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公开(公告)号:US20190321806A1
公开(公告)日:2019-10-24
申请号:US16392800
申请日:2019-04-24
Applicant: TOYOTA JIDOSHA KABUSHIKI KAISHA
Inventor: Yoshihiro GOTO , Akira MORIKAWA , Masahide MIURA , Nobuyuki TAKAGI
Abstract: An oxygen storage material comprises a Ce—Zr-Ln-Ti-based composite oxide containing cerium (Ce), zirconium (Zr), a rear-earth element (Ln: excluding cerium), and titanium (Ti), wherein at least part of the rear-earth element and at least part of the titanium are solid-dissolved in a composite oxide of the cerium and the zirconium, and the Ce—Zr-Ln-Ti-based composite oxide has a composition expressed by the following chemical formula (1): Cea-xLnxZrb-yTiyOδ (1), where a, b, x, and y are numbers satisfying conditions of a=0.4 to 0.6, b=0.4 to 0.6, x=0 to a (exclusive of x=0 and x=a), y=0 to 0.3 (exclusive of y=0), and a+b=1, and δ is a number of 1.7 to 2.2.
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公开(公告)号:US20220134313A1
公开(公告)日:2022-05-05
申请号:US17435007
申请日:2020-02-12
Applicant: CATALER CORPORATION , TOYOTA JIDOSHA KABUSHIKI KAISHA
Inventor: Hiroki NIHASHI , Shogo KAWAMURA , Tomomasa AIKAWA , Isao NAITO , Shogo SHIRAKAWA , Masahide MIURA , Nobuyuki TAKAGI , Norimichi SHIMANO
Abstract: A supported catalyst particles include oxide carrier particles and noble metal particles supported on the oxide carrier particles, wherein the mass of the noble metal particles is less than or equal to 5 mass % based on the mass of the oxide carrier particles, and the average particle size of the noble metal particles measured by transmission electron microscopy is 1.0-2.0 nm, with the standard deviation σ less than or equal to 0.8 nm.
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公开(公告)号:US20220307404A1
公开(公告)日:2022-09-29
申请号:US17656266
申请日:2022-03-24
Applicant: TOYOTA JIDOSHA KABUSHIKI KAISHA
Inventor: Norimichi SHIMANO , Taizo YOSHINAGA , Shogo SHIRAKAWA , Nobuyuki TAKAGI , Masahide MIURA
Abstract: The present disclosure provides an exhaust gas purification material and an exhaust gas purification device that can efficiently remove harmful components even after being exposed to high temperature. Such exhaust gas purification material comprises metal oxide particles and noble metal particles supported on the metal oxide particles. The noble metal particles have a particle size distribution with a mean of 1.5 nm and 18 nm and a standard deviation of less than 1.6 nm.
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公开(公告)号:US20210277814A1
公开(公告)日:2021-09-09
申请号:US17276505
申请日:2019-09-09
Applicant: CATALER CORPORATION , TOYOTA JIDOSHA KABUSHIKI KAISHA
Inventor: Shogo KAWAMURA , Tomomasa AIKAWA , Isao NAITO , Hiroki NIHASHI , Nobuyuki TAKAGI , Takeshi NOBUKAWA
IPC: F01N3/20 , B01J23/46 , B01J27/053 , B01J37/02 , B01J37/08
Abstract: An exhaust gas purification catalyst including an alkaline-earth metal carried on a porous carrier in a highly dispersed state. The catalyst layer of the exhaust gas purification catalyst has an alkaline-earth metal carrying region including a porous carrier, Pt, and a sulfuric acid salt of at least one alkaline-earth metal carried on the porous carrier, wherein a value of RAe/Pt is 0.5 or more, where RAe/Pt represents the Pearson's correlation coefficient calculated using α and β in each pixel obtained by, for a cross section of the region, performing the area analysis by FE-EPMA under the conditions of: pixel size 0.34 μm×0.34 μm; and number of measured pixels 256×256; and measuring an intensity (α: cps) of a characteristic X ray of an element (Ae) of the alkaline-earth metal and an intensity (β: cps) of a characteristic X ray of Pt for each pixel.
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公开(公告)号:US20250058302A1
公开(公告)日:2025-02-20
申请号:US18913117
申请日:2024-10-11
Applicant: CATALER CORPORATION , TOYOTA JIDOSHA KABUSHIKI KAISHA
Inventor: Hiroki NIHASHI , Shogo KAWAMURA , Tomomasa AIKAWA , Isao NAITO , Shogo SHIRAKAWA , Masahide MIURA , Nobuyuki TAKAGI , Norimichi SHIMANO
Abstract: A supported catalyst particles include oxide carrier particles and noble metal particles supported on the oxide carrier particles, wherein the mass of the noble metal particles is less than or equal to 5 mass % based on the mass of the oxide carrier particles, and the average particle size of the noble metal particles measured by transmission electron microscopy is 1.0-2.0 nm, with the standard deviation σ less than or equal to 0.8 nm.
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