and forming a plasma from the exhaust gas and reagent gas, subsequent to injecting the non-reactive gas, to convert the exhaust gas to abatable byproduct gases.

    REMOTE PLASMA APPARATUS FOR GENERATING HIGH-POWER DENSITY MICROWAVE PLASMA

    公开(公告)号:US20220415617A1

    公开(公告)日:2022-12-29

    申请号:US17835718

    申请日:2022-06-08

    Inventor: Mehran Moalem

    Abstract: Embodiments disclosed herein include a plasma source. In an embodiment, a plasma source comprises a dielectric body with a top surface, a bottom surface, and sidewall surfaces. In an embodiment, a plurality of holes pass through the dielectric body, where a first set of holes pass from the top surface to the bottom surface, and a second set of holes pass between opposite sidewall surfaces. In an embodiment, a housing is around the dielectric body, and a monopole antenna extending into the dielectric body.

    HIGH-EFFICIENCY RF REMOTE PLASMA SOURCE APPARATUS

    公开(公告)号:US20220415612A1

    公开(公告)日:2022-12-29

    申请号:US17835730

    申请日:2022-06-08

    Abstract: Embodiments disclosed herein include plasma sources. In an embodiment, a plasma source comprises an input to a plenum for dividing gas into a plurality of parallel fluidic paths, a plurality of plasma zones, wherein each plasma zone is along one of the plurality of parallel fluidic paths, and a plurality of magnetic cores, wherein each magnetic core surrounds one of the plurality of plasma zones. In an embodiment, an RF coil wraps around the plurality of magnetic cores. In an embodiment, the plasma source further comprises a manifold at a bottom of the plurality of plasma zones, where the manifold merges the plurality of fluidic paths into a single output.

    APPARATUS TO DETECT AND QUANTIFY RADICAL CONCENTRATION IN SEMICONDUCTOR PROCESSING SYSTEMS

    公开(公告)号:US20220392812A1

    公开(公告)日:2022-12-08

    申请号:US17735837

    申请日:2022-05-03

    Inventor: Mehran Moalem

    Abstract: Embodiments disclosed herein include a processing tool for measuring neutral radical concentrations. In an embodiment, the processing tool comprises a processing chamber, and a neutral radical mass spectrometry (NRMS) analyzer fluidically coupled to the processing chamber. In an embodiment, the NRMS analyzer comprises a first chamber fluidically coupled to the processing chamber, where the first chamber comprises a modulator, and a second chamber fluidically coupled to the first chamber, where the second chamber is a residual gas analyzer or a mass spectrometer. In an embodiment, an unobstructed line of sight passes from the processing chamber to the second chamber.

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