Luminance compensation method of light-emitting device

    公开(公告)号:US10796628B2

    公开(公告)日:2020-10-06

    申请号:US16172463

    申请日:2018-10-26

    Inventor: Hsien-Te Chen

    Abstract: A luminance compensation method of a light-emitting device is disclosed. The light-emitting device has a plurality of light-emitting elements. The luminance compensation method includes following steps of: obtaining a position of at least one of the light-emitting elements in a brightness anomalous status; and changing a brightness of at least one of the light-emitting elements disposed adjacent to the light-emitting element in the brightness anomalous status for compensating a brightness of the light-emitting elements in the brightness anomalous status.

    Method of using optoelectronic semiconductor stamp to manufacture optoelectronic semiconductor device

    公开(公告)号:US11538785B2

    公开(公告)日:2022-12-27

    申请号:US17131092

    申请日:2020-12-22

    Inventor: Hsien-Te Chen

    Abstract: A method of using an optoelectronic semiconductor stamp to manufacture an optoelectronic semiconductor device comprises the following steps: a preparation step: preparing at least one optoelectronic semiconductor stamp group and a target substrate, wherein each optoelectronic semiconductor stamp group comprises at least one optoelectronic semiconductor stamp, each optoelectronic semiconductor stamp comprises a plurality of optoelectronic semiconductor components disposed on a heat conductive substrate, each optoelectronic semiconductor component has at least one electrode, and the target substrate has a plurality of conductive portions; an align-press step: aligning and attaching at least one optoelectronic semiconductor stamp to the target substrate, so that the electrodes are pressed on the corresponding conductive portions; and a bonding step: electrically connecting the electrodes to the corresponding conductive portions.

    Display device
    5.
    发明授权
    Display device 审中-公开

    公开(公告)号:US10672347B2

    公开(公告)日:2020-06-02

    申请号:US16162752

    申请日:2018-10-17

    Inventor: Hsien-Te Chen

    Abstract: A display device has a plurality of sub-pixels, and includes a circuit substrate, a plurality of micro light-emitting semiconductor elements, a light conversion layer and an opposite substrate. The micro light-emitting semiconductor elements are disposed separately on the circuit substrate and configured corresponding to the sub-pixels. The light conversion layer has a plurality of light conversion portions disposed respectively corresponding to at least partial of the micro light-emitting semiconductor elements. The light emitted from the micro light-emitting semiconductor element corresponding to the sub-pixel passes through the light conversion portion to generate white light. The opposite substrate is disposed at one side of the light conversion layer away from the circuit substrate. In another display device, the light emitted from the micro light-emitting semiconductor element passes through the light conversion layer to generate white light.

    Electronic detection interface and electronic detection module using the same

    公开(公告)号:US12148786B2

    公开(公告)日:2024-11-19

    申请号:US18505463

    申请日:2023-11-09

    Inventor: Hsien-Te Chen

    Abstract: An electronic detection interface for testing micro photoelectric chips or micro semiconductor chips comprises a substrate structure and a plurality of detection units in array, responsive to the micro photoelectric chips or the micro semiconductor chips. The substrate structure includes a circuit layer, which comprises a plurality of circuit units in array. The detection units are disposed on a surface of the substrate structure, and are corresponded to the circuit units in a respect manner. Each of the detection units includes at least one resilient conductive pillar, which is electrically connected to each of the circuit units. Each of the resilient conductive pillars comprises a non-conductive photoresist and a conductive layer entirely covering the non-conductive photoresist.

    Micro image detector
    7.
    发明授权

    公开(公告)号:US11940575B2

    公开(公告)日:2024-03-26

    申请号:US17872661

    申请日:2022-07-25

    Inventor: Hsien-Te Chen

    CPC classification number: G01T1/2018 G01T1/202

    Abstract: An image detector includes a substrate, a circuit layer, a plurality of light detecting elements, a plurality of driving elements and a crystal scintillation layer. The substrate has a surface. The circuit layer is arranged on the surface of the substrate, and defines a plurality of detecting areas arranged in an array. The light detecting elements and the driving elements are disposed at the detecting areas and electrically connected with the circuit layer. Each driving element drives one or more of the light detecting elements. The crystal scintillation layer is arranged opposite to the substrate and covers the detecting areas. The light detecting elements and the driving elements connect with the surface of the substrate. At least one of the light detecting elements and the driving elements is formed by a process different from the process of forming the circuit layer on the substrate.

    Electronic detection interface and electronic detection module using the same

    公开(公告)号:US12154932B2

    公开(公告)日:2024-11-26

    申请号:US18300133

    申请日:2023-04-13

    Inventor: Hsien-Te Chen

    Abstract: An electronic detection interface for testing micro photoelectric chips or micro semiconductor chips comprises a substrate structure and a plurality of detection units in array, responsive to the micro photoelectric chips or the micro semiconductor chips. The substrate structure includes a circuit film, which comprises a plurality of circuit units in array. The detection units are disposed on a surface of the substrate structure, and are corresponded to the circuit units in a respect manner. Each of the detection units includes at least one resilient conductive pillar, which is electrically connected to each of the circuit units through a conductive pad. Each of the resilient conductive pillars is a conductive photoresist.

    Electronic detection module for testing micro chips

    公开(公告)号:US11888011B2

    公开(公告)日:2024-01-30

    申请号:US16992838

    申请日:2020-08-13

    Inventor: Hsien-Te Chen

    CPC classification number: H01L27/14636 H01L27/14603

    Abstract: An electronic detection interface comprises a substrate structure and a plurality of detection units in array. The substrate structure includes a circuit film, which comprises a plurality of circuit units in array. The detection units are disposed on a surface of the substrate structure, and are corresponded to the circuit units in a respect manner. Each of the detection units includes at least one resilient conductive pillar, which is electrically connected to each of the circuit units.

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