Dynamic biasing circuit
    1.
    发明授权

    公开(公告)号:US10819294B1

    公开(公告)日:2020-10-27

    申请号:US16574231

    申请日:2019-09-18

    Abstract: A circuit includes first and second gain stages and an output transistor. The second gain stage includes a transconductance amplifier and a variable impedance circuit coupled to an output of the transconductance amplifier. The variable impedance circuit is configured to implement a first impedance level at frequencies below a first frequency threshold and to implement a second impedance level at frequencies above a second frequency level. The first impedance level is larger than the second impedance level. The output transistor has a control input coupled to the variable impedance circuit. At frequencies above the second frequency threshold, the second impedance level is configured to be inversely related to current through the output transistor.

    Reduced noise dynamic comparator for a successive approximation register analog-to-digital converter

    公开(公告)号:US11095300B2

    公开(公告)日:2021-08-17

    申请号:US16904604

    申请日:2020-06-18

    Abstract: A comparator circuit includes a first transistor configured to receive a first input and a second transistor configured to receive a second input. The comparator circuit further includes a third transistor coupled to a terminal of each of the first and second transistors. The third transistor is configured to be controlled by a first control signal. A gate of a fifth transistor is coupled to a terminal of a fourth transistor at a first node and a gate of the fourth transistor is coupled to a terminal of the fifth transistor at a second node. A sixth transistor is coupled between the first and fourth transistors. A seventh transistor is coupled between the second and fifth transistors. A gate of the sixth transistor and a gate of the seventh transistor are coupled together at a fixed voltage level.

    REDUCED NOISE DYNAMIC COMPARATOR FOR A SUCCESSIVE APPROXIMATION REGISTER ANALOG-TO-DIGITAL CONVERTER

    公开(公告)号:US20200321970A1

    公开(公告)日:2020-10-08

    申请号:US16904604

    申请日:2020-06-18

    Abstract: A comparator circuit includes a first transistor configured to receive a first input and a second transistor configured to receive a second input. The comparator circuit further includes a third transistor coupled to a terminal of each of the first and second transistors. The third transistor is configured to be controlled by a first control signal. A gate of a fifth transistor is coupled to a terminal of a fourth transistor at a first node and a gate of the fourth transistor is coupled to a terminal of the fifth transistor at a second node. A sixth transistor is coupled between the first and fourth transistors. A seventh transistor is coupled between the second and fifth transistors. A gate of the sixth transistor and a gate of the seventh transistor are coupled together at a fixed voltage level.

    LEVEL SHIFTER FOR HIGH VOLTAGE DRIVER

    公开(公告)号:US20250158614A1

    公开(公告)日:2025-05-15

    申请号:US18391909

    申请日:2023-12-21

    Abstract: Described embodiments include a voltage level shifter with a first driver having an input that receives a first signal, an output, a positive supply terminal coupled to a first supply terminal, and a negative supply terminal coupled to a second supply terminal. A transistor has first and second current terminals and a first control terminal. The first current terminal is coupled to the first driver output, and the first control terminal is adapted to be coupled to a low-side drive transistor control terminal. A second driver has an input coupled to the second current terminal, an output, a positive supply terminal coupled to a third supply terminal, and a negative supply terminal coupled to ground. The second driver provides a second signal at the second driver output. A voltage at the third supply terminal is less than 10% of a voltage at the first supply terminal.

    Analog-to-digital converter
    5.
    发明授权

    公开(公告)号:US11349492B2

    公开(公告)日:2022-05-31

    申请号:US17112095

    申请日:2020-12-04

    Abstract: An analog-to-digital converter (ADC) circuit includes a signal input terminal, a sample-and-hold circuit, and a successive approximation register (SAR) ADC. The sample-and-hold circuit includes an input terminal coupled to the signal input terminal. The SAR ADC includes a comparator, a first capacitive digital-to-analog converter (CDAC), and a second CDAC. The first CDAC includes a first input terminal coupled to the signal input terminal, a second input terminal coupled to an output terminal of the sample-and-hold circuit, and an output terminal coupled to a first input terminal of the comparator. The second CDAC includes a first input terminal coupled to the signal input terminal, an output terminal coupled to a second input terminal of the comparator.

    Reduced noise dynamic comparator for a successive approximation register analog-to-digital converter

    公开(公告)号:US10727852B2

    公开(公告)日:2020-07-28

    申请号:US16555265

    申请日:2019-08-29

    Abstract: A comparator circuit includes a first transistor configured to receive a first input and a second transistor configured to receive a second input. The comparator circuit further includes a third transistor coupled to a terminal of each of the first and second transistors. The third transistor is configured to be controlled by a first control signal. A gate of a fifth transistor is coupled to a terminal of a fourth transistor at a first node and a gate of the fourth transistor is coupled to a terminal of the fifth transistor at a second node. A sixth transistor is coupled between the first and fourth transistors. A seventh transistor is coupled between the second and fifth transistors. A gate of the sixth transistor and a gate of the seventh transistor are coupled together at a fixed voltage level.

    Analog-to-digital converter
    8.
    发明授权

    公开(公告)号:US10886933B1

    公开(公告)日:2021-01-05

    申请号:US16656913

    申请日:2019-10-18

    Abstract: An analog-to-digital converter (ADC) circuit includes a signal input terminal, a sample-and-hold circuit, and a successive approximation register (SAR) ADC. The sample-and-hold circuit includes an input terminal coupled to the signal input terminal. The SAR ADC includes a comparator, a first capacitive digital-to-analog converter (CDAC), and a second CDAC. The first CDAC includes a first input terminal coupled to the signal input terminal, a second input terminal coupled to an output terminal of the sample-and-hold circuit, and an output terminal coupled to a first input terminal of the comparator. The second CDAC includes a first input terminal coupled to the signal input terminal, an output terminal coupled to a second input terminal of the comparator.

    Reduced noise dynamic comparator for a successive approximation register analog-to-digital converter

    公开(公告)号:US10447290B2

    公开(公告)日:2019-10-15

    申请号:US15837040

    申请日:2017-12-11

    Abstract: A comparator circuit includes a first transistor configured to receive a first input and a second transistor configured to receive a second input. The comparator circuit further includes a third transistor coupled to a terminal of each of the first and second transistors. The third transistor is configured to be controlled by a first control signal. A gate of a fifth transistor is coupled to a terminal of a fourth transistor at a first node and a gate of the fourth transistor is coupled to a terminal of the fifth transistor at a second node. A sixth transistor is coupled between the first and fourth transistors. A seventh transistor is coupled between the second and fifth transistors. A gate of the sixth transistor and a gate of the seventh transistor are coupled together at a fixed voltage level.

    Dynamic biasing circuit
    10.
    发明授权

    公开(公告)号:US11527999B2

    公开(公告)日:2022-12-13

    申请号:US17027093

    申请日:2020-09-21

    Abstract: A circuit includes first and second gain stages and an output transistor. The second gain stage includes a transconductance amplifier and a variable impedance circuit coupled to an output of the transconductance amplifier. The variable impedance circuit is configured to implement a first impedance level at frequencies below a first frequency threshold and to implement a second impedance level at frequencies above a second frequency level. The first impedance level is larger than the second impedance level. The output transistor has a control input coupled to the variable impedance circuit. At frequencies above the second frequency threshold, the second impedance level is configured to be inversely related to current through the output transistor.

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