发明授权
- 专利标题： Semiconductor devices and semiconductor systems
- 专利标题（中）： 半导体器件和半导体系统
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申请号： US15193588申请日： 2016-06-27
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公开(公告)号： US09589669B1公开(公告)日： 2017-03-07
- 发明人: Young Hyun Baek , Bo Yeun Kim , Sang Hee Kim , Ji Eun Jang
- 申请人： SK hynix Inc.
- 申请人地址： KR Icheon-si
- 专利权人： SK HYNIX INC.
- 当前专利权人： SK HYNIX INC.
- 当前专利权人地址： KR Icheon-si
- 代理机构： William Park & Associates Ltd.
- 优先权： KR10-2016-0032408 20160317
- 主分类号： G11C5/14
- IPC分类号： G11C5/14 ; G11C29/02 ; G11C7/10 ; G11C7/12 ; G11C17/16 ; G11C17/18 ; G11C29/00
摘要：
A semiconductor system and semiconductor device may be provided. The semiconductor system may include a first semiconductor device configured to generate a test mode signal and configured to receive output data. The semiconductor system may include a second semiconductor device configured to enter a test mode, based on the test mode signal, and block the output data of data that is stored in redundancy memory cells connected to unrepaired redundancy word lines which are not used among redundancy word lines provided for replacing failed word lines.
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