Invention Publication
- Patent Title: FLUID HANDLING SYSTEM AND LITHOGRAPHIC APPARATUS
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Application No.: US17641206Application Date: 2020-08-26
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Publication No.: US20240192607A1Publication Date: 2024-06-13
- Inventor: Theodorus Wilhelmus POLET , Koen STEFFENS , Ronald VAN DER HAM , Gerben PIETERSE , Erik Henricus Egidius Catharina EUMMELEN , Francis FAHRNI
- Applicant: ASML NETHERLANDS B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML NETHERLANDS B.V.
- Current Assignee: ASML NETHERLANDS B.V.
- Current Assignee Address: NL Veldhoven
- Priority: EP 197225.6 2019.09.13
- International Application: PCT/EP20/73867 2020.08.26
- Date entered country: 2022-03-08
- Main IPC: G03F7/00
- IPC: G03F7/00 ; G03F7/20

Abstract:
A fluid handling system for wetting a substrate irradiated by radiation. The fluid handling system include a first device to confine a first liquid to a first space between the first device and the substrate. The first device includes a first liquid supply member to provide the first liquid to the first space and an extraction member to remove liquid. The fluid handling system further includes a second device including a second liquid supply member to provide a second liquid to a second space between the second device and the substrate, wherein there is a gap on the surface of the substrate between the first and second liquids. The fluid handling system is configured to provide the second liquid to the second space without removing any liquid from the second space to form a liquid layer, and is configured to provide the first and second liquids on the substrate simultaneously.
Public/Granted literature
- US12072636B2 Fluid handling system and lithographic apparatus Public/Granted day:2024-08-27
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