公开(公告)号：US09778106B2

公开(公告)日：2017-10-03

申请号：US14794316

申请日：2015-07-08

Applicant: TECAN Trading AG

Inventor： Lutz Niggl ,  Andreas Erlbacher ,  Frank Münchow

IPC: G01J3/18 ,  G01J3/06 ,  G01J3/42 ,  G01N35/02 ,  G01N21/25 ,  G01N21/31 ,  G01J3/12

CPC classification number: G01J3/18 ,  G01J3/06 ,  G01J3/42 ,  G01J2003/1204 ,  G01J2003/1213 ,  G01J2003/1217 ,  G01N21/253 ,  G01N21/31 ,  G01N35/028 ,  G01N2021/3174 ,  G01N2201/084

Abstract: A spectrometer (1) comprises a light source (2), a monochromator (3) with at least one diffraction grating (4), a monochromator housing (5), an order sorting filter (7), a microplate receptacle (12) and a controller (6). The order sorting filter (7) of the spectrometer (1) comprises a substrate (23), a first optical thin film (24) and a second optical thin film (25), wherein, in a spatially partly overlapping and interference-free manner, the first optical thin film (24) is arranged on a first surface (26) and the second optical thin film (25) is arranged on a second surface (27) of the substrate (23). A spectrometer (1) equipped with a respective order sorting filter is used in a scanning method for detecting the absorption spectrum of samples examined in wells (14) of microplates (13).