Deterministic reset mechanism for asynchronous gearbox FIFOs for predictable latency

    公开(公告)号:US12248761B2

    公开(公告)日:2025-03-11

    申请号:US18129762

    申请日:2023-03-31

    Applicant: XILINX, INC.

    Abstract: Embodiments herein describe a solution for deterministic de-assertion of write and read resets of an asynchronous gearbox FIFO having unequal write and read data bit widths. Proposed approaches look for a stable region between read and write clock phases by sweeping one of the clock phases until the leading edges (phases) of both clocks are aligned then releasing the write and read resets deterministically based upon a change in cyclic behavior of detected logic levels of a reset beacon waveform.

    Circuits for and methods of transmitting data in an integrated circuit

    公开(公告)号:US10038450B1

    公开(公告)日:2018-07-31

    申请号:US14965752

    申请日:2015-12-10

    Applicant: Xilinx, Inc.

    Inventor: Warren E. Cory

    CPC classification number: H03L7/00 G06F5/06 H03K5/135 H03M9/00

    Abstract: A circuit for transmitting data in an integrated circuit device is described. The circuit comprises a first data width conversion circuit configured to receive a first portion of transmit data to be transmitted in parallel; a first parallel-in, serial-out circuit configured to receive an output of the first data width conversion circuit; a first reset timer configured to provide a first reset signal to enable resetting the first data width conversion circuit; a second data width conversion circuit configured to receive a second portion of the transmit data; a second parallel-in, serial-out circuit configured to receive an output of the second data width conversion circuit; and a second reset timer configured to provide a second reset signal to enable resetting the second data width conversion circuit.

    Circuit for and method of measuring latency in an integrated circuit

    公开(公告)号:US10033523B1

    公开(公告)日:2018-07-24

    申请号:US15676667

    申请日:2017-08-14

    Applicant: Xilinx, Inc.

    Abstract: A circuit for measuring latency in an integrated circuit device is described. The circuit comprises a transmitter circuit having signal generator configured to generate a test signal having a marker for determining a latency in a path associated with the integrated circuit device; and a latency calculation circuit coupled to the signal generator and having a latency adjustment circuit and a unit interval (UI) adjustment circuit; wherein the latency calculation circuit generates a latency value (LATENCY) based upon a latency count from the latency adjustment circuit and a UI adjustment from the UI adjustment circuit.

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