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公开(公告)号：US20220254429A1
公开(公告)日：2022-08-11
申请号：US17470835
申请日：2021-09-09
发明人： Ted Wong , Saman Adham , Marat Gershoig
摘要： Performing a built-in self-test (BIST) on a memory macro includes generating a plurality of input vectors. One input vector is transmitted to the memory macro in each of a plurality of cycles. Each of the plurality of input vectors is associated with a bit width. Generating the input vector includes generating a partial input vector of half the bit width and transmitting the partial input vector to each of a first half of the memory macro and a second half of the memory macro. The method also includes receiving, in each of the plurality of cycles, an output data from the memory macro, such that the output data is generated by the memory macro in response to processing the partial input vector, comparing the output data with a signature value, and determining whether the memory macro is normal or faulty based upon the comparison.
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公开(公告)号：US20240055066A1
公开(公告)日：2024-02-15
申请号：US18486789
申请日：2023-10-13
发明人： Ted Wong , Saman Adham , Marat Gershoig , Vineet Joshi
CPC分类号： G11C29/36 , G11C29/12015 , G11C29/4401 , G11C2029/3602
摘要： Performing a built-in self-test (BIST) on a memory macro includes generating a plurality of input vectors such that at least one input vector of the plurality of input vectors is transmitted to the memory macro in each of a plurality of cycles, receiving in each of the plurality of cycles, an output data from the memory macro. The output data is generated by the memory macro in response to processing the at least one input vector. The BIST also includes comparing the output data in each of the plurality of cycles with a signature value and determining whether the memory macro is normal or faulty based upon the comparison.
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公开(公告)号：US20220254428A1
公开(公告)日：2022-08-11
申请号：US17470838
申请日：2021-09-09
发明人： Saman Adham , Ted Wong , Marat Gershoig , Vineet Joshi
摘要： Performing a built-in self-test (BIST) on a memory macro includes generating a plurality of input vectors such that at least one input vector of the plurality of input vectors is transmitted to the memory macro in each of a plurality of cycles, receiving in each of the plurality of cycles, an output data from the memory macro. The output data is generated by the memory macro in response to processing the at least one input vector. The BIST also includes comparing the output data in each of the plurality of cycles with a signature value and determining whether the memory macro is normal or faulty based upon the comparison.
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公开(公告)号：US12033710B2
公开(公告)日：2024-07-09
申请号：US17470835
申请日：2021-09-09
发明人： Ted Wong , Saman Adham , Marat Gershoig
摘要： Performing a built-in self-test (BIST) on a memory macro includes generating a plurality of input vectors. One input vector is transmitted to the memory macro in each of a plurality of cycles. Each of the plurality of input vectors is associated with a bit width. Generating the input vector includes generating a partial input vector of half the bit width and transmitting the partial input vector to each of a first half of the memory macro and a second half of the memory macro. The method also includes receiving, in each of the plurality of cycles, an output data from the memory macro, such that the output data is generated by the memory macro in response to processing the partial input vector, comparing the output data with a signature value, and determining whether the memory macro is normal or faulty based upon the comparison.
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公开(公告)号：US20240321377A1
公开(公告)日：2024-09-26
申请号：US18737631
申请日：2024-06-07
发明人： Ted Wong , Saman Adham , Marat Gershoig
摘要： Performing a built-in self-test (BIST) on a memory macro includes generating a plurality of input vectors. One input vector is transmitted to the memory macro in each of a plurality of cycles. Each of the plurality of input vectors is associated with a bit width. Generating the input vector includes generating a partial input vector of half the bit width and transmitting the partial input vector to each of a first half of the memory macro and a second half of the memory macro. The method also includes receiving, in each of the plurality of cycles, an output data from the memory macro, such that the output data is generated by the memory macro in response to processing the partial input vector, comparing the output data with a signature value, and determining whether the memory macro is normal or faulty based upon the comparison.
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公开(公告)号：US11823758B2
公开(公告)日：2023-11-21
申请号：US17470838
申请日：2021-09-09
发明人： Saman Adham , Ted Wong , Marat Gershoig , Vineet Joshi
CPC分类号： G11C29/36 , G11C29/12015 , G11C29/4401 , G11C2029/3602
摘要： Performing a built-in self-test (BIST) on a memory macro includes generating a plurality of input vectors such that at least one input vector of the plurality of input vectors is transmitted to the memory macro in each of a plurality of cycles, receiving in each of the plurality of cycles, an output data from the memory macro. The output data is generated by the memory macro in response to processing the at least one input vector. The BIST also includes comparing the output data in each of the plurality of cycles with a signature value and determining whether the memory macro is normal or faulty based upon the comparison.
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