公开(公告)号：US07567348B2

公开(公告)日：2009-07-28

申请号：US11230316

申请日：2005-09-19

Applicant: Uwe Sperling ,  Konrad Lex

Inventor： Uwe Sperling ,  Konrad Lex

IPC: G01N21/55

CPC classification number: G01N21/57

Abstract: A method and a device for a spatially resolved examination and evaluation of the properties of surfaces, in particular such properties of surfaces which affect the optical impression which the surface makes. A defined radiation is directed at a first predetermined solid angle to an examined surface. Furthermore, at least a portion of the radiation affected by the examined surface in particular by diffusion and reflection, is detected at a second predefined solid angle. At least one measured variable is spatially resolved captured which characterizes at least one predetermined property of the radiation affected by the examined surface. At least over a portion of the spatially resolved measured values at least one statistical parameter for characterizing the surface is determined.

Abstract translation: 用于空间分辨检查和评估表面性质的方法和装置，特别是影响表面所产生的光学印象的表面的这种特性。 被限定的辐射被引导到被检查表面的第一预定立体角。 此外，特别是通过扩散和反射影响被检查表面的辐射的至少一部分以第二预定义立体角检测。 捕获的至少一个测量变量被空间分辨，其表征受检查表面影响的辐射的至少一个预定特性。 至少在空间分辨测量值的一部分上，确定用于表征表面的至少一个统计参数。

公开(公告)号：US20060119854A1

公开(公告)日：2006-06-08

申请号：US11230316

申请日：2005-09-19

Applicant: Uwe Sperling ,  Konrad Lex

Inventor： Uwe Sperling ,  Konrad Lex

IPC: G01N21/47

CPC classification number: G01N21/57

Abstract: A method and a device for a spatially resolved examination and evaluation of the properties of surfaces, in particular such properties of surfaces which affect the optical impression which the surface makes. A defined radiation is directed at a first predetermined solid angle to an examined surface. Furthermore, at least a portion of the radiation affected by the examined surface in particular by diffusion and reflection, is detected at a second predefined solid angle. At least one measured variable is spatially resolved captured which characterizes at least one predetermined property of the radiation affected by the examined surface. At least over a portion of the spatially resolved measured values at least one statistical parameter for characterizing the surface is determined.

公开(公告)号：US07525648B2

公开(公告)日：2009-04-28

申请号：US11241827

申请日：2005-09-30

Applicant: Uwe Sperling ,  Konrad Lex

Inventor： Uwe Sperling ,  Konrad Lex

IPC: G01J1/44

CPC classification number: G01N21/55 ,  G01N21/8806

Abstract: A device for examining the optical properties of surfaces includes a first radiation source which emits radiation to an examination surface, at least one first detector device, for detecting the radiation reflected off the surface and emitting at least one signal that is characteristic of at least one parameter of the detected radiation, wherein the detector device includes a plurality of image capturing components arranged in a specified detection area and wherein a control is provided for compensating signal changes caused by a shift of the location where the reflected radiation is incident on the detection area.

Abstract translation: 用于检查表面的光学性质的装置包括向检查表面发射辐射的第一辐射源，至少一个第一检测器装置，用于检测从表面反射的辐射，并发射至少一个特征为至少一个的信号 参数，其中所述检测器装置包括布置在指定检测区域中的多个图像捕获部件，并且其中提供控制以补偿由所述反射辐射入射到所述检测区域上的位置的偏移引起的信号变化 。

公开(公告)号：US20060187453A1

公开(公告)日：2006-08-24

申请号：US11241827

申请日：2005-09-30

Applicant: Uwe Sperling ,  Konrad Lex

Inventor： Uwe Sperling ,  Konrad Lex

IPC: G01B11/00

CPC classification number: G01N21/55 ,  G01N21/8806

Abstract: A device for examining the optical properties of surfaces includes a first radiation source which emits radiation to an examination surface, at least one first detector device, for detecting the radiation reflected off the surface and emitting at least one signal that is characteristic of at least one parameter of the detected radiation, wherein the detector device includes a plurality of image capturing components arranged in a specified detection area and wherein a control is provided for compensating signal changes caused by a shift of the location where the reflected radiation is incident on the detection area.

公开(公告)号：US08260004B2

公开(公告)日：2012-09-04

申请号：US12053518

申请日：2008-03-21

Applicant: Konrad Lex

Inventor： Konrad Lex

IPC: G06K9/00 ,  G01N21/00

CPC classification number: G01N21/4738 ,  G01J3/462 ,  G01J2003/466 ,  G01N21/57 ,  G01N21/8806

Abstract: The present disclosure relates to a method for the quantitative determination of surface properties, wherein a spatially resolved image of a surface to be analysed, which contains a large number of measured values, is recorded. In a first method step, the measured values are analysed in order to determine those surface areas which have a specific physical property. A result value of this physical property is then determined, wherein this result value is characteristic of the values of the physical property of all those surface areas of the image determined by analyzing the image. According to the disclosure, the result value is displayed against the size of the determined surface areas.

Abstract translation: 本公开涉及一种用于定量测定表面性质的方法，其中记录了包含大量测量值的待分析表面的空间分辨图像。 在第一种方法步骤中，分析测量值以确定具有特定物理性质的那些表面积。 然后确定该物理性质的结果值，其中该结果值是通过分析图像确定的图像的所有这些表面积的物理性质的值的特征。 根据本公开，结果值相对于确定的表面积的大小显示。

公开(公告)号：US07973932B2

公开(公告)日：2011-07-05

申请号：US12400610

申请日：2009-03-09

Applicant: Konrad Lex

Inventor： Konrad Lex

IPC: G01J3/46 ,  G01N21/55 ,  G01N21/88 ,  G01B11/24

CPC classification number: G01N21/57 ,  G01N2021/4711 ,  G01N2021/4735

Abstract: The invention relates to an apparatus for determining optical surface properties of workpieces, comprising a housing, in the interior of which there is provided a carrier on which the workpiece be arranged, and comprising a radiation device which directs radiation onto the workpiece in a predefined emission direction (E). According to the invention, the housing has in at least one wall an observation opening, through which a region of the workpiece illuminated by the radiation device can be observed in a predefined observation direction (B).

Abstract translation: 本发明涉及一种用于确定工件的光学表面性质的装置，包括壳体，其内部设置有载体，工件布置在该载体上，并且包括辐射装置，其以预定义的排放将辐射引导到工件上 方向（E）。 根据本发明，壳体在至少一个壁上具有观察开口，通过该观察开口可以沿预定的观察方向（B）观察由辐射装置照射的工件的区域。

公开(公告)号：US07633612B2

公开(公告)日：2009-12-15

申请号：US11774368

申请日：2007-07-06

Applicant: Peter Schwarz ,  Konrad Lex

Inventor： Peter Schwarz ,  Konrad Lex

IPC: G01N21/00 ,  G01B11/30

CPC classification number: G01N21/474

Abstract: Disclosed is an apparatus for determining surface properties, comprising at least a first radiation device which emits radiation onto a surface to be analysed, at least a first radiation detector device which receives at least part of the radiation emitted by the at least one radiation device and then scattered or reflected by the surface and outputs at least a first measurement signal which is characteristic of the reflected or scattered radiation, and at least a second radiation detector device which receives at least part of the radiation emitted by the at least one radiation device and then scattered or reflected by a surface and outputs at least a second measurement signal which is characteristic of the reflected or scattered radiation. According to the disclosure, the first radiation detector device is offset by a first predefined angle β1 with respect to the direction of the radiation reflected by the surface, and the further radiation detector device is offset by further predefined angle γ1 with respect to the direction of the radiation reflected by the surface, and the ratio between the value of the further predefined angle γ1 and the value of the first predefined angle β1 is at least 1.5:1.

Abstract translation: 公开了一种用于确定表面性质的装置，包括至少第一辐射装置，其将辐射发射到待分析的表面上，至少第一辐射检测器装置，其接收由至少一个辐射装置发射的辐射的至少一部分;以及 然后由表面散射或反射，并且输出至少一个反射或散射辐射的特征的第一测量信号，以及至少一个第二辐射检测器装置，其接收由至少一个辐射装置发射的辐射的至少一部分，以及 然后由表面散射或反射，并且输出至少是反射或散射的辐射的特征的第二测量信号。 根据本公开，第一辐射检测器装置相对于由表面反射的辐射的方向偏移第一预定角度β1，并且另外的辐射检测器装置相对于 由表面反射的辐射和另外的预定角度γ1的值与第一预定角度β1的值之间的比率至少为1.5:1。

公开(公告)号：US20050018195A1

公开(公告)日：2005-01-27

申请号：US10854926

申请日：2004-05-27

Applicant: Konrad Lex

Inventor： Konrad Lex

IPC: G01N21/84 ,  G01B11/30 ,  G01J1/00 ,  G01N21/47 ,  G01N21/55

CPC classification number: G01B11/303 ,  G01J1/00 ,  G01N21/474

Abstract: A method for determining the properties of surfaces wherein a first process step specified radiation emits from at least one radiation source to a measuring surface, in further process steps the radiation reflected and/or scattered off the measuring surface is detected by a plurality of image-capturing components, and a signal is generated which specifies at least one parameter of the radiation detected by the image-capturing components. In further process steps the first signals are grouped based on predetermined criteria to form group signals, and at least one group-specific evaluation figure is computed, and a dependent statistical parameter correlating with at least one measuring surface remission characteristic. Finally at least one statistical parameter is read out in dependence on the predetermined criterion for grouping said first signals. The properties of the surface are specified by a relation between at least two statistical parameters.

Abstract translation: 一种用于确定表面性质的方法，其中特定辐射的第一工艺步骤从至少一个辐射源发射到测量表面，在进一步的处理步骤中，由测量表面反射和/或散射的辐射被多个图像 - 捕获组件，并且生成指定由图像捕获组件检测到的辐射的至少一个参数的信号。 在进一步的处理步骤中，基于预定标准对第一信号进行分组以形成组信号，并且计算至少一个组专用评估图，以及与至少一个测量表面缓解特性相关的依赖统计参数。 最后，根据用于对所述第一信号进行分组的预定标准，读出至少一个统计参数。 表面的属性由至少两个统计参数之间的关系指定。

公开(公告)号：US5815279A

公开(公告)日：1998-09-29

申请号：US679551

申请日：1996-07-12

Applicant: Konrad Lex

Inventor： Konrad Lex

IPC: G01J3/46 ,  G01N21/27 ,  G01N21/47

CPC classification number: G01N21/474

Abstract: In a method and a device for optically characterizing a goniochromatic surface, for example a metallic painting surface, only a fixed measuring angle setting is used according to the invention.

Abstract translation: 在用于光学表征诸如金属喷漆表面的色度表面的方法和装置中，根据本发明仅使用固定的测量角度设置。

公开(公告)号：US08928886B2

公开(公告)日：2015-01-06

申请号：US12575350

申请日：2009-10-07

Applicant: Konrad Lex

Inventor： Konrad Lex

IPC: G01N21/55 ,  G01B11/30 ,  G01N21/57

CPC classification number: G01N21/55 ,  G01N21/57

Abstract: An apparatus for determining optical properties of materials including a first measuring device having a first radiation device which directs radiation onto the material under a first specified angle of radiation and a first radiation detection device which is located under a first angle of reception with respect to the material, and a second measuring device which includes a second radiation device which directs radiation onto the material under a second specified angle of radiation and a second radiation detection device which is located at a second angle of reception with respect to the material and allows a locally resolved evaluation of the radiation incident thereon and emits at least one second characteristic signal which is characteristic of the radiation incident on the second radiation detection device.

Abstract translation: 一种用于确定材料的光学性质的装置，包括具有第一辐射装置的第一测量装置，所述第一辐射装置在第一指定的辐射角度下将辐射引导到材料上;以及第一辐射检测装置，其位于相对于 材料和第二测量装置，其包括在第二特定辐射角度下将辐射引导到材料上的第二辐射装置和相对于材料位于第二接收角度的第二辐射检测装置，并允许局部 对入射到其上的辐射进行分辨的评估，并且发射入射在第二辐射检测装置上的辐射的特征的至少一个第二特征信号。