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US08686476B2 Resistance-switching memory cells adapted for use at low voltage 有权
适于在低电压下使用的电阻切换存储单元

Resistance-switching memory cells adapted for use at low voltage
Abstract:
A memory cell is provided that includes a diode and a resistance-switching material layer coupled in series with the diode. The resistance-switching material layer: (a) includes a material from the family consisting of XvOw, wherein X represents an element from the family consisting of Hf and Zr, and wherein the subscripts v and w have non-zero values that form a stable compound, and (b) has a thickness between 20 and 65 angstroms. Other aspects are also provided.
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