公开(公告)号：US12211294B2

公开(公告)日：2025-01-28

申请号：US17531289

申请日：2021-11-19

Applicant: HYUNDAI MOTOR COMPANY ,  Kia Corporation

Inventor： Sung Joon Park

IPC: G06V20/59 ,  A61B5/00 ,  A61B5/08 ,  B60N2/02 ,  B60W10/20 ,  B60W40/08 ,  B60W50/16 ,  G02B27/54 ,  H04N23/55 ,  B60W50/14

Abstract: In accordance with one aspect of the disclosure, a driver monitoring apparatus includes: a camera having a field of view facing a driver's seat of a vehicle and configured to provide image data; and a controller configured to process the image data, and the controller is configured to identify at least one of a respiratory rate per minute or a respiratory volume of a driver based on the image data, identify whether the driver is in a state of a drowsy driving based on at least one of the respiratory rate per minute or the respiratory volume of the driver, and provide a control request to output a warning message through a display and speaker of the vehicle based on the drowsy driving of the driver.

公开(公告)号：US11594863B2

公开(公告)日：2023-02-28

申请号：US16817884

申请日：2020-03-13

Applicant: Teradiode, Inc.

Inventor： Michael Deutsch ,  Daqing Wang

IPC: G02B27/54 ,  H01S5/40 ,  H01S5/00 ,  G02B27/00 ,  G02B27/30

Abstract: A system and method of providing a deformed FAC Lens to a multi-emitter diode bar laser system comprised of a lens holder and FAC lens wherein the FAC Lens is deformed so as to offset or compensate for the inherent smile properties present in a multi-emitter diode bar.

公开(公告)号：US20220299437A1

公开(公告)日：2022-09-22

申请号：US17490612

申请日：2021-09-30

Applicant: UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA

Inventor： Brett F. Bathel ,  Joshua M. Weisberger

IPC: G01N21/45 ,  G01N21/958 ,  G02B27/54

Abstract: A digital projection and reflected glare reduction system according to various aspects of the present technology may include a digital display device capable of generating a one or two dimensional source grid pattern back-illuminated by a light source to project an image of a source grid onto a retroreflective background. The projected source grid image may then be re-imaged onto the original grid element at a slight offset eliminating the need to generate a separate cutoff grid thereby reducing the amount of time required to setup and adjust the system. The digital display device is also capable of switching between a schlieren visualization capability to some other visualization capability (such as particle tracking velocimetry (PTV), particle imaging velocimetry (NV), temperature sensitive paint measurements (TSP), pressure sensitive paint measurements (PSP), photogrammetry, etc.) allowing for the simultaneous use of two different imaging techniques.

公开(公告)号：US10459127B2

公开(公告)日：2019-10-29

申请号：US15720221

申请日：2017-09-29

Applicant: NANKAI UNIVERSITY

Inventor： Shuqi Chen ,  Wenwei Liu ,  Hua Cheng ,  Jianguo Tian

IPC: G02B3/08 ,  G02B27/00 ,  G02B6/122 ,  G02B27/54 ,  G02B6/10 ,  G02B5/18 ,  G02B27/46

Abstract: Provided are a Fourier lens, a method for designing a Fourier lens, and a schlieren apparatus. The Fourier lens includes a substrate and a plurality of cuboid waveguides. The plurality of waveguides are arranged on the substrate in parallel and spaced from each other at a preset interval. The material of the substrate and the material of the waveguides are all transparent to the working waveband of the Fourier lens. The preset interval is smaller than a quotient obtained by dividing a center wavelength of the working waveband by the refractive index of the substrate. The waveguide has a plurality of widths, and the waveguides of different widths correspond to different phase delays. The individual waveguides are arranged on the substrate according to phase delays required at different positions. According to the embodiments, the range of the working angle of the Fourier lens can be increased.

公开(公告)号：US09857698B2

公开(公告)日：2018-01-02

申请号：US15303478

申请日：2015-03-19

Applicant: ASML Netherlands B.V.

Inventor： Robertus Johannes Marinus De Jongh ,  Leon Leonardus Franciscus Merkx ,  Roel Johannes Elisabeth Merry

IPC: G02B27/54 ,  G03F7/20 ,  G02B7/182

CPC classification number: G03F7/70775 ,  G02B7/1828 ,  G03F7/70258 ,  G03F7/70758 ,  G03F7/70825

Abstract: A lithographic apparatus includes a reflector to redirect a radiation beam, e.g. an EUV beam. The position of the reflector is controlled using a controller and a positioning system. The positioning system includes a non-compensating actuator device and a compensating actuator device to compensate for parasitic forces of the non-compensating actuator device. The positioning system and controller can provide a more accurate position of the reflector, reduce deformation of the reflector and reduce the magnitude of forces transmitting through the reflector.

公开(公告)号：US08810781B2

公开(公告)日：2014-08-19

申请号：US13447314

申请日：2012-04-16

Applicant: Xuyue Wang ,  Lianji Wang ,  Wenji Xu ,  Yande Liang ,  Renke Kang ,  Dongming Guo

Inventor： Xuyue Wang ,  Lianji Wang ,  Wenji Xu ,  Yande Liang ,  Renke Kang ,  Dongming Guo

IPC: G01N21/00 ,  G02B27/54 ,  G01N5/04

CPC classification number: G02B27/54 ,  G01N5/04

Abstract: A detection device is described for measuring the vaporization-melt ratio, the device including a light source, a first and second optical lens group, a slit, a first and second steering mirror, a first and second primary mirror, a glass container, a colored blade, and a high-speed recording analyzer. The first primary mirror and the second primary mirror are symmetrically placed at both ends of the glass container. The first optical lens group is located between the light source and the slit. The second optical lens group is located between the colored blade and the high-speed recording analyzer. The first steering mirror is installed behind the slit, passing the light from the slit to the first primary mirror. The light reflected by the second primary mirror is passed to the colored blade from the second steering mirror located between the second primary mirror and the colored blade.

Abstract translation: 描述了一种用于测量蒸发 - 熔融比的检测装置，该装置包括光源，第一和第二光学透镜组，狭缝，第一和第二转向镜，第一和第二主反射镜，玻璃容器， 彩色刀片和高速记录分析仪。 第一主镜和第二主镜对称放置在玻璃容器的两端。 第一光学透镜组位于光源和狭缝之间。 第二光学透镜组位于着色刮板和高速记录分析器之间。 第一转向镜安装在狭缝后面，将光从狭缝传递到第一主镜。 由第二主反射镜反射的光从位于第二主反射镜和彩色叶片之间的第二转向镜传递到彩色叶片。

公开(公告)号：US06924936B2

公开(公告)日：2005-08-02

申请号：US10449253

申请日：2003-05-29

Applicant: Akira Nakamura

Inventor： Akira Nakamura

IPC: G02B26/06 ,  G02B13/16 ,  G02B17/00 ,  G02B17/08 ,  G02B26/10 ,  G02B27/18 ,  G02B27/54 ,  G02F1/13 ,  G03B21/00 ,  G03B21/14 ,  H04N3/08 ,  H04N5/74 ,  G02B27/14

CPC classification number: G02B26/105

Abstract: A one-dimensional image is formed by reflecting the light from a one-dimensional display device having a plurality of light emitting sections or light emitting sections disposed in one direction by a projection optical system three times or more. Then, a two-dimensional image is obtained by optically scanning the one-dimensional image by a light deflection means in a surface including a direction perpendicular to the disposing direction of the light emitting sections or the light emitting sections in the one-dimensional display device. A magnification projecting system is provided to project the two-dimensional image by magnifying it as it is as an intermediate image. A requirement for high resolution can be coped with by employing the one-dimensional display device as well as a small and less expensive light scanning apparatus and two-dimensional image forming apparatus can be realized thereby.

Abstract translation: 通过用投影光学系统将具有多个发光部分或发光部分的一维显示装置的光反射到一个方向上来形成一维图像三次或更多次。 然后，通过光偏转装置在包括与一维显示装置中的发光部分或发光部分的设置方向垂直的方向的表面中光学扫描一维图像，获得二维图像 。 提供放大倍率投影系统以通过将二维图像原样放大为投影图像作为中间图像。 可以通过使用一维显示装置以及小而不便宜的光扫描装置来应对高分辨率的要求，从而可以实现二维图像形成装置。

公开(公告)号：US20050036153A1

公开(公告)日：2005-02-17

申请号：US10861673

申请日：2004-06-04

Applicant: Luc Joannes

Inventor： Luc Joannes

IPC: G01N21/45 ,  G02B27/54 ,  G01B9/02

CPC classification number: G02B27/54 ,  G01N21/455

Abstract: An apparatus and method for measuring by the Schlieren technique light beam deviations generated by a sample (EV) includes a source (S) of light beam for illuminating the sample (EV) therewith so as to have a transmitted beam. An imaging means is provided (L2, L3) for forming an image of the sample from the transmitted beam. A filtering means acts as a Schlieren filter (SF) for obtaining “Schlieren fringes” from the image. The Schlieren filter (SF) comprises a periodic structure (SFP) of a defined period. A detecting means (CCD) is provided for detecting the Schlieren fringes under operating conditions. The apparatus can also include means to shift the filtering means with a shift φ by a fraction of the period of the periodic structure thereby shifting the Schlieren fringes, means to acquire a set of at least three successive phase-shifted images; means for reconstructing a mean image of the sample from said collected phase-shifted images using a phase-shifting algorithm used in interferometry, and processing means to calculate by said phase-shifting analysis the optical characteristics, angle and phase of the transmitted beam from said reconstructed image so as to determine the beam deviation angle generated by the sample.

Abstract translation: 用于通过施利伦技术测量的装置和方法由样品（EV）产生的光束偏差包括用于照射样品（EV）的光束源（S）以具有透射束。 提供了一种成像装置（L2，L3），用于从透射光束形成样品的图像。 过滤装置用作Schlieren过滤器（SF），用于从图像中获得“Schlieren条纹”。 Schlieren滤波器（SF）包括定义周期的周期性结构（SFP）。 提供检测装置（CCD），用于在操作条件下检测施莱伦条纹。 该装置还可以包括用移位装置移动滤波装置的装置，该移动装置以周期性结构周期的一小部分移动，从而移动施伦瑞条纹，用于获取一组至少三个连续的相移图像的装置; 用于使用在干涉测量中使用的相移算法从所述收集的相移图像重建样本的平均图像的装置，以及通过所述相移分析来计算所述透射光束的光学特性，角度和相位的处理装置 重建图像，以便确定样本产生的光束偏移角。

公开(公告)号：US5255118A

公开(公告)日：1993-10-19

申请号：US815464

申请日：1991-12-31

Applicant: David L. Hecht

Inventor： David L. Hecht

IPC: G02B27/54 ,  B41J2/44 ,  G02F1/03 ,  G02F1/315 ,  G03G15/04 ,  G06K15/12 ,  G02F1/29

CPC classification number: G02F1/315 ,  G06K15/1252

Abstract: A technique for reducing interpixel crosstalk in an electrooptic total internal reflection light modulator image bar. A particular electrode length is selected to tailor a portion of the spatial frequency response of the image bar. The pixel size and quality resulting from a voltage difference between electrodes are determined primarily by the overall image bar spatial frequency response, and a set of preferred physical parameters can be determined by selecting parameter values to provide the desired spatial frequency response. It has been found that a desirable frequency response is one that approximates sin(.pi.Pf) for absolute values of f less than about 1/P, where f is the spatial frequency and P is the minimum pixel pitch. Further, it has been found that a particular electrode length provides the desired response for small absolute values of f. The particular electrode length is approximately E.sup.1/2 P/.gamma. where E is the ratio of the normal to tangential dielectric tensor components, P is the minimum pixel pitch, and .gamma. is the grazing angle. The desired cutoff in the frequency response for absolute values of f above about 1/P can be achieved by selecting appropriate values for other physical parameters.

Abstract translation: 一种用于减少电光全内反射光调制器图像条中的像素间串扰的技术。 选择特定电极长度以定制图像条的空间频率响应的一部分。 由电极之间的电压差产生的像素尺寸和质量主要由整个图像条空间频率响应确定，并且可以通过选择参数值来确定一组优选的物理参数以提供期望的空间频率响应。 已经发现，期望的频率响应是对于小于约1 / P的f的绝对值近似于sin（pi Pf）的f，其中f是空间频率，P是最小像素间距。 此外，已经发现特定的电极长度为小的绝对值f提供期望的响应。 特定电极长度近似为E1 / 2P /γ，其中E是法向与切向介电张量分量的比率，P是最小像素间距，γ是掠射角。 通过为其他物理参数选择合适的值，可以获得f大于约1 / P的绝对值的频率响应中所需的截止频率。

公开(公告)号：US4812039A

公开(公告)日：1989-03-14

申请号：US108934

申请日：1987-10-16

Applicant: Yoshihiro Shimada ,  Tadafumi Fujihara ,  Chikara Nagano ,  Katsuo Tsukamoto

Inventor： Yoshihiro Shimada ,  Tadafumi Fujihara ,  Chikara Nagano ,  Katsuo Tsukamoto

IPC: G02B27/54 ,  G01N21/41

CPC classification number: G02B27/54

Abstract: A schlieren optical device using diode emitting monochromatic light as spot light source so as to have a compact and light-weight design, low calorific power, and low power consumption, and assure high reliability. In said optical device, imaging lens consists of a pair of lens groups arranged with an airspace reserved therebetween, knife edge consists of a light-shielding coating arranged on the surface of one of said lens groups and the other lens group is displaceable along the optical axis. Said optical device comprises a schlieren optical system and an optical system of a transmission type of microscope having optical axes perpendicularly intersecting with each other at the position of a sample, or a pair of schlieren optical systems and an optical system of a transmission type of microscope having optical axes perpendicularly intersecting with one another.

Abstract translation: 一种使用发射单色光的二极管作为点光源的斯利伦光学器件，以便具有紧凑且重量轻的设计，低发热功率和低功耗，并且确保高可靠性。 在所述光学装置中，成像透镜由一对布置成保留在其间的空气空间的透镜组构成，刀刃由布置在所述透镜组之一的表面上的遮光涂层组成，而另一透镜组可沿光学位移 轴。 所述光学装置包括分光光学系统和透镜类型的显微镜的光学系统，其具有在样品位置处彼此垂直相交的光轴，或者一对分光光学系统和透射型显微镜的光学系统 具有彼此垂直相交的光轴。