发明授权
US08962464B1 Self-alignment for using two or more layers and methods of forming same
有权
使用两层或多层的自对准及其形成方法
- 专利标题: Self-alignment for using two or more layers and methods of forming same
- 专利标题(中): 使用两层或多层的自对准及其形成方法
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申请号: US14030601申请日: 2013-09-18
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公开(公告)号: US08962464B1公开(公告)日: 2015-02-24
- 发明人: Shih-Ming Chang , Ru-Gun Liu , Ken-Hsien Hsieh , Ming-Feng Shieh , Chih-Ming Lai , Tsai-Sheng Gau
- 申请人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 代理机构: Slater & Matsil, L.L.P.
- 主分类号: H01L21/3205
- IPC分类号: H01L21/3205 ; H01L21/768 ; H01L21/28
摘要:
Embodiments of the present disclosure include self-alignment of two or more layers and methods of forming the same. An embodiment is a method for forming a semiconductor device including forming at least two gates over a substrate, forming at least two alignment structures over the at least two gates, forming spacers on the at least two alignment structures, and forming a first opening between a pair of the at least two alignment structures, the first opening extending a first distance from a top surface of the substrate. The method further includes filling the first opening with a first conductive material, forming a second opening between the spacers of at least one of the at least two alignment structures, the second opening extending a second distance from the top surface of the substrate, and filling the second opening with a second conductive material.
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