摘要:
According to the present invention, an electromagnetic wave measurement device includes an electromagnetic wave output device, an electromagnetic wave detector, a relative position changing unit, a delay period recording unit, a phase deriving unit, a delay-corrected phase deriving unit, a sinogram deriving unit, and an image deriving unit. The electromagnetic wave output device outputs an electromagnetic wave having a frequency equal to or more than 0.01 THz and equal to or less than 100 THz toward a device under test and a container storing at least a part of the device under test.
摘要:
According to the present invention, the CT is carried out based on parameters other than the absorption rate. An electromagnetic wave measurement device includes an electromagnetic wave output device 2 which outputs an electromagnetic wave at a frequency equal to or more than 0.01 [THz] and equal to or less than 100 [THz] toward a device under test 1, an electromagnetic wave detector 4 which detects the electromagnetic wave which has transmitted through the device under test 1, a relative position changing unit 6 which changes a relative position of an intersection 100 at which an optical path of the electromagnetic wave transmitting through the device under test 1 and the device under test 1 intersect with respect to the device under test 1, a phase deriving unit 12 which derives, based on a detected result by the electromagnetic wave detector 4, a phase in the frequency domain of the electromagnetic wave which has transmitted through the device under test 1, a sinogram deriving unit 16 which derives a sinogram based on a derived result by the phase deriving unit 12, and a cross sectional image deriving unit 18 that derives, based on the sinogram, an image of a cross section of the device under test 1 including a trajectory of the intersection 100.
摘要:
A detector detects an electromagnetic wave having a frequency of 0.01 THz≦f≦100 THz and transmitted through a device under test (DUT). A changer changes a relative position of an intersection of an optical path of the electromagnetic wave and the DUT, with respect to the DUT. A deriver derives a characteristic value of the electromagnetic wave based on a detection result of the detector, while the characteristic value is associated with an assumed relative position, which is the relative position if the electromagnetic wave is not refracted by the DUT. A corrector changes the assumed relative position to an actual relative position, which is the relative position if the refraction of the electromagnetic wave by the DUT is considered. A corrected deriver derives the characteristic value associated with a predetermined relative position based on an output from the corrector.
摘要翻译:检测器检测频率为0.01THz @ f @ 100THz的电磁波,并通过被测器件(DUT)传输。 变换器相对于DUT来改变电磁波和DUT的光路的交点的相对位置。 导出器基于检测器的检测结果导出电磁波的特征值,而特征值与假设的相对位置相关联,假设的相对位置是电磁波未被DUT折射的相对位置。 校正器将假设的相对位置改变为实际的相对位置,如果考虑到DUT的电磁波的折射,则相对位置是相对位置。 校正后的发生器基于校正器的输出导出与预定相对位置相关联的特征值。
摘要:
A polarization mode dispersion measuring device reduced in time required to measure polarization mode dispersion τPMD. A polarization controller (12) allows a first (second) incident light to apply a synthetic incident light to an object to be measured (30) in line with a p-polarization axis (s-polarization axis) in a polarization separator (16). Accordingly, the phase shift equivalent value (optical angle frequency differentiation) and amplitude equivalent value (square value) of a first incident light component (second incident light component) in an output from the polarization separator (16) measured by a first measuring unit (20a) (second measuring unit (20b)) are respectively the phase shift equivalent value and amplitude equivalent value of a first column T11, T21 (second column T12, T22) when the transfer function matrix of the object to be measured (30) is a 2×2 matrix to thereby allow a control unit (2) to determine the polarization mode dispersion r PMD of the object to be measured (30). Since there is no need of switching the orientation setting of light output from the polarization controller (12) with the setting left fixed, time required to measure polarization mode dispersion τPMD can be shortened.
摘要:
An object is to enable a change in a frequency for which an electric signal based on an optical signal is measured by a spectrum analyzer. An optical measurement device includes a first photoconductive switch that receives predetermined pulse light from a first laser light source, and outputs terahertz light having the same repetition frequency as the repetition frequency of the predetermined pulse light. The optical measurement device also includes a second photoconductive switch that receives the terahertz light and a sampling light pulse, and outputs a signal corresponding to a power of the terahertz light at a time point when the sampling light pulse is received. The optical measurement device further includes an RF spectrum analyzer that measures a magnitude of the signal corresponding to a measured frequency that changes over time, an optical coupler that outputs a simultaneous light pulse when the predetermined pulse light and the sampling light pulse are simultaneously input, a photo detector that converts the simultaneous light pulse into an electric signal as a trigger signal, and an optical delay circuit that delays the trigger signal.
摘要:
A device for measuring τPMD includes a polarization controller (12) that allows first (second) incident light, in a synthetic incident light to an object to be measured (30), to be in line with a p-polarization (s-polarization) axis in a polarization separator (16). The phase shift equivalent value (optical angle frequency differentiation) and amplitude equivalent value (square value) of a first (second) incident light component in an output from the polarization separator (16) measured by a first (second) measuring unit (20a, 20b) are respectively the phase shift equivalent value and amplitude equivalent value of a first column T11, T21 (second column T12, T22) when the transfer function matrix of the object (30) is a 2×2 matrix to thereby allow a control unit (2) to determine the polarization mode dispersion τPMD of the object (30).
摘要:
A frequency resolution for measuring transmission characteristics of a device under test is increased. With a measuring device including a first terahertz light generator that generates incident light, a second terahertz light generator that generates reference light having an optical frequency f1−f2−fIF different from an optical frequency f1−f2 of the incident light by a constant difference frequency fIF, a terahertz light detector which outputs an light detection signal having the difference frequency fIF based on response light obtained by making the incident light incident to an optical fiber and the reference light, and a network analyzer that receives the light detection signal, thereby measuring characteristics of the optical fiber, a spectrum of the incident light (terahertz light) incident to the optical fiber includes the carrier frequency (f1−f2), but does not include sideband frequencies (f1−f2±fIF). It is thus possible to reduce the effective spectrum width of the incident light. As a result, the frequency resolution increases in the measurement of the transmission characteristics of the optical fiber.
摘要:
According to the repetition frequency control device, a master laser outputs a master laser light pulse the repetition frequency of which is controlled to a predetermined value. A slave laser outputs a slave laser light pulse. A reference comparator compares a voltage of a reference electric signal the repetition frequency of which is the predetermined value and a predetermined voltage with each other, thereby outputting a result thereof. A measurement comparator compares a voltage based on a light intensity of the slave laser light pulse and the predetermined voltage with each other, thereby outputting a result thereof. A phase difference detector detects a phase difference between the output from the reference comparator and the output from the measurement comparator. A loop filter removes a high-frequency component of an output from the phase difference detector.
摘要:
The object of the present invention is to provide an apparatus that can perform measurement of chromatic dispersion, even if the wavelength of variable-wavelength light source and that of fixed-wavelength light source for reference are identical with each other. The variable-wavelength light generated by a variable-wavelength light source 12 is subjected to intensity modulation to a frequency f by a first optical modulator 15a and transmitted from one end 30a to the other end 30b of an optical fiber 30. The fixed-wavelength light generated by a fixed-wavelength light source 14 is subjected to intensity modulation to a frequency f by a second optical modulator 15b and transmitted from the other end 30b to the one end 30a of optical fiber 30. Therefore, it is possible to separately obtain the variable-wavelength light and fixed-wavelength light transmitted through the optical fiber 30 using a second directional coupler 28 and a first directional coupler 26, respectively, regardless of wavelengths thereof. Accordingly, it is also possible to perform the comparison of phase and measurement of chromatic dispersion, even if the wavelengths of variable-wavelength light source and fixed-wavelength light source for reference are identical with each other.
摘要:
A frequency converter includes a first direct digital synthesizer that receives a signal having a predetermined frequency f_master as a clock signal and further an internal frequency setting signal, and outputs an internal signal having a frequency based on the internal frequency setting signal, and a second direct digital synthesizer that receives the internal signal as a clock signal, and further an output frequency setting signal, and outputs an output signal having a frequency f_slave (=f_master−Δ) based on the output frequency setting signal. A difference between the predetermined frequency f_master and the frequency of the internal signal is larger than a difference between the predetermined frequency f_master and the frequency f_slave of the output signal.