Invention Grant
- Patent Title: Microscope system configured to irradiate focused light onto an area of a specimen outside of an optical axis of an objective lens
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Application No.: US15683980Application Date: 2017-08-23
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Publication No.: US10281699B2Publication Date: 2019-05-07
- Inventor: Tatsuo Nakata , Atsushi Doi , Kentaro Imoto
- Applicant: OLYMPUS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: Olympus Corporation
- Current Assignee: Olympus Corporation
- Current Assignee Address: JP Tokyo
- Agency: Holtz, Holtz & Volek PC
- Priority: JP2016-167334 20160829
- Main IPC: G02B21/00
- IPC: G02B21/00 ; G02B21/06 ; G02B21/24

Abstract:
A microscope system includes an objective lens that focuses, on a specimen, illumination light produced by a light source. An illumination-area switching mechanism is disposed between the objective lens and the specimen and switches an illumination area irradiated with the illumination light focused by the objective lens among a plurality of illumination areas on the specimen that are located outside an objective optical axis of the objective lens. An inner focus lens is disposed on the objective optical axis between the light source and the objective lens and changes a focus position of the objective lens in a direction along the objective optical axis.
Public/Granted literature
- US20180059397A1 MICROSCOPE SYSTEM Public/Granted day:2018-03-01
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