Calibration system for attenuated total reflection spectrometry

    公开(公告)号:US11060914B2

    公开(公告)日:2021-07-13

    申请号:US16147826

    申请日:2018-09-30

    Abstract: An ATR scanner and method for calibrating the same are disclosed. The scanner includes an ATR objective having a reflecting face and an optical port adapted to receive a first light beam, and to focus the first light beam to a point, at a location on the reflecting face such that the first light beam is reflected by the reflecting face and no portion of the first light beam strikes the reflecting face at an angle greater than the critical angle. A detector measures an intensity of light reflected from the reflecting face. A controller controls the location of the focal point and determines an intensity of light that was incident on the reflecting face as a function of the position on the reflecting face and an intensity of light that was reflected from the reflecting face as a function of position on the reflecting face.

    Mid-Infrared Scanning System for Analyzing Particulates

    公开(公告)号:US20200309669A1

    公开(公告)日:2020-10-01

    申请号:US16777847

    申请日:2020-01-30

    Abstract: An apparatus and method for analyzing particulates in a sample is disclosed. The method includes placing the sample on a moveable stage in an apparatus having a tunable MIR light scanner and a visible imaging system, the stage moving between the MIR light scanner and the visible imaging system, providing a visible image of the sample, and receiving user input as to a region of the sample that is to be analyzed. The sample is then moved to the MIR light scanner, the MIR light scanner generating an MIR light beam that is focused to a point on the specimen and measuring light reflected from the specimen. The specimen is then scanned at a first MIR wavelength by moving the specimen relative to the MIR light beam, and particles are identified that meet a selection criterion. The MIR absorption spectrum of each of the identified particle is then automatically measured.

    METHOD OF CONTROLLING FREQUENCY MODULATED-ATOMIC FORCE MICROSCOPE
    4.
    发明申请
    METHOD OF CONTROLLING FREQUENCY MODULATED-ATOMIC FORCE MICROSCOPE 审中-公开
    控制频率调制原子力显微镜的方法

    公开(公告)号:US20140150139A1

    公开(公告)日:2014-05-29

    申请号:US13685842

    申请日:2012-11-27

    CPC classification number: G01Q10/065 G01Q60/32

    Abstract: A method is provided for controlling an FM-AFM including a cantilever having a resonant frequency and an excitation system configured to oscillate the cantilever in response to a drive signal. The method includes determining latency of the excitation system; receiving a deflection signal indicating a deflection of a cantilever tip; mixing the deflection signal with a first sine signal output by a PLL indicating a frequency shift of a frequency response of the cantilever; measuring the frequency shift in response to the drive signal; determining spurious phase of the cantilever based on the determined latency, the resonant frequency of the cantilever, and the measured frequency shift; providing a second sine signal having a phase that is advanced by the determined spurious phase to preemptively compensate for subsequent spurious phase of the cantilever; and driving the excitation system using the second sine signal with an adjusted amplitude as the drive signal.

    Abstract translation: 提供了一种用于控制FM-AFM的方法,其包括具有共振频率的悬臂和被配置为响应于驱动信号振荡悬臂的激励系统。 该方法包括确定激励系统的等待时间; 接收指示悬臂尖的偏转的偏转信号; 将偏转信号与由PLL输出的第一正弦信号混合,指示悬臂的频率响应的频率偏移; 测量响应于驱动信号的频移; 基于确定的等待时间,悬臂的谐振频率和测量的频移来确定悬臂的杂散相位; 提供具有相位的第二正弦信号,所述相位通过所确定的寄生相位推进,以抢先补偿悬臂的后续杂散相位; 并使用具有调整振幅的第二正弦信号作为驱动信号来驱动励磁系统。

    Mid-infrared scanning system for analyzing particulates

    公开(公告)号:US11175212B2

    公开(公告)日:2021-11-16

    申请号:US16777847

    申请日:2020-01-30

    Abstract: An apparatus and method for analyzing particulates in a sample is disclosed. The method includes placing the sample on a moveable stage in an apparatus having a tunable MIR light scanner and a visible imaging system, the stage moving between the MIR light scanner and the visible imaging system, providing a visible image of the sample, and receiving user input as to a region of the sample that is to be analyzed. The sample is then moved to the MIR light scanner, the MIR light scanner generating an MIR light beam that is focused to a point on the specimen and measuring light reflected from the specimen. The specimen is then scanned at a first MIR wavelength by moving the specimen relative to the MIR light beam, and particles are identified that meet a selection criterion. The MIR absorption spectrum of each of the identified particle is then automatically measured.

    High dynamic range infrared imaging spectroscopy

    公开(公告)号:US10184835B2

    公开(公告)日:2019-01-22

    申请号:US14863225

    申请日:2015-09-23

    Abstract: An imaging scanner and a method for using the same are disclosed. The scanner includes a variable attenuator adapted to receive a light beam generated by a MIR laser and that generates an attenuated light beam therefrom characterized by an attenuation level. The scanner includes an optical assembly that focuses the attenuated light beam to a point on a specimen. A light detector measures an intensity of light leaving the point on the specimen, the light detector being characterized by a detector dynamic range. A controller forms a plurality of MIR images from the intensity as a function of position on the specimen, each of the plurality of MIR images being formed with a different level of attenuation of the light beam. The controller combines the plurality of MIR images to generate a combined MIR image having a dynamic range greater than the detector dynamic range.

    ATOMIC FORCE MICROSCOPE SYSTEM USING SELECTIVE ACTIVE DAMPING
    7.
    发明申请
    ATOMIC FORCE MICROSCOPE SYSTEM USING SELECTIVE ACTIVE DAMPING 有权
    使用选择性主动阻尼的原子力显微镜系统

    公开(公告)号:US20140137300A1

    公开(公告)日:2014-05-15

    申请号:US13675251

    申请日:2012-11-13

    Abstract: An atomic force microscope (AFM) system comprises a cantilever arm attached to a probe tip. The system controls a height of the cantilever arm to press the probe tip against a sample and then separate the probe tip from the sample, to detect a disturbance of the cantilever arm after the separation of the probe tip from the surface, and to engage active damping of the cantilever arm to suppress the disturbance.

    Abstract translation: 原子力显微镜(AFM)系统包括连接到探针尖端的悬臂。 该系统控制悬臂的高度,以将探针尖端压靠在样品上,然后将探针尖端与样品分开,以在探针尖端与表面分离之后检测悬臂的干扰,并且使活动 悬臂的阻尼来抑制扰动。

    Apparatus and method for three-dimensional infrared imaging of surfaces

    公开(公告)号:US09924115B2

    公开(公告)日:2018-03-20

    申请号:US14863128

    申请日:2015-09-23

    CPC classification number: H04N5/33 G01B11/0608

    Abstract: A scanner and method for using the same are disclosed. The scanner includes a stage, a MIR light source, an imaging system, and a controller. The stage is adapted to hold a specimen to be imaged and to move the specimen in a first direction and in a second direction that is orthogonal to the lateral direction. The imaging system forms an image plane of the specimen when the stage is positioned at a second direction distance, z, from a known point in the imaging system. The imaging system forms a plurality of different image planes of the specimen at the illumination wavelength. Each of the plurality of image planes is characterized by a different value of z, the controller determining a value of z for each of a plurality of points on the specimen at which the point on the specimen is in focus.

    Apparatus and Method for Three-Dimensional Infrared Imaging of Surfaces

    公开(公告)号:US20170085810A1

    公开(公告)日:2017-03-23

    申请号:US14863128

    申请日:2015-09-23

    CPC classification number: H04N5/33 G01B11/0608

    Abstract: A scanner and method for using the same are disclosed. The scanner includes a stage, a MIR light source, an imaging system, and a controller. The stage is adapted to hold a specimen to be imaged and to move the specimen in a first direction and in a second direction that is orthogonal to the lateral direction. The imaging system forms an image plane of the specimen when the stage is positioned at a second direction distance, z, from a known point in the imaging system. The imaging system forms a plurality of different image planes of the specimen at the illumination wavelength. Each of the plurality of image planes is characterized by a different value of z, the controller determining a value of z for each of a plurality of points on the specimen at which the point on the specimen is in focus.

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