OVERLAY MARK AND MEASUREMENT METHOD THEREOF
    2.
    发明申请
    OVERLAY MARK AND MEASUREMENT METHOD THEREOF 有权
    覆盖标记及其测量方法

    公开(公告)号:US20140132283A1

    公开(公告)日:2014-05-15

    申请号:US13674704

    申请日:2012-11-12

    Abstract: An overlay mark including at least one first overlay mark and at least one second overlay mark is provided. The first overlay mark includes a plurality of first bars and a plurality of first spaces arranged alternately, and the first spaces are not constant. The second overlay mark includes a plurality of second bars and a plurality of second spaces arranged alternately, and the second spaces are constant. Besides, the second overlay mark partially overlaps with the first overlay mark.

    Abstract translation: 提供了包括至少一个第一重叠标记和至少一个第二重叠标记的重叠标记。 第一覆盖标记包括多个第一条和交替布置的多个第一空间,并且第一空间不是恒定的。 第二覆盖标记包括多个第二条和交替排列的多个第二空间,第二空间是恒定的。 此外,第二覆盖标记部分地与第一覆盖标记重叠。

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