- 专利标题： SEMICONDUCTOR DEVICE, INSPECTION APPARATUS OF SEMICONDUCTOR DEVICE, AND METHOD FOR INSPECTING SEMICONDUCTOR DEVICE
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申请号： US18676114申请日： 2024-05-28
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公开(公告)号： US20240312780A1公开(公告)日： 2024-09-19
- 发明人: Yosuke KAJIWARA , Masahiko KURAGUCHI
- 申请人： KABUSHIKI KAISHA TOSHIBA
- 申请人地址： JP Tokyo
- 专利权人： KABUSHIKI KAISHA TOSHIBA
- 当前专利权人： KABUSHIKI KAISHA TOSHIBA
- 当前专利权人地址： JP Tokyo
- 优先权： JP 20072779 2020.04.15
- 分案原申请号： US17141461 2021.01.05
- 主分类号： H01L21/02
- IPC分类号： H01L21/02 ; H01L29/04 ; H01L29/20 ; H01L29/40
摘要：
According to one embodiment, a semiconductor device includes a first transistor, and a first mounting member. The first transistor includes a nitride semiconductor layer and includes a first element electrode, a second element electrode, and a third element electrode. The first mounting member includes a first frame electrode, a plurality of first frame connection members electrically connecting the first element electrode and the first frame electrode, a first pad electrode, and a first pad connection member electrically connecting the first element electrode and the first pad electrode.
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