Mobile display device, mobile display system and image signal reproducing method thereof
    1.
    发明申请
    Mobile display device, mobile display system and image signal reproducing method thereof 有权
    移动显示装置,移动显示系统及其图像信号再现方法

    公开(公告)号:US20050020319A1

    公开(公告)日:2005-01-27

    申请号:US10897123

    申请日:2004-07-23

    Abstract: A A mobile display device capable of communicating with a host computer depending upon whether it is coupled with a docking station. The mobile display device includes a wired module for receiving the wired input signal applied from the docking station and converting the wired input signal into a first video signal; a wireless module for converting the wired or wireless input signal applied from the host computer into a second video signal; a display panel for reproducing the first video signal and the second video signal; and a display controller for converting the first and second video signals applied to the display panel from the wired module and the wireless module depending upon whether the mobile display device is coupled with the docking station, and applying to the display panel a control signal for turning on and off images reproduced from the display panel upon the above-described conversions.

    Abstract translation: A一种移动显示设备,其能够根据是否与对接站耦合而与主机通信。 移动显示装置包括有线模块,用于接收从对接站应用的有线输入信号,并将有线输入信号转换为第一视频信号; 无线模块,用于将从主计算机应用的有线或无线输入信号转换为第二视频信号; 用于再现第一视频信号和第二视频信号的显示面板; 以及显示控制器,用于根据移动显示设备是否与对接站耦合来转换从有线模块和无线模块施加到显示面板的第一和第二视频信号,并且向显示面板施加用于转动的控制信号 在上述转换时,从显示面板重放的图像的开和关图像。

    Semiconductor memory device and burn-in test method therefor
    2.
    发明申请
    Semiconductor memory device and burn-in test method therefor 审中-公开
    半导体存储器件及其老化测试方法

    公开(公告)号:US20050276131A1

    公开(公告)日:2005-12-15

    申请号:US11020323

    申请日:2004-12-27

    CPC classification number: G11C29/12005 G11C29/36

    Abstract: A semiconductor memory device includes a switch circuit that inverts input data or output data when burn-in mode enable signals are activated or a control signal switch that inverts external control signals or internal control signals when burn-in mode enable signals are activated. A burn-in test method for the semiconductor memory device performs a pass/fail decision to determine whether the output data has passed or failed based on an inverted logical value of the input data.

    Abstract translation: 半导体存储器件包括一个开关电路,当老化模式使能信号被激活时,其反相输入数据或输出数据,或者当老化模式使能信号被激活时转换外部控制信号或内部控制信号的控制信号开关。 半导体存储器件的老化测试方法基于输入数据的反相逻辑值执行通过/失败判定以确定输出数据是否通过或失败。

    Bun-in test method semiconductor memory device
    3.
    发明申请
    Bun-in test method semiconductor memory device 审中-公开
    Bun-in测试方法半导体存储器件

    公开(公告)号:US20070127300A1

    公开(公告)日:2007-06-07

    申请号:US11647398

    申请日:2006-12-29

    CPC classification number: G11C29/12005 G11C29/36

    Abstract: A semiconductor memory device includes a switch circuit that inverts input data or output data when burn-in mode enable signals are activated or a control signal switch that inverts external control signals or internal control signals when burn-in mode enable signals are activated. A burn-in test method for the semiconductor memory device performs a pass/fail decision to determine whether the output data has passed or failed based on an inverted logical value of the input data.

    Abstract translation: 半导体存储器件包括一个开关电路,当老化模式使能信号被激活时,其反相输入数据或输出数据,或者当老化模式使能信号被激活时转换外部控制信号或内部控制信号的控制信号开关。 半导体存储器件的老化测试方法基于输入数据的反相逻辑值执行通过/失败判定以确定输出数据是否通过或失败。

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