Invention Grant
US09449660B2 Sampling circuit module, memory control circuit unit, and method for sampling data
有权
采样电路模块,存储器控制电路单元和数据采样方法
- Patent Title: Sampling circuit module, memory control circuit unit, and method for sampling data
- Patent Title (中): 采样电路模块,存储器控制电路单元和数据采样方法
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Application No.: US14309879Application Date: 2014-06-19
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Publication No.: US09449660B2Publication Date: 2016-09-20
- Inventor: Jen-Chu Wu , An-Chung Chen
- Applicant: PHISON ELECTRONICS CORP.
- Applicant Address: TW Miaoli
- Assignee: PHISON ELECTRONICS CORP.
- Current Assignee: PHISON ELECTRONICS CORP.
- Current Assignee Address: TW Miaoli
- Agency: Jianq Chyun IP Office
- Priority: TW103115032A 20140425
- Main IPC: G11C7/22
- IPC: G11C7/22 ; H03L7/091 ; H03L7/08 ; H03L7/081 ; G11C7/10

Abstract:
A sampling circuit module, a memory control circuit unit, and a method for sampling data are provided. The sampling circuit module includes a state machine circuit, a first delay line circuit, a second delay line circuit and a delay signal output circuit. In response to a first control signal, the state machine circuit outputs a second control signal and/or a third control signal. The first delay line circuit is configured to receive a reference clock signal and the second control signal to output a first delay clock signal. The second delay line circuit is configured to receive the reference clock signal and the third control signal to output a second delay clock signal. The delay signal output circuit is configured to receive the first delay clock signal and the second delay clock signal to output a third delay clock signal.
Public/Granted literature
- US20150311907A1 SAMPLING CIRCUIT MODULE, MEMORY CONTROL CIRCUIT UNIT, AND METHOD FOR SAMPLING DATA Public/Granted day:2015-10-29
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